-
1
المؤلفون: Robert P. Devaty, Wolfgang J. Choyke, J. Devrajan, M. Yoganathan, Andrew J. Steckl, S. W. Novak
المصدر: Journal of Electronic Materials. 25:869-873
مصطلحات موضوعية: Photoluminescence, Materials science, Solid-state physics, Annealing (metallurgy), Analytical chemistry, chemistry.chemical_element, Condensed Matter Physics, Thermal diffusivity, Electronic, Optical and Magnetic Materials, Ion, Secondary ion mass spectrometry, Erbium, Ion implantation, chemistry, Materials Chemistry, Electrical and Electronic Engineering
-
2
المؤلفون: R. G. Wilson, S. W. Novak
المصدر: Journal of Applied Physics. 69:466-474
مصطلحات موضوعية: Solid-state physics, Chemistry, business.industry, Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, Mass spectrometry, Metal, Secondary ion mass spectrometry, Semiconductor, Ion implantation, visual_art, Caesium, visual_art.visual_art_medium, Ionization energy, Atomic physics, Nuclear Experiment, business
-
3
المؤلفون: R. G. Wilson, S. W. Novak
المصدر: Journal of Applied Physics. 69:463-465
مصطلحات موضوعية: Secondary ion mass spectrometry, Ion beam deposition, Ion implantation, Ion beam, Physics::Plasma Physics, Chemistry, Analytical chemistry, General Physics and Astronomy, Physics::Chemical Physics, Fast atom bombardment, Mass spectrometry, Ion source, Ion
-
4
المؤلفون: Igor L. Kuskovsky, Q. Zhang, Ildar Salakhutdinov, Uttam Manna, Gertrude F. Neumark, Kathleen Dunn, Ismail C. Noyan, S. W. Novak, Richard Moug, Maria C. Tamargo
المصدر: Journal of Applied Physics. 111:033516
مصطلحات موضوعية: Diffraction, Materials science, Condensed matter physics, business.industry, Scattering, Band gap, Superlattice, General Physics and Astronomy, Condensed Matter::Materials Science, Semiconductor, Transmission electron microscopy, Quantum dot, business, Molecular beam epitaxy
-
5
المؤلفون: J. M. Zavada, H. C. Casey, Chang-Ho Chen, R. J. States, A. Loni, S. W. Novak
المصدر: OSA Annual Meeting.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e0e67ad4ec31506f16ad63619379de4d
https://doi.org/10.1364/oam.1993.wo.3 -
6
المؤلفون: Ahn Goo Choo, Andrew J. Steckl, R. M. Kolbas, A. Ezis, P. P. Pronko, Howard E. Jackson, S. W. Novak, P. Chen, Joseph T. Boyd
المصدر: MRS Proceedings. 281
مصطلحات موضوعية: Photoluminescence, Fabrication, Materials science, business.industry, Superlattice, Vacancy defect, Diffusion, Optoelectronics, Grating, business, Crystallographic defect, Ion
-
7
المؤلفون: S. w. Novak, R . G. Wilson
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Secondary ion mass spectrometry, chemistry.chemical_compound, Chemical species, Materials science, Silicon, chemistry, Annealing (metallurgy), Analytical chemistry, chemistry.chemical_element, Beryllium, Mass spectrometry, Ion, Gallium arsenide
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3ee44b39e3bcbea0e3e73893db16c7dd
https://doi.org/10.1117/12.941045