المؤلفون: Gao, Z., Meneghini, M., Rampazzo, F., Rzin, M., De Santi, C., Meneghesso, G., Zanoni, E.

المصدر: Microelectronics Reliability, Volumes 100-101, 2019, 113489

مصطلحات موضوعية: Physics - Applied Physics

URL الوصول: http://arxiv.org/abs/2107.08412

المؤلفون: Rzin, M., Meneghini, M., Rampazzo, F., Zhan, V.G., Marcon, D., Grunenputt, J., Jung, H., Lambert, B., Riepe, K., Blanck, H., Graff, A., Altmann, F., Simon-Najasek, M., Poppitz, D., Meneghesso, G., Zanoni, E.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(7):2765-2770 Jul, 2020

المؤلفون: Rzin, M., Guillet, B., Mechin, L., Gamarra, P., Lacam, C., Medjdoub, F., Routoure, J.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 66(12):5080-5083 Dec, 2019

المؤلفون: Rzin, M., Routoure, J., Guillet, B., Mechin, L., Morales, M., Lacam, C., Gamarra, P., Ruterana, P., Medjdoub, F.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(7):2820-2825 Jul, 2017

المؤلفون: Rzin, M., Curutchet, A., Labat, N., Malbert, N., Brunel, L., Lambert, B.

المصدر: 2015 International Conference on Noise and Fluctuations (ICNF) Noise and Fluctuations (ICNF), 2015 International Conference on. :1-4 Jun, 2015

Relation: 2015 International Conference on Noise and Fluctuations (ICNF)

المؤلفون: Rzin, M., Curutchet, A., Labat, N., Malbert, N., Brunel, L., Lambert, B.

المصدر: 2013 European Microwave Integrated Circuit Conference Microwave Integrated Circuits Conference (EuMIC), 2013 European. :236-239 Oct, 2013

Relation: 2013 European Microwave Integrated Circuit Conference (EuMIC)

المؤلفون: Mukherjee, K., De Santi, C., Rzin, M., Gao, Z., Meneghesso, G., Meneghini, M., Zanoni, E.

المصدر: In Microelectronics Reliability September 2019 100-101

المؤلفون: Gao, Z., Meneghini, M., Rampazzo, F., Rzin, M., De Santi, C., Meneghesso, G., Zanoni, E.

المصدر: In Microelectronics Reliability September 2019 100-101

المؤلفون: Rzin, M., Meneghini, M., Rampazzo, F., Zhan, V. Gao, De Santi, C., Kabouche, R., Zegaoui, M., Medjdoub, F., Meneghesso, G., Zanoni, E.

المصدر: In Microelectronics Reliability September 2019 100-101

المؤلفون: Rzin, M., Chini, A., De Santi, C., Meneghini, M., Hugger, A., Hollmer, M., Stieglauer, H., Madel, M., Splettstößer, J., Sommer, D., Grünenpütt, J., Beilenhoff, K., Blanck, H., Chen, J.-T., Kordina, O., Meneghesso, G., Zanoni, E.

المصدر: In Microelectronics Reliability September 2018 88-90:397-401