يعرض 1 - 10 نتائج من 76,999 نتيجة بحث عن '"SLURRY"', وقت الاستعلام: 3.01s تنقيح النتائج
  1. 1
    مؤتمر
    Investigation of improving the uniformity of Cu dishing depth in Cu-SiO2 chemical mechanical polishing

    المؤلفون: Liu, Yuiia, Xiao, Kelaiti, Zhang, Kai, Zhang, Jin, Liu, Daoxiang

    المصدر: 2024 25th International Conference on Electronic Packaging Technology (ICEPT) Electronic Packaging Technology (ICEPT), 2024 25th International Conference on. :01-04 Aug, 2024

    Relation: 2024 25th International Conference on Electronic Packaging Technology (ICEPT)

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  2. 2
    مؤتمر
    Simulation analysis of erosion characteristics of slurry pipelines based on CFD-DDPM pipeline parameters

    المؤلفون: Yuan, Haoran, Wu, Jiande, Xiong, Xin

    المصدر: 2024 43rd Chinese Control Conference (CCC) Chinese Control Conference (CCC), 2024 43rd. :7086-7092 Jul, 2024

    Relation: 2024 43rd Chinese Control Conference (CCC)

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  3. 3
    مؤتمر
    Reducing Phase Decoupling Errors of Coriolis Flowmeters for Slurry Flow Measurement Through Analytical Modelling

    المؤلفون: Chowdhury, Wasif Shafaet, Yan, Yong, Coster-Chevalier, Marc-Antony, Liu, Jinyu

    المصدر: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2024 IEEE International. :1-5 May, 2024

    Relation: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

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  4. 4
    مؤتمر
    Dynamic Modeling of Wet FGD Process Using PACF-GRU-AM Based Method

    المؤلفون: Liu, Quanbo, Li, Xiaoli, Wang, Kang

    المصدر: 2024 IEEE 13th Data Driven Control and Learning Systems Conference (DDCLS) Data Driven Control and Learning Systems Conference (DDCLS), 2024 IEEE 13th. :643-648 May, 2024

    Relation: 2024 IEEE 13th Data Driven Control and Learning Systems Conference (DDCLS)

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  5. 5
    دورية أكاديمية
    Generalized Walsh Transform Sequency-Domain-Based Match Filtering for Electromagnetic Flowmeter Signal Measurement

    المؤلفون: Li, B., Zhang, S., Chen, J.

    المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 24(7):10203-10220 Apr, 2024

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  6. 6
    مؤتمر
    ILD-CMP Wafer Edge Thickness Profile Stability Improvement via Acid Silicon Oxide Slurry Formulation Design

    المؤلفون: Zhang, ZhiJie, Liang, Zhiyang, Wang, HongDi, Tian, Liang

    المصدر: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC) Science and Technology for Integrated Circuits (CSTIC), 2024 Conference of. :1-5 Mar, 2024

    Relation: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC)

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  7. 7
    مؤتمر
    CEO2 Slurry Post Rinse Condition Research in STI CMP Technology

    المؤلفون: Zhang, ZhiJie, Li, ZhengYi, Wang, HongDi, Li, Jian

    المصدر: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC) Science and Technology for Integrated Circuits (CSTIC), 2024 Conference of. :1-4 Mar, 2024

    Relation: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC)

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  8. 8
    مؤتمر
    Effect of Surfactants on CMP Properties of C-, A- and R-Plane Sapphire

    المؤلفون: Li, Xinjie, Niu, Xinhuan, Qu, Minghui, He, Chao, Dong, Changxin

    المصدر: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC) Science and Technology for Integrated Circuits (CSTIC), 2024 Conference of. :1-3 Mar, 2024

    Relation: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC)

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  9. 9
    دورية أكاديمية
    On-Line Measurement of Iron Grade in Iron Ore Slurry by LIBS Technique Combined With Gaussian Process Regression

    المؤلفون: Zhang, Q., Sun, L., Chen, T., Qi, L., Zeng, P.

    المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 73:1-8 2024

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  10. 10
    دورية أكاديمية
    Mass Flowrate Measurement of Slurry Using Coriolis Flowmeters and Data Driven Modeling

    المؤلفون: Chowdhury, W.S., Yan, Y., Coster-Chevalier, M., Liu, J.

    المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 73:1-12 2024

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