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1دورية أكاديمية
المؤلفون: Gupta, A., Mora, S., Zhang, F., Rutten, M., Venkatesha Prasad, R., Ratti, C.
المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 24(13):21286-21299 Jul, 2024
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2مؤتمر
المؤلفون: Gerards, Noelle P.C.M., Rutten, Marcel C.M., Turco, Simona, Mischi, Massimo, Arthur Bouwman, R., Korsten, Hendrikus H.M., Backx, Ton, van de Vosse, Frans N.
المصدر: 2024 IEEE International Symposium on Medical Measurements and Applications (MeMeA) Medical Measurements and Applications (MeMeA), 2024 IEEE International Symposium on. :1-6 Jun, 2024
Relation: 2024 IEEE International Symposium on Medical Measurements and Applications (MeMeA)
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3مؤتمر
المؤلفون: Vaudey, Jolahn, Mocanu, Stephane, Delaval, Gwenael, Rutten, Eric
المصدر: 2024 IEEE 10th International Conference on Network Softwarization (NetSoft) Network Softwarization (NetSoft), 2024 IEEE 10th International Conference on. :375-380 Jun, 2024
Relation: 2024 IEEE 10th International Conference on Network Softwarization (NetSoft)
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4دورية أكاديمية
المؤلفون: Hanneke Theelen (ORCID
0000-0003-0169-7922 ), Joyce Vreuls (ORCID0000-0001-5761-4773 ), Jim Rutten (ORCID0009-0009-6071-0358 )المصدر: International Journal of Technology in Education. 2024 7(1):1-18.
Peer Reviewed: Y
Page Count: 19
Descriptors: Artificial Intelligence, Science Education, Educational Research, Coding, Technology Uses in Education, Foreign Countries, Students
مصطلحات جغرافية: Netherlands
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5دورية أكاديمية
المؤلفون: Rutten, Alex
المصدر: BelphégorOpenAIRE.
مصطلحات موضوعية: middlebrow, detective fiction, pulp, the Netherlands
Relation: http://journals.openedition.org/belphegor/basictei/1044; http://journals.openedition.org/belphegor/tei/1044
URL الوصول: http://journals.openedition.org/belphegor/1044
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6تقرير
المؤلفون: Tari, Henry, Khan, Danial, Rutten, Justus, Othman, Darian, Kaushal, Rishabh, Bertaglia, Thales, Iamnitchi, Adriana
مصطلحات موضوعية: Computer Science - Computers and Society
URL الوصول: http://arxiv.org/abs/2407.08323
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7دورية أكاديمية
المؤلفون: Javvaji, S., Bolatkale, M., Bajoria, S., Rutten, R., Essink, B.O., Beijens, K., Makinwa, K.A.A., Breems, L.J.
المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 59(4):1184-1193 Apr, 2024
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8دورية أكاديمية
المؤلفون: Aalbers, AGJ, Aziz, NA, Abraham-Nordling, M, Akiyoshi, T, Alahmadi, R, Alberda, W, Albert, M, Andric, M, Angeles, M, Antoniou, A, Armitage, J, Auer, R, Austin, KK, Aytac, E, Baker, RP, Bali, M, Baransi, S, Bebington, B, Bedford, M, Bednarski, BK, Beets, GL, Berg, PL, Bergzoll, C, Biondo, S, Boyle, K, Bordeianou, L, Brecelj, E, Bremers, AB, Brunner, M, Bui, A, Burgess, A, Burger, JWA, Campain, N, Carvalhal, S, Castro, L, Ceelen, W, Chan, KKL, Chew, MH, Chok, AK, Chong, P, Christensen, HK, Clouston, H, Collins, D, Colquhoun, AJ, Constantinides, J, Corr, A, Coscia, M, Cosimelli, M, Cotsoglou, C, Damjanovic, L, Davies, M, Davies, RJ, Delaney, C, de