المؤلفون: Arumi, D., Manich, S., Gomez-Pau, A., Rodriguez-Montanes, R., Gonzalez, M.B., Campabadal, F.

المصدر: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits IEEE J. Explor. Solid-State Comput. Devices Circuits Exploratory Solid-State Computational Devices and Circuits, IEEE Journal on. 9(2):92-98 Dec, 2023

المؤلفون: Akbari, M., Mirzakuchaki, S., Arumi, D., Manich, S., Gomez-Pau, A., Campabadal, F., Gonzalez, M.B., Rodriguez-Montanes, R.

المصدر: IEEE Access Access, IEEE. 11:66682-66693 2023

المؤلفون: Albiol, P., Manich, S., Arumi, D., Rodriguez-Montanes, R., Gomez-Pau, A.

المصدر: 2021 XXXVI Conference on Design of Circuits and Integrated Systems (DCIS) Design of Circuits and Integrated Systems (DCIS), 2021 XXXVI Conference on. :1-6 Nov, 2021

Relation: 2021 XXXVI Conference on Design of Circuits and Integrated Systems (DCIS)

المؤلفون: Rodriguez-Montanes, R., Arumi, D., Figueras, J.

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 27(11):2596-2607 Nov, 2019

المؤلفون: Arumi, D., Gomez-Pau, A., Manich, S., Rodriguez-Montanes, R., Gonzalez, M.B., Campabadal, F.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 40(2):341-344 Feb, 2019

المؤلفون: Weiner, M., Manich, S., Rodriguez-Montanes, R., Sigl, G.

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 26(2):392-403 Feb, 2018

المؤلفون: Arumi, D., Manich, S., Rodriguez-Montanes, R.

المصدر: 2016 1st IEEE International Verification and Security Workshop (IVSW) Verification and Security Workshop (IVSW), IEEE International. :1-6 Jul, 2016

Relation: 2016 1st IEEE International Verification and Security Workshop (IVSW)

المؤلفون: Vatajelu, Elena I., Rodriguez-Montanes, R., Di Carlo, S., Indaco, M., Renovell, M., Prinetto, P., Figueras, J.

المصدر: 2015 20th IEEE European Test Symposium (ETS) Test Symposium (ETS), 2015 20th IEEE European. :1-6 May, 2015

Relation: 2015 20th IEEE European Test Symposium (ETS)

المؤلفون: Di Carlo, S., Indaco, M., Prinetto, P., Vatajelu, Elena I., Rodriguez-Montanes, R., Figueras, J.

المصدر: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposium on. :75-80 Oct, 2014

Relation: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

المؤلفون: Rodriguez-Montanes, R., Arumi, D., Figueras, J.

المصدر: 2014 19th IEEE European Test Symposium (ETS) Test Symposium (ETS), 2014 19th IEEE European. :1-6 May, 2014

Relation: 2014 19th IEEE European Test Symposium (ETS)