المؤلفون: Chang, Jasper C. C., Huang, Ryan H. -M., Lin, Louis Y. -Z., Wen, Charles H.-P.

المصدر: 2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC) Design Automation Conference (DAC), 2015 52nd ACM/EDAC/IEEE. :1-6 Jun, 2015

Relation: 2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC)

المؤلفون: Wang, Hunta H.-W., Lin, Louis Y.-Z., Huang, Ryan H.-M., Wen, Charles H.-P.

المصدر: 2014 43rd International Conference on Parallel Processing Parallel Processing (ICPP), 2014 43rd International Conference on. :192-200 Sep, 2014

Relation: 2014 43nd International Conference on Parallel Processing (ICPP)

المؤلفون: Huang, Ryan H.-M., Wen, Charles H.-P.

المصدر: 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC) Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE. :1-6 Jun, 2014

Relation: 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)

المؤلفون: Hsueh, Sung S.-Y., Huang, Ryan H.-M., Wen, Charles H.-P.

المصدر: Fifteenth International Symposium on Quality Electronic Design Quality Electronic Design (ISQED), 2014 15th International Symposium on. :529-534 Mar, 2014

Relation: 2014 15th International Symposium on Quality Electronic Design (ISQED)

المؤلفون: Ku, Jerry C. Y., Huang, Ryan H.-M., Lin, Louis Y.-Z., Wen, Charles H.-P.

المصدر: 2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC) Design Automation Conference (ASP-DAC), 2014 19th Asia and South Pacific. :664-669 Jan, 2014

Relation: 2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC)

المؤلفون: Lin, Cosette Y.H., Huang, Ryan H.-M., Wen, Charles H.-P., Chang, Austin C.-C.

المصدر: 2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT) VLSI Design, Automation, and Test (VLSI-DAT), 2013 International Symposium on. :1-4 Apr, 2013

Relation: 2013 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)

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المؤلفون: Mattingley, J. M., Ryan, H. M.

المصدر: Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1973 Electrical Insulation & Dielectric Phenomena - Annual Report 1973, Conference on. :222-233 Oct, 1973

Relation: Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1973

المؤلفون: Mattingley, J. M., Ryan, H. M.

المصدر: Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1971 Electrical Insulation & Dielectric Phenomena - Annual Report 1971, Conference on. :141-148 Nov, 1971

Relation: Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1971

المؤلفون: Huang, Ryan H.-M., Hsu, Dennis K.-H., Wen, Charles H.-P.

المصدر: Journal of Electronic Testing: Theory and Applications. April 2015 31(2):181-192