المؤلفون: Sanjay Mehta, R. H. Kim, V. Basker, Sean D. Burns, Kangguo Cheng, Yu Zhu, A. Ebert, Scott Halle, Chen Jia, Karen Petrillo, Soon-Cheon Seo, D. Horak, Vamsi Paruchuri, R. Johnson, T. Levin, Hemanth Jagannathan, J. Faltermeier, Jason E. Cummings, T. Sparks, M. Raymond, Wilfried Haensch, Lahir Shaik Adam, Su Chen Fan, Amit Kumar, N. Berliner, Bala S. Haran, Terry A. Spooner, S. Kanakasabapathy, Stefan Schmitz, J. Kuss, Josephine B. Chang, Thomas S. Kanarsky, Lisa F. Edge, Chiew-seng Koay, Charles W. Koburger, John C. Arnold, S. Holmes, Bruce B. Doris, Erin Mclellan, D. LaTulipe, Martin Burkhardt, D. McHerron, S. Paparao, Donald F. Canaperi, M. Smalley, James J. Demarest, Matt Colburn

المصدر: 2008 IEEE International Electron Devices Meeting.

مصطلحات موضوعية: Materials science, business.industry, Annealing (metallurgy), Transistor, Copper interconnect, Electrical engineering, law.invention, chemistry.chemical_compound, chemistry, law, Logic gate, Silicide, Optoelectronics, Node (circuits), business, Metal gate, Immersion lithography

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3f2618a1a98015406797d8aa44d360c1
https://doi.org/10.1109/iedm.2008.4796769

المؤلفون: N. Sridhar, S. Paparao, J. Garvin, B. Metteer, J. Smith, Richard L. Guldi, T. Winter

المصدر: 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat No.99CH36314).

مصطلحات موضوعية: Problem resolution, Matching (statistics), Engineering, Development (topology), Critical area analysis, business.industry, Control system, Electronic engineering, Technology development, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::503682f71f05d3e372fda602a00b50a6
https://doi.org/10.1109/issm.1999.808756

المؤلفون: S. Paparao, J. Montgomery, J. Watts, T. Saeki, D. Catlett, Richard L. Guldi

المصدر: IEEE/SEMI 1998 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (Cat. No.98CH36168).

مصطلحات موضوعية: Engineering, Random access memory, business.industry, Yield (finance), Yield management, Technology development, Face detection, business, Dram, Reliability engineering, Technology management

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::005e6a47dce549563280cceb5f1ab83e
https://doi.org/10.1109/asmc.1998.731371

المؤلفون: Richard L. Guldi, N. Sridhar, J. Garvin, T. Winter, S. Paparao, B. Metteer, J. Smith

المصدر: 10th Annual IEEE/SEMI. Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings (Cat. No.99CH36295).

مصطلحات موضوعية: Reduction (complexity), Computer science, law, Electronic engineering, Integrated circuit, law.invention, Reliability engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1e9251536a6c4b34bb52205fa3d32da5
https://doi.org/10.1109/asmc.1999.798167

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

المؤلفون: Guldi, R., Winter, T., PapaRao, S., Smith, J., Sridhar, N., Garvin, J., Metteer, B.

المصدر: 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat No99CH36314); 1999, p135-138, 4p

المؤلفون: Janmenjoy Nayak, Ajith Abraham, B. Murali Krishna, G. T. Chandra Sekhar, Asit Kumar Das

نوع المادة: eBook.

الموضوعات: Pattern recognition systems--Congresses, Human-computer interaction--Congresses, Soft computing--Congresses, Data mining--Congresses, Evolutionary computation--Congresses

تصنيفات: COMPUTERS / Artificial Intelligence / General, COMPUTERS / Data Science / Data Analytics, COMPUTERS / Programming / Algorithms, MATHEMATICS / Probability & Statistics / General, TECHNOLOGY & ENGINEERING / Engineering (General)

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تسجيل الدخول للوصول الكامل.