يعرض 1 - 10 نتائج من 214 نتيجة بحث عن '"SEM microscopy"', وقت الاستعلام: 0.96s تنقيح النتائج
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    دورية أكاديمية

    المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 41(6):1730-1743 Jun, 2022

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    مؤتمر

    المصدر: 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2021 IEEE International Symposium on the. :1-12 Sep, 2021

    Relation: 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

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    مؤتمر

    المصدر: 2017 30th International Vacuum Nanoelectronics Conference (IVNC) Vacuum Nanoelectronics Conference (IVNC), 2017 30th International. :16-17 Jul, 2017

    Relation: 2017 30th International Vacuum Nanoelectronics Conference (IVNC)

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    كتاب إلكتروني

    المساهمون: van den Berg, Klaas Jan, Series EditorAff1, Burnstock, Aviva, Series EditorAff2, Janssens, Koen, Series EditorAff3, van Langh, Robert, Series EditorAff4, Mass, Jennifer, Series EditorAff5, Nevin, Austin, Series EditorAff6, Aff10, Lavedrine, Bertrand, Series EditorAff7, Ormsby, Bronwyn, Series EditorAff8, Strlic, Matija, Series EditorAff9, Sawicki, Malgorzata, editorAff11

    المصدر: Heritage Wood : Investigation and Conservation of Art on Wood. :79-92

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    دورية أكاديمية

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