المؤلفون: Massimiliano Belluso, Sergio Billotta, Vito Raineri, Antonella Sciuto, Giovanni Bonanno, Salvatore Di Franco, S. F. Liotta, Fabrizio Roccaforte

المصدر: Materials Science Forum. :945-948

مصطلحات موضوعية: Fabrication, Materials science, business.industry, Mechanical Engineering, Wide-bandgap semiconductor, Schottky diode, Condensed Matter Physics, Photodiode, law.invention, Optics, Mechanics of Materials, law, Optoelectronics, General Materials Science, Quantum efficiency, business, Dark current, Visible spectrum, Diode

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5c176ba4adaaf4ac750f3dc30afa930c
https://doi.org/10.4028/www.scientific.net/msf.556-557.945

المؤلفون: S. F. Liotta, S. Di Franco, Antonella Sciuto, Giovanni Bonanno, Fabrizio Roccaforte, Vito Raineri

المصدر: Superlattices and Microstructures. 41:29-35

مصطلحات موضوعية: Materials science, business.industry, Schottky barrier, Schottky diode, Condensed Matter Physics, Metal–semiconductor junction, Photodiode, law.invention, Responsivity, Optics, law, Electrode, Optoelectronics, General Materials Science, Quantum efficiency, Electrical and Electronic Engineering, business, Dark current

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ed3c98f4d734b40b1384add02737deeb
https://doi.org/10.1016/j.spmi.2006.10.002

المؤلفون: Filippo Giannazzo, S. F. Liotta, Fabrizio Roccaforte, Vito Raineri

المصدر: Europhysics letters
74 (2006): 686–692. doi:10.1209/epl/i2006-10018-8
info:cnr-pdr/source/autori:Giannazzo F; Roccaforte F; Raineri V; Liotta SF/titolo:Transport localization in heterogeneous Schottky barriers of quantum-defined metal films/doi:10.1209%2Fepl%2Fi2006-10018-8/rivista:Europhysics letters (Print)/anno:2006/pagina_da:686/pagina_a:692/intervallo_pagine:686–692/volume:74

مصطلحات موضوعية: Materials science, Condensed matter physics, Conductive atomic force microscopy, business.industry, Schottky barrier, Schottky effect, General Physics and Astronomy, Schottky diode, Optics, silicon carbide, Electrical resistivity and conductivity, Microscopy, Schottky contacts, thin metal films, Thin film, business, Ballistic electron emission microscopy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bbb831649736e3b117b2ca9dbb994842
https://doi.org/10.1209/epl/i2006-10018-8

المؤلفون: G. Mascali, S. F. Liotta

المصدر: Waves and Stability in Continuous Media.

مصطلحات موضوعية: Physics, Classical mechanics, Silicon, chemistry, chemistry.chemical_element

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::26c1e2ba4ada183bfe7b087c66d2c833
https://doi.org/10.1142/9789812773616_0044

المؤلفون: Vito Raineri, Filippo Giannazzo, A. M. Piro, Francesco Priolo, Giuliana Impellizzeri, A. La Magna, Salvo Mirabella, S. F. Liotta, Enrico Napolitani

المصدر: Journal of applied physics 97 (2005): 014302–014302. doi:10.1063/1.1827342
info:cnr-pdr/source/autori:Giannazzo F; Raineri V; La Magna A; Mirabella S; Impellizzeri G; Piro AM; Priolo F; Napolitani E; Liotta SF/titolo:Carrier distribution in quantum nanostructures by scanning capacitance microscopy/doi:10.1063%2F1.1827342/rivista:Journal of applied physics/anno:2005/pagina_da:014302/pagina_a:014302/intervallo_pagine:014302–014302/volume:97

مصطلحات موضوعية: Microscope, Materials science, Silicon, business.industry, Doping, Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, Scanning capacitance microscopy, law.invention, Scanning Capacitance Microscopy, Scanning probe microscopy, Quantum wells, chemistry, law, Optoelectronics, Nanometre, business, Image resolution, Quantum well

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bc6c2575f8aedd3dac4b417a9cfd6da3
http://hdl.handle.net/20.500.11769/55561

المؤلفون: S. F. Liotta, Filippo Giannazzo, Vito Raineri, S. Rinaudo, D. Goghero, F. Priolo, Salvo Mirabella

المصدر: Journal of vacuum science & technology. B, Microelectronics and nanometer structures 22 (2004): 394–398. doi:10.1116/1.1622671
info:cnr-pdr/source/autori:Giannazzo, F; Goghero, D; Raineri, V; Mirabella, S; Priolo, F; Liotta, SF; Rinaudo, S/titolo:Simulation of scanning capacitance microscopy measurements on ultranarrow doping profiles in silicon/doi:10.1116%2F1.1622671/rivista:Journal of vacuum science & technology. B, Microelectronics and nanometer structures/anno:2004/pagina_da:394/pagina_a:398/intervallo_pagine:394–398/volume:22
Scopus-Elsevier

مصطلحات موضوعية: DEVICES, Materials science, Silicon, business.industry, Doping, General Engineering, chemistry.chemical_element, Magnification, CONTRAST REVERSAL, Scanning capacitance microscopy, Bevel, Full width, Scanning probe microscopy, Cross section (physics), Optics, chemistry, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bdc932b947d7c5448e1d584790594292
https://doi.org/10.1116/1.1622671