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1
المؤلفون: Felix Kayser, Frank Pfirsch, Franz-Josef Niedernostheide, Roman Baburske, Hans-Gunter Eckel
المصدر: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c963478b353283088c7f0207d0924f0e
https://doi.org/10.1109/ispsd49238.2022.9813676 -
2
المؤلفون: Madhu Lakshman Mysore, Roman Baburske, Hans-Joachim Schulze, Riteshkumar Bhojani, Jens Kowalsky, Josef Lutz, Franz-Josef Niedernostheide
المصدر: IET Power Electronics. 12:3893-3902
مصطلحات موضوعية: Materials science, business.industry, 020209 energy, 020208 electrical & electronic engineering, Bipolar junction transistor, chemistry.chemical_element, 02 engineering and technology, Insulated-gate bipolar transistor, law.invention, chemistry, Optical microscope, Aluminium, law, Parasitic element, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Electrical and Electronic Engineering, business, Short circuit, Common emitter, Voltage
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3
المؤلفون: Franz-Josef Niedernostheide, Roman Baburske, Anton Mauder, Frank Pfirsch, Quang Tien Tran, Hans-Gunter Eckel
المصدر: 2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD).
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, 020208 electrical & electronic engineering, Schottky diode, 02 engineering and technology, Insulated-gate bipolar transistor, Integrated circuit, 01 natural sciences, Power (physics), law.invention, law, Logic gate, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, business, Diode, Voltage, Common emitter
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::350db2668cb4289fda30c000d99152c4
https://doi.org/10.23919/ispsd50666.2021.9452199 -
4
المؤلفون: Hans-Joachim Schulze, Franz-Josef Niedernostheide, Jens Kowalsky, Josef Lutz, Riteshkumar Bhojani, Roman Baburske
المصدر: Microelectronics Reliability. :236-241
مصطلحات موضوعية: 010302 applied physics, Work (thermodynamics), Materials science, 020208 electrical & electronic engineering, Current crowding, 02 engineering and technology, Insulated-gate bipolar transistor, Mechanics, Electrical Failure, Condensed Matter Physics, 01 natural sciences, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Safe operating area, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Short circuit, Energy (signal processing), Voltage
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5
المؤلفون: Thomas Basler, Franz-Josef Niedernostheide, Roman Baburske, Hans-Joachim Schulze, Josef Lutz, Madhu-Lakshman Mysore
المصدر: ISPS'21 Proceedings.
مصطلحات موضوعية: Materials science, chemistry, Aluminium, business.industry, chemistry.chemical_element, Optoelectronics, Current (fluid), business, Short circuit
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1478d2e520a9d6734c8fe342725ea27a
https://doi.org/10.14311/isps.2021.003 -
6
المؤلفون: Thomas Basler, Hans-Joachim Schulze, Madhu-Lakshman Mysore, Roman Baburske, Franz-Josef Niedernostheide, Josef Lutz
المصدر: ISPS'21 Proceedings.
مصطلحات موضوعية: Materials science, Robustness (computer science), Electronic engineering, Insulated-gate bipolar transistor, Short circuit, Common emitter
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e52bbd57878a3a68ef33ec825e846fd9
https://doi.org/10.14311/isps.2021.004 -
7
المؤلفون: Frank Dieter Pfirsch, Roman Baburske, F. Hille, Franz Josef Niedernostheide, V. van Treek, H.-J. Schulze
المصدر: ISPS'21 Proceedings.
مصطلحات موضوعية: Computer science, Key (cryptography), Short circuit, Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::33401266ecf93c2b36603605e6155314
https://doi.org/10.14311/isps.2021.001 -
8
المؤلفون: Franz-Josef Niedernostheide, Thorsten Arnold, Roman Baburske, Ilaria Imperiale, Hans-Jurgen Thees, Philipp Ross, Frank Wolter, Alexander Philippou, Erich Griebl
المصدر: 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD).
مصطلحات موضوعية: 010302 applied physics, Materials science, Cellular topology, business.industry, 020208 electrical & electronic engineering, 02 engineering and technology, Insulated-gate bipolar transistor, 01 natural sciences, Micro pattern, 0103 physical sciences, Trench, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, business, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6ff5deacab50dfd099fa5baefe516dfb
https://doi.org/10.1109/ispsd46842.2020.9170037 -
9
المصدر: 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD).
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Oscillation, 020208 electrical & electronic engineering, Charge (physics), 02 engineering and technology, Insulated-gate bipolar transistor, 01 natural sciences, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Charge carrier, Voltage range, Voltage source, business, Short circuit
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2111203f6d1c4680bb208a22819894d1
https://doi.org/10.1109/ispsd46842.2020.9170192 -
10
المؤلفون: Anton Mauder, Alexander Philippou, Erich Griebl, Ilaria Imperiale, Hans-Jurgen Thees, Thorsten Arnold, Christian Philipp Sandow, Franz Josef Niedernostheide, Frank Wolter, Roman Baburske
المصدر: 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD).
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, 020208 electrical & electronic engineering, Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Insulated-gate bipolar transistor, 01 natural sciences, 0103 physical sciences, Trench, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Charge carrier, Parasitic extraction, business, Current density, Scaling, Sensitivity (electronics), Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::20cf5df27ebef0311143dcfea2dcbaa4
https://doi.org/10.1109/ispsd46842.2020.9170076