المؤلفون: R. Alcala, M. Materano, P. D. Lomenzo, L. Grenouillet, T. Francois, J. Coignus, N. Vaxelaire, C. Carabasse, S. Chevalliez, F. Andrieu, T. Mikolajick, U. Schroeder

المصدر: IEEE Journal of the Electron Devices Society, Vol 10, Pp 907-912 (2022)

مصطلحات موضوعية: BEOL, ferroelectric, HfO₂, reliability, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9854909/; https://doaj.org/toc/2168-6734

URL الوصول: https://doaj.org/article/b30337593a644526807ec901895369a8

المؤلفون: P. Chiquet, T. Francois, Jean Coignus, Uwe Schroeder, F. Gaillard, Nicolas Vaxelaire, Etienne Nowak, S. Chevalliez, Stefan Slesazeck, Marc Bocquet, Laurent Grenouillet, Thomas Mikolajick, F. Aussenac, C. Carabasse, Claudia Richter

المساهمون: Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), NaMLab gGmbH

المصدر: Applied Physics Letters
Applied Physics Letters, 2021, 118 (6), pp.062904. ⟨10.1063/5.0035650⟩

مصطلحات موضوعية: 010302 applied physics, Materials science, Physics and Astronomy (miscellaneous), business.industry, Orders of magnitude (temperature), chemistry.chemical_element, 02 engineering and technology, Dielectric, 021001 nanoscience & nanotechnology, 01 natural sciences, Ferroelectricity, law.invention, Back end of line, Capacitor, chemistry, law, 0103 physical sciences, Optoelectronics, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 0210 nano-technology, Tin, business, Polarization (electrochemistry), Scaling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::51892e1fc906f8179fd078e0727b99e1

المؤلفون: C. Pellissier, Etienne Nowak, S. Chevalliez, Furqan Mehmood, F. Mazen, T. Francois, Uwe Schroeder, F. Triozon, Sebastien Kerdiles, Thomas Mikolajick, F. Gaillard, Guillaume Rodriguez, T. Magis, Laurent Grenouillet, Viktor Havel, Jean Coignus, C. Carabasse, Nicolas Vaxelaire, Stefan Slesazeck

المصدر: 2020 IEEE Symposium on VLSI Technology.

مصطلحات موضوعية: 010302 applied physics, Materials science, Silicon, business.industry, chemistry.chemical_element, Coercivity, Laser, 01 natural sciences, Ferroelectricity, law.invention, Back end of line, Capacitor, chemistry, CMOS, law, 0103 physical sciences, Optoelectronics, Wafer, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::27bb758f9903d67ad4cfe33b36d749ea
https://doi.org/10.1109/vlsitechnology18217.2020.9265061

المؤلفون: F. Aussenac, P. Acosta-Alba, V. Beugin, V. Mazzocchi, Xavier Garros, Mikael Casse, Sebastien Kerdiles, C. Vizioz, C. Guerin, N. Rambal, F. Ponthenier, J. Micout, Perrine Batude, Maud Vinet, Bernard Previtali, Francois Andrieu, Claire Fenouillet-Beranger, S. Chevalliez, J-M. Pedini, Laurent Brunet

المصدر: 2019 Electron Devices Technology and Manufacturing Conference (EDTM).

مصطلحات موضوعية: Materials science, Silicon, chemistry, Annealing (metallurgy), Logic gate, Hardware_INTEGRATEDCIRCUITS, Gate stack, Silicon on insulator, chemistry.chemical_element, Hardware_PERFORMANCEANDRELIABILITY, Epitaxy, Engineering physics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2087db0598ab33110cf86534df124584
https://doi.org/10.1109/edtm.2019.8731192

المؤلفون: J. Garrione, Marie-Claire Cyrille, Pierre Noé, Gabriele Navarro, N. Castellani, Mathieu Bernard, A. Verdy, Emmanuel Nolot, Veronique Sousa, Etienne Nowak, Guillaume Bourgeois, S. Chevalliez

المساهمون: Savelli, Bruno, PANACHE - PANACHE - - EC:FP7:SP1-JTI2014-01-02 - 2018-01-02 - 621217 - VALID, IEEE, Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), European Project: 621217,EC:FP7:SP1-JTI,ENIAC-2013-2,PANACHE(2014)

المصدر: IRPS
International Reliability Physics Symposium (IRPS)
2018 IEEE International Reliability Physics Symposium (IRPS)
2018 IEEE International Reliability Physics Symposium (IRPS), Mar 2018, Burlingame, United States. pp.6D.4-1-6D.4-6

