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المؤلفون: Dean Uehara, Luca Macchiarulo, Isar Mostafanezhad, Ruth Perron, B. Rotter, G. S. Varner, Christopher Chock, Ehsan Yavari
المصدر: 2020 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC).
مصطلحات موضوعية: Front and back ends, Sampling (signal processing), business.industry, Computer science, Dynamic range, Electronic engineering, System on a chip, Particle physics experiments, business, Chip, Digital signal processing, High dynamic range
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::91ccc0f6a441e6a8b1bc7a9034d6392e
https://doi.org/10.1109/nss/mic42677.2020.9507884