المؤلفون: Miyauchi, S., Tanaka, K., Russ, J.C.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 17(6):450-457 Jun, 1970

المؤلفون: Collins, P.C., Welk, B., Searles, T., Tiley, J., Russ, J.C., Fraser, H.L.

المصدر: In Materials Science & Engineering A 2009 508(1):174-182

المؤلفون: Tiley, J, Searles, T, Lee, E, Kar, S, Banerjee, R, Russ, J.C, Fraser, H.L

المصدر: In Materials Science & Engineering A 2004 372(1):191-198

المؤلفون: Russ, J.C.

المصدر: In Encyclopedia of Materials: Science and Technology 2011:3247-3253

المؤلفون: Russ, J.C.

المصدر: In Encyclopedia of Materials: Science and Technology 2011:8852-8856

المؤلفون: Fahmy, Y., Russ, J.C., Koch, C.C.

المصدر: Journal of Materials Research; 09/01/1991, Vol. 6 Issue 9, p1856-1861, 6p

المؤلفون: Kodama, K., Ushida, N., Mokhtarani, A., Paolone, V.S., Volk, J.T., Wilcox, J.O., Yager, P.M., Edelstein, R.M., Freyberger, A.P., Gibaut, D.B., Lipton, R.J., Nichols, W.R., Potter, D.M., Russ, J.C., Zhang, C., Zhang, Y., Jang, H.I., Kim, J.Y., Kim, T.I., Lim, I.T., Pac, M.Y., Baller, B.R., Stefanski, R.J., Nakazawa, K., Chung, K.S., Chung, S.H., Kim, D.C., Park, I.G., Park, M.S., Song, J.S., Yoon, C.S., Chikawa, M., Abe, T., Aoki, S., Fujii, T., Fujioka, G., Fujiwara, K., Fukushima, H., Hara, T., Takahashi, Y., Taruma, K., Tsuzuki, Y., Yokoyama, C., Chang, S.D., Cheon, B.G., Cho, J.H., Kang, J.S., Kim, C.O., Kim, K.Y., Kim, T.Y., Lee, J.C., Lee, S.B., Lim, G.Y., Nam, S.W., Shin, T.S., Sim, K.S., Woo, J.K., Isokane, Y., Tsuneoka, Y., Gauthier, A., Hoshino, K., Kitamura, H., Kobayashi, M., Komatsu, M., Miyanishi, M., Nakamura, K., Nakamura, M., Nakamura, Y., Nakanishi, S., Niu, K., Niwa, K., Nomura, M., Okada, K., Tajima, H., Toshitou, T., Yoshida, S., Aryal, M., Dunlea, J.M., Frederiksen, S.G., Kuramata, S., Lundberg, B.G., Oleynik, G.A., Reay, N.W., Reibel, K., Sidwell, R.A., Stanton, N.R., Moriyama, K., Shibata, H., Kalbfleisch, G.R., Skubic, P., Smow, J.M., Willis, S.E., Kusumoto, O., Nakamura, K., Ohashi, S., Okusawa, T., Teranaka, M., Tominaga, T., Yoshida, T., Yuuki, H., Okabe, H., Yokota, J., Ikegami, S., Kazuno, M., Koya, T., Niu, E., Ogawa, S., Shibuya, H., Watanabe, S., Yasuda, N., Sato, Y., Seshimo, M., Tezuka, I., Bahk, S.Y., Kim, S.K.

المصدر: Physics Letters B; October 1993, Vol. 316 Issue: 2-3 p455-462, 8p

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المؤلفون: Russ J.C., eds., Barrett C.S., Leyden D.E., Predecki P.K.

مصطلحات الفهرس: industrial applications, metals, x-ray analysis, text

URL: http://worldcat.org/search?q=on:UKMMM+https://icon.iom3.org/cgi-bin/koha/oai.pl+DCG_ENTIRE_REPOSITORY+CNTCOLL

المؤلفون: Cohen J.B., eds., Barrett C.S., Leyden D.E., Predecki P.K., Russ J.C.

مصطلحات الفهرس: industrial applications, metals, x-ray analysis, text

URL: http://worldcat.org/search?q=on:UKMMM+https://icon.iom3.org/cgi-bin/koha/oai.pl+DCG_ENTIRE_REPOSITORY+CNTCOLL