Wilt, JHW, Deutsch, C, Dietz, D, Domingo, S, Dozois, EJ, Duff, M, Egger, E, Enrique-Navascues, JM, Espin-Basany, E, Eyjolfsdottir, B, Fahy, M, Fearnhead, N, Fichtner-Feigl, S, Fleming, F, Flor, B, Foskett, K, Funder, J, Garcia-Granero, E, Garcia-Sabrido, JL, Gargiulo, M, Gava, VG, Gentilini, L, Ml, G, George, Georgiou, P, Ghosh, A, Ghouti, L, Giner, F, Ginther, N, Glover, T, Golda, T, Gomez, CM, Harris, C, Hagemans, JAW, Hanchanale, Harji, DP, Helbren, C, Helewa, RM, Hellawell, G, Heriot, AG, Hochman, D, Hohenberger, W, Holm, T, Holmstrom, A, Hompes, R, Hornung, B, Hurton, S, Hyun, E, Ito, M, Jenkins, JT, Jourand, K, Kaffenberger, S, Kapur, S, Kanemitsu, Y, Kaufman, M, Kelley, SR, Keller, DS, Kersting, S, Ketelaers, SHJ, Khan, MS, Khaw, J, Kim, H, Kim, HJ, Kiran, R, Koh, CE, Kok, NFM, Kontovounisios, C, Kose, F, Koutra, M, Kraft, M, Kristensen, HO, Kumar, S, Lago, Lakkis, Z, Lampe, B, Larsen, SG, Larson, DW, Law, WL, Laurberg, S, Lee, PJ, Limbert, M, Loria, A, Lynch, AC, Mackintosh, M, Mantyh, C, Mathis, KL, Margues, CFS, Martinez, A, Martling, A, Meijerink, WJHJ, Merchea, A, Merkel, S, Mehta, AM, McArthur, DR, McCormick, JJ, McGrath, JS, McPhee, A, Maciel, J, Malde, S, Manfredelli, S, Mikalauskas, S, Modest, D, Morton, JR, Mullaney, TG, Navarro, AS, Neto, JWM, Nguyen, B, Nielsen, MB, Nieuwenhuijzen, GAP, Nilsson, PJ, Nordkamp, S, O'Dwyer, ST, Paarnio, K, Pappou, E, Park, J, Patsouras, D, Peacock, O, Pfeffer, F, Piqeur, F, Pinson, J, Poggioli, G, Proud, D, Quinn, M, Oliver, A, Radwan, RW, Rajendran, N, Rao, C, Rasheed, S, Rasmussen, PC, Rausa, E, Regenbogen, SE, Reims, HM, Renehan, A, Rintala, J, Rocha, R, Rochester, M, Rohila, J, Rottoli, M, Roxburgh, C, Rutten, HJT, Safar, B, Sagar, PM, Sahai, A, Schizas, AMP, Schwarzkopf, E, Scripcariu, D, Scripcariu, Seifert, G, Selvasekar, C, Shaban, M, Shaikh, Shida, D, Simpson, A, Skeie-Jensen, T, Smart, P, Smith, JJ, Solbakken, AM, Solomon, MJ, Sorensen, MM, Spasojevic, M, Steffens, D, Stocchi, L, Stylianides, NA, Swartling, T, Sumrien, H, Swartking, T, Takala, H, Tan, EJ, Taylor, D, Tejedor, P, Tekin, A, Tekkis, PP, Thaysen, H, Thurairaja, R, Toh, EL, Tsarkov, P, Tolenaar, J, Tsukada, Y, Tsukamoto, S, Tuech, JJ, Turner, G, Turner, WH, Tuynman, JB, Valente, M, van Rees, J, van Zoggel, D, Vasquez-Jimenez, W, Verhoef, C, Vierimaa, M, Vizzielli, G, Voogt, ELK, Uehara, K, Wakeman, C, Warrier, S, Wasmuth, HH, Weiser, MR, Westney, OL, Wheeler, JMD, Wild, J, Wilson, M, Yano, H, Yip, B, Yip, J, Yoo, RN, Zappa, MA
المصدر: The British journal of surgery. 111(3)
مصطلحات موضوعية: Medicin och hälsovetenskap
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9تقرير
المؤلفون: de Grauw, M. J. J., Scholten, E. Th., Smit, E. J., Rutten, M. J. C. M., Prokop, M., van Ginneken, B., Hering, A.
مصطلحات موضوعية: Electrical Engineering and Systems Science - Image and Video Processing, Computer Science - Computer Vision and Pattern Recognition, Computer Science - Machine Learning
URL الوصول: http://arxiv.org/abs/2406.05231
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10مؤتمر
المؤلفون: Chehida, Salim, Fellah, Karim, Rutten, Eric, Giraud, Guillaume, Mocanu, Stephane
المصدر: 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA) Emerging Technologies and Factory Automation (ETFA), 2023 IEEE 28th International Conference on. :1-8 Sep, 2023
Relation: 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA)