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المؤلفون: Massimiliano Belluso, Sergio Billotta, Vito Raineri, Antonella Sciuto, Giovanni Bonanno, Salvatore Di Franco, S. F. Liotta, Fabrizio Roccaforte
المصدر: Materials Science Forum. :945-948
مصطلحات موضوعية: Fabrication, Materials science, business.industry, Mechanical Engineering, Wide-bandgap semiconductor, Schottky diode, Condensed Matter Physics, Photodiode, law.invention, Optics, Mechanics of Materials, law, Optoelectronics, General Materials Science, Quantum efficiency, business, Dark current, Visible spectrum, Diode
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5c176ba4adaaf4ac750f3dc30afa930c
https://doi.org/10.4028/www.scientific.net/msf.556-557.945 -
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المؤلفون: S. F. Liotta, S. Di Franco, Antonella Sciuto, Giovanni Bonanno, Fabrizio Roccaforte, Vito Raineri
المصدر: Superlattices and Microstructures. 41:29-35
مصطلحات موضوعية: Materials science, business.industry, Schottky barrier, Schottky diode, Condensed Matter Physics, Metal–semiconductor junction, Photodiode, law.invention, Responsivity, Optics, law, Electrode, Optoelectronics, General Materials Science, Quantum efficiency, Electrical and Electronic Engineering, business, Dark current
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المؤلفون: Filippo Giannazzo, S. F. Liotta, Fabrizio Roccaforte, Vito Raineri
المصدر: Europhysics letters
74 (2006): 686–692. doi:10.1209/epl/i2006-10018-8
info:cnr-pdr/source/autori:Giannazzo F; Roccaforte F; Raineri V; Liotta SF/titolo:Transport localization in heterogeneous Schottky barriers of quantum-defined metal films/doi:10.1209%2Fepl%2Fi2006-10018-8/rivista:Europhysics letters (Print)/anno:2006/pagina_da:686/pagina_a:692/intervallo_pagine:686–692/volume:74مصطلحات موضوعية: Materials science, Condensed matter physics, Conductive atomic force microscopy, business.industry, Schottky barrier, Schottky effect, General Physics and Astronomy, Schottky diode, Optics, silicon carbide, Electrical resistivity and conductivity, Microscopy, Schottky contacts, thin metal films, Thin film, business, Ballistic electron emission microscopy
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المؤلفون: G. Mascali, S. F. Liotta
المصدر: Waves and Stability in Continuous Media.
مصطلحات موضوعية: Physics, Classical mechanics, Silicon, chemistry, chemistry.chemical_element
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::26c1e2ba4ada183bfe7b087c66d2c833
https://doi.org/10.1142/9789812773616_0044 -
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المؤلفون: Vito Raineri, Filippo Giannazzo, A. M. Piro, Francesco Priolo, Giuliana Impellizzeri, A. La Magna, Salvo Mirabella, S. F. Liotta, Enrico Napolitani
المصدر: Journal of applied physics 97 (2005): 014302–014302. doi:10.1063/1.1827342
info:cnr-pdr/source/autori:Giannazzo F; Raineri V; La Magna A; Mirabella S; Impellizzeri G; Piro AM; Priolo F; Napolitani E; Liotta SF/titolo:Carrier distribution in quantum nanostructures by scanning capacitance microscopy/doi:10.1063%2F1.1827342/rivista:Journal of applied physics/anno:2005/pagina_da:014302/pagina_a:014302/intervallo_pagine:014302–014302/volume:97مصطلحات موضوعية: Microscope, Materials science, Silicon, business.industry, Doping, Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, Scanning capacitance microscopy, law.invention, Scanning Capacitance Microscopy, Scanning probe microscopy, Quantum wells, chemistry, law, Optoelectronics, Nanometre, business, Image resolution, Quantum well
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bc6c2575f8aedd3dac4b417a9cfd6da3
http://hdl.handle.net/20.500.11769/55561 -
6Simulation of scanning capacitance microscopy measurements on ultranarrow doping profiles in silicon
المؤلفون: S. F. Liotta, Filippo Giannazzo, Vito Raineri, S. Rinaudo, D. Goghero, F. Priolo, Salvo Mirabella
المصدر: Journal of vacuum science & technology. B, Microelectronics and nanometer structures 22 (2004): 394–398. doi:10.1116/1.1622671
info:cnr-pdr/source/autori:Giannazzo, F; Goghero, D; Raineri, V; Mirabella, S; Priolo, F; Liotta, SF; Rinaudo, S/titolo:Simulation of scanning capacitance microscopy measurements on ultranarrow doping profiles in silicon/doi:10.1116%2F1.1622671/rivista:Journal of vacuum science & technology. B, Microelectronics and nanometer structures/anno:2004/pagina_da:394/pagina_a:398/intervallo_pagine:394–398/volume:22
Scopus-Elsevierمصطلحات موضوعية: DEVICES, Materials science, Silicon, business.industry, Doping, General Engineering, chemistry.chemical_element, Magnification, CONTRAST REVERSAL, Scanning capacitance microscopy, Bevel, Full width, Scanning probe microscopy, Cross section (physics), Optics, chemistry, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bdc932b947d7c5448e1d584790594292
https://doi.org/10.1116/1.1622671