المؤلفون: Fu, Bianzhu, Gribelyuk, Michael A.

المصدر: Journal of Applied Physics; 2018, Vol. 123 Issue 16, pN.PAG-N.PAG, 6p, 1 Color Photograph, 2 Diagrams, 2 Graphs

مصطلحات موضوعية: SEMICONDUCTOR devices, THREE-dimensional imaging, SEMICONDUCTOR failures, SCANNING transmission electron microscopy, ATOMIC number, ENERGY dispersive X-ray spectroscopy

المؤلفون: Haskins, Richard W., Maier, Robert S., Ebeling, Robert M., Marsh, Charles P., Majure, Dustin L., Bednar, Anthony J., Welch, Charles R., Barker, Bruce C., Wu, David T.

المصدر: Journal of Chemical Physics; 8/21/2007, Vol. 127 Issue 7, p074708, 10p, 4 Diagrams, 2 Charts, 4 Graphs

مصطلحات موضوعية: MOLECULAR dynamics, CARBON nanotubes, MODULI theory, SEMICONDUCTOR failures, NANOTUBES

المؤلفون: Tian, Naiyu, Ouyang, Dantong, Song, Jincai, Zhang, Liming

المصدر: Electronics Letters (Wiley-Blackwell); Jul2021, Vol. 57 Issue 15, p597-599, 3p

مصطلحات موضوعية: FAULT tolerance (Engineering), SEMICONDUCTOR failures, INTEGRATED circuit failures, INTEGRATED circuit fault tolerance, SEMICONDUCTORS

المؤلفون: Liu, Binghai, Dong, Zhi Li, Hua, Younan, Fu, Chao, Li, Xiaomin, Tan, Pik Kee, Zhao, Yuzhe

المصدر: AIP Advances; Nov2018, Vol. 8 Issue 11, pN.PAG-N.PAG, 11p

مصطلحات موضوعية: SILICON nitride, ELECTRON beams, SEMICONDUCTOR failures

المؤلفون: Chang, Tzong-Sheng, Wang, Wen-Chun, Wang, Lih-Ping, Hwang, Jenn-Chang, Huang, Fon-Shan

المصدر: Journal of Applied Physics; 6/15/1994, Vol. 75 Issue 12, p7847, 5p, 2 Black and White Photographs, 3 Charts, 1 Graph

مصطلحات موضوعية: TITANIUM, NITROGEN, COPPER, SILICON, SEMICONDUCTOR failures

المؤلفون: Zou, Chen-Xia, Xu, Jun, Zhang, Xin-Zheng, Song, Xue-Feng, Yu, Da-Peng

المصدر: Journal of Applied Physics; Jun2009, Vol. 105 Issue 12, p126102-1-126102-3, 3p, 2 Diagrams, 3 Graphs

مصطلحات موضوعية: ELECTRODIFFUSION, TITANIUM, NANOWIRES, VERY large scale circuit integration, SEMICONDUCTOR failures

المؤلفون: Abdelazim Mellik, Tamer, Painter, Frederick D, Shipp, David D., Dionise, Thomas J.

المصدر: IEEE Transactions on Industry Applications; Jul/Aug2018, Vol. 54 Issue 4, p3991-4000, 10p

مصطلحات موضوعية: ELECTRIC power systems, ELECTRIC power distribution grids, ELECTRIC potential, POWER transformers, SWITCHING power supplies, SEMICONDUCTOR failures, COMPUTER simulation

المؤلفون: Bongtae Han, Dae-Suk Kim

المصدر: Journal of Electronic Packaging; Mar2017, Vol. 139 Issue 1, p010802-1-010802-11, 11p

مصطلحات موضوعية: ELECTRONIC packaging, MOISTURE, SEMICONDUCTOR analysis, ELECTRIC properties of semiconductors, SEMICONDUCTOR failures, PREDICTION models, LITERATURE reviews

المؤلفون: Srivastava, Amit, Nguyen, Hoang, Herrmann, Thomas, Kirsch, Remo, Kini, Rajeev M.

المصدر: IEEE Transactions on Semiconductor Manufacturing; Nov2016, Vol. 29 Issue 4, p299-305, 7p

مصطلحات موضوعية: SEMICONDUCTOR device manufacturing, SURFACE defects, SEMICONDUCTOR failures, APPLICATION program interfaces, INTEGRATED circuits

المؤلفون: STOYANOV, MIROSLAV, WEBSTER, CLAYTON

المصدر: SIAM Journal on Scientific Computing; 2015, Vol. 37 Issue 5, pC532-C553, 22p

مصطلحات موضوعية: ITERATIVE methods (Mathematics), FIXED point theory, COMPUTER system failures, FAULT-tolerant computing, SEMICONDUCTOR failures, NUMERICAL solutions to differential equations