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1دورية أكاديمية
المؤلفون: Yves Fleming, Tom Wirtz
المصدر: Beilstein Journal of Nanotechnology, Vol 6, Iss 1, Pp 1091-1099 (2015)
مصطلحات موضوعية: alloy, atomic force microscopy (AFM), correlative microscopy, differential sputtering, in situ, multimodal imaging, nano-cluster, polymer blend, secondary ion mass spectrometry (SIMS), scanning probe microscopy (SPM), SIMS artefacts, sputter-induced effects, sputter rate, Technology, Chemical technology, TP1-1185, Science, Physics, QC1-999
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2190-4286
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2
المؤلفون: Tom Wirtz, Yves Fleming
المصدر: Beilstein Journal of Nanotechnology
Beilstein Journal of Nanotechnology, Vol 6, Iss 1, Pp 1091-1099 (2015)مصطلحات موضوعية: Materials science, sputter-induced effects, Analytical chemistry, General Physics and Astronomy, multimodal imaging, lcsh:Chemical technology, lcsh:Technology, Full Research Paper, Nanoclusters, scanning probe microscopy (SPM), SIMS artefacts, Scanning probe microscopy, chemistry.chemical_compound, secondary ion mass spectrometry (SIMS), Sputtering, alloy, Nanotechnology, General Materials Science, lcsh:TP1-1185, atomic force microscopy (AFM), differential sputtering, correlative microscopy, Electrical and Electronic Engineering, sputter rate, lcsh:Science, chemistry.chemical_classification, lcsh:T, in situ, Polymer, Cermet, polymer blend, lcsh:QC1-999, Secondary ion mass spectrometry, nano-cluster, Nanoscience, chemistry, lcsh:Q, Polymer blend, Polystyrene, lcsh:Physics
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3دورية أكاديمية
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