المؤلفون: S. Morvan

المساهمون: Société de législation comparée

المصدر: Revue internationale de droit comparé 55(3):729-730

URL الوصول: https://www.persee.fr/doc/ridc_0035-3337_2003_num_55_3_18996

المؤلفون: L. Pirro, A. Zaka, S. Morvan, O. Zimmerhackl, R. Nelluri, T. Hermann, M. Majer, H. Pagel, N. Wu, M. Otto, J. Hoentschel

المصدر: 2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::54791756f365b1d40b0cdb1ab3cbccae
https://doi.org/10.1109/vlsi-tsa54299.2022.9771046

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المؤلفون: K.K.S. Tan, A. Divay, S. Morvan, L.H.K. Chan, Madabusi Govindarajan, M. T. Lau, R. Taylor, Kumaran Sundaram, Kok Wai Johnny Chew, Chi Zhang, Christoph Schwan, Andreas Huschka, Yogadissen Andee, M. Hauschildt, B. Rice, Jen Shuang Wong, Josef S. Watts, A. Bcllaouar, A. Pakfar, W. LOo, C.K. Lim, Christian Schippel, Steffen Lehmann, Zhixing Zhao, S.N. Ong, S. Embabi, David Harame, W.H. Chow, J. Mazurier, Carsten Grass, G. Workman

المصدر: 2018 IEEE Radio Frequency Integrated Circuits Symposium (RFIC).

مصطلحات موضوعية: Computer science, business.industry, 020208 electrical & electronic engineering, Transistor, Electrical engineering, Silicon on insulator, 020206 networking & telecommunications, 02 engineering and technology, law.invention, Power (physics), Parasitic capacitance, law, Logic gate, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Radio frequency, business, Low voltage, 5G

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4088f44dffef7844ef436b15c60fa838
https://doi.org/10.1109/rfic.2018.8429035

المؤلفون: Joris Lacord, J. Mazurier, Tom Herrmann, L. Pirro, El Mehdi Bazizi, Jean-Charles Barbe, P. Scheiblin, S. Morvan, David Harame, Luca Lucci, Alban Zaka, Yogadissen Andee

المصدر: 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).

مصطلحات موضوعية: 010302 applied physics, Resistive touchscreen, Engineering, business.industry, Design of experiments, Gate resistance, 3d simulation, 01 natural sciences, Cutoff frequency, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, Calibration, Electronic engineering, Figure of merit, Sensitivity (control systems), business, Simulation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c213cf018358226ec0aea39fdec7153a
https://doi.org/10.23919/sispad.2017.8085341

المؤلفون: I. Aydin, C. Weintraub, J. Schmidt, Elke Erben, Hans-Jürgen Thees, Jamie Schaeffer, J. Kluth, T. Heller, C. Metze, R. Mulfinger, S. Nielsen, Jan Hoentschel, Thomas Feudel, Jürgen Faul, Rick Carter, J. Bernard, Peter Javorka, L. Pirro, David Harame, G. Grasshoff, S. Morvan, B. Rice, Carsten Grass, J-U. Sachse, Elliot John Smith, Mahbub Rashed, C. Bao, R. Nelluri, L. M-Meskamp, J. Mazurier, Yogadissen Andee, Thorsten Kammler, E. Bourjot, A. Preusse, Heimanu Niebojewski, Maud Vinet, P-Y. Chou, Peter Baars, R. Taylor

المصدر: 2016 IEEE International Electron Devices Meeting (IEDM)

مصطلحات موضوعية: 010302 applied physics, Engineering, business.industry, Transistor, Electrical engineering, Silicon on insulator, 020206 networking & telecommunications, 02 engineering and technology, 01 natural sciences, 7. Clean energy, Silicon-germanium, law.invention, chemistry.chemical_compound, Planar, chemistry, law, Logic gate, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Radio frequency, business, 5G, Leakage (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::694b50f52b286e0ad5957b2cb925a715
https://zenodo.org/record/1272091

المؤلفون: V. Benevent, Jean-Paul Barnes, D. Lafond, Didier Dutartre, Francois Andrieu, J.M. Hartmann, M. Veillerot, S. Morvan, J.-F. Damlencourt, Bernard Previtali, Nicolas Loubet

المصدر: Solid-State Electronics. 83:10-17

مصطلحات موضوعية: Materials science, Yield (engineering), Drop (liquid), Transistor, Analytical chemistry, Gate length, Nanotechnology, Blanket, Condensed Matter Physics, Epitaxy, Electronic, Optical and Magnetic Materials, law.invention, law, Materials Chemistry, Wafer, Electrical and Electronic Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ded238f4142b08ed05fda2063f567980
https://doi.org/10.1016/j.sse.2013.01.033

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المؤلفون: Jean-Charles Barbe, Francois Andrieu, S. Morvan, Gerard Ghibaudo

المساهمون: Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)

المصدر: Solid-State Electronics
Solid-State Electronics, Elsevier, 2014, 98, pp.50-54. ⟨10.1016/j.sse.2014.04.013⟩
Solid-State Electronics, 2014, 98, pp.50-54. ⟨10.1016/j.sse.2014.04.013⟩

مصطلحات موضوعية: Electron mobility, Materials science, Silicon, Silicon on insulator, chemistry.chemical_element, 02 engineering and technology, Nitride, 01 natural sciences, law.invention, Stress (mechanics), Embedded, Strain transfer, law, 0103 physical sciences, Materials Chemistry, Wafer, Electrical and Electronic Engineering, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 010302 applied physics, business.industry, sSOI, Transistor, Electrical engineering, 021001 nanoscience & nanotechnology, Condensed Matter Physics, buried SiGe, FDSOI, Electronic, Optical and Magnetic Materials, chemistry, Booster (electric power), Optoelectronics, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a0599a31efd5a8f9876a21132aa9896d
https://hal.archives-ouvertes.fr/hal-01947618