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المؤلفون: Michael V. Aquilino, Brian W. Messenger, Paul D. Agnello, Oh Jung Kwon, Bhupesh Chandra, T. Tzou, T. Kirahata, Shreesh Narasimha, Daniel J. Poindexter, S.S. Iyer, Erik A. Nelson, William Y. Chang, Geng Wang, K. V. Hawkins, Jaeger Daniel, Gregory G. Freeman, S. Rombawa, Chengwen Pei, Rajendran Krishnasamy, W. Davies, Karen A. Nummy, James P. Norum, Paul C. Parries, Norman Robson, Jinping Liu, X. Wang, Rajeev Malik, Christopher D. Sheraw, X. Chen, Jeffrey B. Johnson, Xin Li, W. Kong, Ming Yin, N. Arnold, Edward P. Maciejewski, Katsunori Onishi
المصدر: 2014 IEEE International Electron Devices Meeting.
مصطلحات موضوعية: Dynamic random-access memory, Engineering, Bit cell, Hardware_MEMORYSTRUCTURES, business.industry, Silicon on insulator, eDRAM, Capacitance, law.invention, law, Embedded system, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, IBM, business, Scaling, Dram
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::66ec91f5b274f3f393e4cdb66ce3356c
https://doi.org/10.1109/iedm.2014.7047083 -
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المؤلفون: Herbert L. Ho, Jinping Liu, Paul C. Parries, Norman Robson, Jing Li, Puneet Goyal, S.S. Iyer, Ming Yin, Babar A. Khan, Zhengwen Li, Paul D. Agnello, K. V. Hawkins, Sunfei Fang, T. Weaver, Scott R. Stiffler, Kevin McStay, Rishikesh Krishnan, W. Davies, R. Takalkar, T. Kirihata, Sami Rosenblatt, S. Galis, A. Blauberg, Shreesh Narasimha, Michael P. Chudzik, Amanda L. Tessier, William K. Henson, W. Kong, Edward P. Maciejewski, Alberto Cestero, Nauman Zafar Butt, Joseph Ervin, S. Gupta, Jeyaraj Antony Johnson, S. Rombawa, Sungjae Lee, J. Barth, Ying Zhang
المصدر: 2010 International Electron Devices Meeting.
مصطلحات موضوعية: Engineering, business.industry, Transistor, Silicon on insulator, eDRAM, law.invention, Threshold voltage, Capacitor, Hardware_GENERAL, law, Logic gate, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, business, Metal gate, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::324242387bfae4ae688888a5d8ad886a
https://doi.org/10.1109/iedm.2010.5703434 -
3مؤتمر
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
4مؤتمر
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.