مصطلحات موضوعية: OTS, Threshold voltage, Materials science, [SPI] Engineering Sciences [physics], Chalcogenide, Resistance, chemistry.chemical_element, 02 engineering and technology, Back-End-of-Line Selector, 01 natural sciences, Leakage currents, [SPI]Engineering Sciences [physics], chemistry.chemical_compound, Reliability (semiconductor), 0103 physical sciences, Electrodes, 010302 applied physics, business.industry, Crossbar, 021001 nanoscience & nanotechnology, Carbon, chemistry, Tin, Electrode, Performance evaluation, Optoelectronics, Degradation (geology), Carbon Electrode, Crossbar switch, 0210 nano-technology, business, Layer (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ba7ce9c6ddfb3087bca84b1e77711423
https://doi.org/10.1109/irps.2018.8353635

المؤلفون: C. Scibetta, S. Beaurepaire, F. Fournel, A. Roman, S. Chevalliez, C. Fenouillet-Beranger, X. Garros, Xavier Federspiel, J. Aubin, V. Larrey, Perrine Batude, F. Kouemeni-Tchouake, F. Ponthenier, J-B. Pin, Daniel Scevola, Lucile Arnaud, F. Aussenac, C. Guerin, P. Acosta-Alba, V. Mazzocchi, Sebastien Kerdiles, H. Fontaine, Shay Reboh, P. Perreau, Sylvain Maitrejean, Laurent Brunet, N. Rambal, M. Vinet, Pascal Besson, Christophe Morales, T. Lardin, V. Balan, Vincent Jousseaume, D. Ney, F. Mazen, Francois Andrieu

المصدر: 2018 IEEE International Electron Devices Meeting (IEDM)

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Order (ring theory), 02 engineering and technology, Epitaxy, 01 natural sciences, Active devices, 020202 computer hardware & architecture, Design for manufacturability, Reliability (semiconductor), CMOS, Surface preparation, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Wafer, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::206d35153ba5f44ca9aa06493e9c2b57

المؤلفون: B. Traore, F. Perrin, L. Perniola, Emmanuel Nolot, E. Vianello, Nicolas Vaxelaire, F. Mazen, J. Coignus, Alessandro Grossi, P. Blaise, L. Lachal, S. Bernasconi, S. Pauliac, E. Nowak, S. Chevalliez, J. F. Nodin, R. Crochemore, L. Grenouillet, M. Barlas, C. Pellissier

المصدر: 2017 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: 010302 applied physics, Materials science, Silicon, business.industry, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Resistive random-access memory, Ion implantation, chemistry, Robustness (computer science), 0103 physical sciences, Memory window, Optoelectronics, Data retention, 0210 nano-technology, business, Low voltage, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e525df8362cea51b975b7d5fc88fe9c4
https://doi.org/10.1109/iedm.2017.8268392

المؤلفون: V. Loup, G. Audoit, S. Reboh, R. Coquand, M. Vinet, M. Barlas, N. Rambal, S Barraud, A. Toffoli, E. Vianello, C. Jahan, V. Beugin, Vincent Delaye, O. Pollet, L. Brevard, C. Vizioz, O. Faynot, T. Dewolf, Nicolas Posseme, S. Chevalliez, N. Allouti, L. Perniola, Sébastien Barnola, B. Bouix, S. Bernasconi, C. Comboroure, Philippe Rodriguez, Yves Morand, C. Tallaron, L. Grenouillet

المصدر: Extended Abstracts of the 2017 International Conference on Solid State Devices and Materials.

مصطلحات موضوعية: Materials science, law, Process (engineering), Transistor, Engineering physics, law.invention

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::40e32b0961ff0b1c447494a433e2c935
https://doi.org/10.7567/ssdm.2017.d-1-04

المؤلفون: S. Mouleres, S. Chevalliez, L. Dantas de Morais

المصدر: Microelectronics Reliability. 54:1802-1805

مصطلحات موضوعية: Materials science, Metallurgy, chemistry.chemical_element, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Ion, Cross section (physics), chemistry, Melting point, Vacuum chamber, Electrical and Electronic Engineering, Composite material, Safety, Risk, Reliability and Quality, Indium, Eutectic system

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6bc4a90dfe6b83bc44eaf2bdd5acfee3
https://doi.org/10.1016/j.microrel.2014.08.004

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