المؤلفون: Vasishta, S., Wang, X., Rodder, M., Raghunandan, K.R., Viswanathan, T.R., Dodabalapur, A.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(6):3470-3476 Jun, 2022

المؤلفون: Kittl, J. A., Obradovic, B., Reddy, D., Rakshit, T., Hatcher, R. M., Rodder, M. S.

المصدر: Appl. Phys. Lett. 113, 042904 (2018)

مصطلحات موضوعية: Condensed Matter - Mesoscale and Nanoscale Physics

URL الوصول: http://arxiv.org/abs/1805.01145

المؤلفون: Obradovic, B., Rakshit, T., Hatcher, R., Kittl, J. A., Rodder, M. S.

المصدر: 2018 IEEE Symposium on VLSI Technology VLSI Technology, 2018 IEEE Symposium on. :51-52 Jun, 2018

Relation: 2018 IEEE Symposium on VLSI Technology

المؤلفون: Ni, K., Smith, J. A., Grisafe, B., Rakshit, T., Obradovic, B., Kittl, J. A., Rodder, M., Datta, S.

المصدر: 2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :13.2.1-13.2.4 Dec, 2018

Relation: 2018 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Sun, X., D'Emic, C., Cheng, C.-W., Majumdar, A., Sun, Y., Cartier, E., Bruce, R. L., Frank, M., Miyazoe, H., Shiu, K.-T., Lee, S., Rozen, J., Patel, J., Ando, T., Song, W.-B., Lofaro, M., Krishnan, M., Obrodovic, B., Lee, K.-T., Tsai, H., Wang, W.-E., Spratt, W., Chan, K., Yau, J.-B., Hashemi, P., Khojasteh, M., Cantoro, M., Ott, J., Rakshit, T., Zhu, Y., Sadana, D., Yeh, C.-C., Narayanan, V., Mo, R. T., Heo, Y.-C., Kim, D.-W., Rodder, M. S., Leobandung, E.

المصدر: 2017 Symposium on VLSI Technology VLSI Technology, 2017 Symposium on. :T40-T41 Jun, 2017

Relation: 2017 Symposium on VLSI Technology

المؤلفون: Nicollian, P.E., Baldwin, G.C., Eason, K.N., Grider, D.T., Hattangady, S.V., Hu, J.C., Hunter, W.R., Rodder, M., Rotondaro, A.L.P.

المصدر: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :545-548 2000

Relation: International Electron Devices Meeting. Technical Digest. IEDM

المؤلفون: Obradovic, B., Bowen, R. C., Rodder, M. S.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 35(4):473-475 Apr, 2014

المؤلفون: Mehrotra, M., Hu, J.C., Jain, A., Shiau, W., Reddy, V., Aur, S., Rodder, M.

المصدر: International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :419-422 1999

Relation: International Electron Devices Meeting 1999. Technical Digest

المؤلفون: Nicollian, P.E., Rodder, M., Grider, D.T., Chen, P., Wallace, R.M., Hattangady, S.V.

المصدر: 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) Reliability physics Reliability Physics Symposium Proceedings, 1999. 37th Annual. 1999 IEEE International. :400-404 1999

Relation: 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual

المؤلفون: Gupta, I.J., Kraft, R., Krishnan, S., Gale, B., Aur, S., Rodder, M., Laaksonen, T.

المصدر: 1998 3rd International Symposium on Plasma Process-Induced Damage (Cat. No.98EX100) Plasma process-induced damage Plasma Process-Induced Damage, 1998 3rd International Symposium on. :84-87 1998

Relation: 1998 3rd International Symposium on Plasma Process-Induced Damage