المؤلفون: Ronse, K.

المصدر: IEEE Electron Devices Magazine IEEE Electron Devices Mag. Electron Devices Magazine, IEEE. 2(1):35-44 Mar, 2024

المؤلفون: Samavedam, S. B., Ryckaert, J., Beyne, E., Ronse, K., Horiguchi, N., Tokei, Z., Radu, I., Bardon, M. G., Na, M. H., Spessot, A., Biesemans, S.

المصدر: 2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :1.1.1-1.1.10 Dec, 2020

Relation: 2020 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Nackaerts, A., Ercken, M., Demuynck, S., Lauwers, A., Baerts, C., Bender, H., Boulaert, W., Collaert, N., Degroote, B., Delvaux, C., de Marneffe, J.F., Dixit, A., De Meyer, K., Hendrickx, E., Heylen, N., Jaenen, P., Laidler, D., Locorotondo, S., Maenhoudt, M., Moelants, M., Pollentier, I., Ronse, K., Rooyackers, R., Van Aelst, J., Vandenberghe, G., Vandervorst, W., Vandeweyer, T., Vanhaelemeersch, S., Van Hove, M., Van Olmen, J., Verhaegen, S., Versluijs, J., Vrancken, C., Wiaux, V., Jurczak, M., Biesemans, S.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :269-272 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Croon, J.A., Leunissen, L.H.A., Jurczak, M., Benndorf, M., Rooyackers, R., Ronse, K., Decoutere, S., Sansen, W., Maes, H.E.

المصدر: ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003. Solid-state device research - ESSDERC '03 European Solid-State Device Research, 2003. ESSDERC '03. 33rd Conference on. :227-230 2003

Relation: ESSDERC 2003. Proceedings of the 33rd European Solid-State Device Research - ESSDERC '03

المؤلفون: Van den Hove, L., Goethals, A.M., Ronse, K., Van Bavel, M., Vandenberghe, G.

المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :3-8 2002

Relation: IEEE International Electron Devices Meeting

المؤلفون: Ronse, K., Jansen, P., Gronheid, R., Hendrickx, E., Maenhoudt, M., Wiaux, V., Goethals, A.-M., Jonckheere, R., Vandenberghe, G.

المصدر: IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 56(8):1884-1891 Aug, 2009

المؤلفون: van den Hove, L., Ronse, K., Pforr, R.

المصدر: 1995 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers VLSI technology, systems and applications VLSI Technology, Systems, and Applications, 1995. Proceedings of Technical Papers. 1995 International Symposium on. :24-30 1995

Relation: 1995 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers

المؤلفون: Ronse, K., Maenhoudt, M., Pollentier, I., Wiaux, V., Struyf, H., Lepage, M., Vanhaelemeersch, S.

المصدر: Proceedings of the IEEE 2000 International Interconnect Technology Conference (Cat. No.00EX407) Interconnect technology Interconnect Technology Conference, 2000. Proceedings of the IEEE 2000 International. :87-89 2000

Relation: Proceedings of the IEEE 2000 International Interconnect Technology Conference

المؤلفون: Veloso, A., Demuynck, S., Ercken, M., Goethals, A. M., Locorotondo, S., Lazzarino, F., Altamirano, E., Huffman, C., De Keersgieter, A., Brus, S., Demand, M., Struyf, H., De Backer, J., Hermans, J., Delvaux, C., Baudemprez, B., Vandeweyer, T., Van Roey, F., Baerts, C., Goossens, D., Dekkers, H., Ong, P., Heylen, N., Kellens, K., Volders, H., Hikavyy, A., Vrancken, C., Rakowski, M., Verhaegen, S., Dusa, M., Romijn, L., Pigneret, C., Van Dijk, A., Schreutelkamp, R., Cockburn, A., Gravey, V., Meiling, H., Hultermans, B., Lok, S., Shah, K., Rajagopalan, R., Gelatos, J., Richard, O., Bender, H., Vandenberghe, G., Beyer, G. P., Absil, P., Hoffmann, T., Ronse, K., Biesemans, S.

المصدر: 2009 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2009 IEEE International. :1-4 Dec, 2009

Relation: 2009 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Veloso, A., Demuynck, S., Ercken, M., Goethals, A. M., Demand, M., de Marneffe, J.-F., Altamirano, E., De Keersgieter, A., Delvaux, C., De Backer, J., Brus, S., Hermans, J., Baudemprez, B., Van Roey, F., Lorusso, G. F., Baerts, C., Goossens, D., Vrancken, C., Mertens, S., Versluijs, J. J., Truffert, V., Huffman, C., Laidler, D., Heylen, N., Ong, P., Parvais, B., Rakowski, M., Verhaegen, S., Hikavyy, A., Meiling, H., Hultermans, B., Romijn, L., Pigneret, C., Lok, S., Van Dijk, A., Shah, K., Noori, A., Gelatos, J., Arghavani, R., Schreutelkamp, R., Boelen, P., Richard, O., Bender, H., Witters, L., Collaert, N., Rooyackers, R., Absil, P., Lauwers, A., Jurczak, M., Hoffmann, T., Vanhaelemeersch, S., Cartuyvels, R., Ronse, K., Biesemans, S.

المصدر: 2008 IEEE International Electron Devices Meeting Electron Devices Meeting, 2008. IEDM 2008. IEEE International. :1-4 Dec, 2008

Relation: 2008 IEEE International Electron Devices Meeting (IEDM)