المؤلفون: Jacques Ferré, J.P. Jamet, Antonio Ruotolo, S. Wiebel, D Pullini, Nicolas Vernier, Jacques Gierak

المصدر: Nanotechnology. 17:3308-3312

مصطلحات موضوعية: Materials science, Ion beam, Scanning electron microscope, Mechanical Engineering, Scanning confocal electron microscopy, Bioengineering, Nanotechnology, General Chemistry, Focused ion beam, law.invention, Optical microscope, Mechanics of Materials, law, Microscopy, General Materials Science, Electrical and Electronic Engineering, Thin film, Electron beam-induced deposition

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f1c8b899d8a148856e4716a83c136827
https://doi.org/10.1088/0957-4484/17/13/038

المؤلفون: Nicolas Vernier, Alexandra Mougin, J.P. Jamet, B. Rodmacq, B. Dieny, Vincent Baltz, Jacques Ferré, S. Wiebel

المساهمون: Laboratoire de Physique des Solides (LPS), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS), SPINtronique et TEchnologie des Composants (SPINTEC), Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)

المصدر: Applied Physics Letters
Applied Physics Letters, American Institute of Physics, 2005, 86, pp.142502. ⟨10.1063/1.1897845⟩
Applied Physics Letters, 2005, 86, pp.142502. ⟨10.1063/1.1897845⟩

مصطلحات موضوعية: Kerr effect, Materials science, Physics and Astronomy (miscellaneous), Magnetic domain, Condensed matter physics, Demagnetizing field, 02 engineering and technology, 021001 nanoscience & nanotechnology, Magnetic hysteresis, 01 natural sciences, Magnetic susceptibility, Magnetic anisotropy, Ferromagnetism, 0103 physical sciences, Physics::Atomic Physics, Single domain, [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat], 010306 general physics, 0210 nano-technology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f8ccb38765822cdfaa46bb7b655bde62
https://hal.archives-ouvertes.fr/hal-01683694

المؤلفون: Vincent Baltz, Nicolas Vernier, Alexandra Mougin, Bernard Rodmacq, Bernard Dieny, S. Wiebel, J.-P. Jamet, Jacques Ferré

المساهمون: Laboratoire de Physique des Solides (LPS), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS), SPINtronique et TEchnologie des Composants (SPINTEC), Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)

المصدر: Journal of Applied Physics
Journal of Applied Physics, 2006, 100, pp.043912. ⟨10.1063/1.2227481⟩
Journal of Applied Physics, American Institute of Physics, 2006, 100, pp.043912. ⟨10.1063/1.2227481⟩

مصطلحات موضوعية: Condensed Matter - Materials Science, Materials science, Magnetic domain, Field (physics), Condensed matter physics, Materials Science (cond-mat.mtrl-sci), FOS: Physical sciences, General Physics and Astronomy, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Magnetic field, Magnetization, Domain wall (magnetism), Ferromagnetism, 0103 physical sciences, Domain (ring theory), Time domain, [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat], 010306 general physics, 0210 nano-technology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::91a917e6b026eb4ffb6b874945ef0772
https://doi.org/10.1063/1.2227481

المؤلفون: A Ruotolo, S Wiebel, J P Jamet, N Vernier, D Pullini, J Gierak, J Ferr

المصدر: Nanotechnology; Jul2006, Vol. 17 Issue 13, p3308-3312, 5p

مصطلحات موضوعية: FOCUSED ion beams, GALLIUM, SCANNING electron microscopy, IRRADIATION

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