المؤلفون: Francois Roy, Andrej Suler, Thomas Dalleau, Romain Duru, Daniel Benoit, Jihane Arnaud, Yvon Cazaux, Catherine Chaton, Laurent Montes, Panagiota Morfouli, Guo-Neng Lu

المصدر: Sensors, Vol 20, Iss 3, p 727 (2020)

مصطلحات موضوعية: cmos image sensor (cis), pixel, photo gate, transfer gate, capacitive deep trench isolation, surface passivation, dark current, Chemical technology, TP1-1185

وصف الملف: electronic resource

Relation: https://www.mdpi.com/1424-8220/20/3/727; https://doaj.org/toc/1424-8220

URL الوصول: https://doaj.org/article/cf4a542522684eb6b4e3f7960b69d811

المؤلفون: Justine Lespiaux, Fabien Deprat, Jérémy Vives, Romain Duru, Mehmet Bicer, Alexis Gauthier, Edoardo Brezza, Marc Juhel, Florence Chenevas-Paule, Alain Baron, Alexia Valery, Jean-Michel Hartmann

المصدر: ECS Transactions. 109:217-236

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::13b5d7d3691a997ffba80243d3e32054
https://doi.org/10.1149/10904.0217ecst

المؤلفون: Jérémy Vives, Stephane Verdier, Fabien Deprat, Marvin Frauenrath, Romain Duru, Marc Juhel, Gregory Berthome, Didier Chaussende

المصدر: Journal of Materials Chemistry C.

مصطلحات موضوعية: Materials Chemistry, General Chemistry

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b0f56306ccc2716b78d5d95aebb62d42
https://doi.org/10.1039/d3tc01107k

المؤلفون: Thomas Alcaire, Delphine Le Cunff, Jean-Herve Tortai, Sebastien Soulan, Virginie Brouzet, Romain Duru, Christophe Euvrard

المساهمون: STMicroelectronics [Crolles] (ST-CROLLES), Laboratoire des technologies de la microélectronique (LTM ), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)

المصدر: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), May 2022, Saratoga Springs, France. pp.1-5, ⟨10.1109/ASMC54647.2022.9792479⟩

مصطلحات موضوعية: [SPI]Engineering Sciences [physics], RCNN, Photoluminescence imaging, Scanning Acoustic Microscopy, Process control, Full wafer

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8c6ada631f56535bc50f3e5867c8bf06
https://doi.org/10.1109/asmc54647.2022.9792479

المؤلفون: Romain Duru, Isabella Mica, Jacopo Frascaroli, Pierre Bellanger

المصدر: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c81481989d949d467bd98668ee3cfc50
https://doi.org/10.1109/asmc54647.2022.9792524

المؤلفون: Justine Lespiaux, Fabien Deprat, Jérémy Vives, Romain Duru, Mehmet Bicer, Alexis Gauthier, Edoardo Brezza, Marc Juhel, Florence Chenevas-Paule, Alain Baron, Alexia Valery, Jean-Michel Hartmann

المصدر: ECS Meeting Abstracts. :1214-1214

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::566061cd16c6ff97fed89b7568dbef56
https://doi.org/10.1149/ma2022-02321214mtgabs

المؤلفون: Jérémy Vives, Fabien Deprat, Didier Dutartre, Justine Lespiaux, Romain Duru, Mehmet Bicer, Nathalie Drogue, Marc Juhel, Didier Chaussende

المصدر: ECS Meeting Abstracts. :1215-1215

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3ff9e918dfc44a6e057e0a4d27f6e750
https://doi.org/10.1149/ma2022-02321215mtgabs

المؤلفون: Georges Bremond, Delphine Le Cunff, I. Mica, Maxime Cannac, Romain Duru, José Baruchel, Thu-Nhi Tran-Thi

المصدر: IEEE Transactions on Semiconductor Manufacturing. 32:23-30

مصطلحات موضوعية: 0209 industrial biotechnology, Photoluminescence, Materials science, Silicon, business.industry, ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION, chemistry.chemical_element, 02 engineering and technology, Condensed Matter Physics, Industrial and Manufacturing Engineering, Electronic, Optical and Magnetic Materials, Characterization (materials science), 020901 industrial engineering & automation, CMOS, chemistry, Transmission electron microscopy, Etching (microfabrication), Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Wafer, Diffraction topography, Electrical and Electronic Engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::374b7f84b0b33f11e1ffe37e560b15e6
https://doi.org/10.1109/tsm.2018.2871967

المؤلفون: K. Courouble, J.-P. Carrere, Vincent Goiffon, S. Ricq, C. Doyen, Y. Sacchettini, Romain Duru, Pierre Magnan

المصدر: Web of Science

مصطلحات موضوعية: 010302 applied physics, Materials science, Pixel, Passivation, business.industry, 02 engineering and technology, Plasma, 021001 nanoscience & nanotechnology, 01 natural sciences, Stack (abstract data type), 0103 physical sciences, Degradation (geology), Optoelectronics, Image sensor, 0210 nano-technology, business, Layer (electronics), Dark current

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4dce0f32a90286a7aa94980d26817508
https://doi.org/10.1109/iedm19573.2019.8993561

المؤلفون: Georges Bremond, Thomas Nassiet, Jean-Marie Bluet, Romain Duru, Delphine Le-Cunff

المصدر: physica status solidi (a). 219:2100410

مصطلحات موضوعية: Photoluminescence, Materials science, Silicon, business.industry, chemistry.chemical_element, Surfaces and Interfaces, Contamination, Condensed Matter Physics, Copper, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry, Materials Chemistry, Optoelectronics, Electrical and Electronic Engineering, business, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::75bf756d8087bb68b8c760dbff3a1869
https://doi.org/10.1002/pssa.202100410