المؤلفون: Majumdar, A., Sun, Y., Cheng, C., Kim, Y., Rana, U., Martin, R.M., Bruce, R.L., Shiu, K., Zhu, Y., Farmer, D.B., Hopstaken, M., Joseph, E.A., de Souza, J.P., Frank, M.M., Cheng, S., Kobayashi, M., Duch, E.A., Sadana, D.K., Park, D., Leobandung, E.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 61(10):3399-3404 Oct, 2014

المؤلفون: Pelloie, J.L., Sadana, D.K., Hovel, H.J., Shahidi, G.G., Warnock, J., Sun, J.Y.-C., Davari, B.

المصدر: Proceedings of 1994 IEEE International Electron Devices Meeting Electron devices Electron Devices Meeting, 1994. IEDM '94. Technical Digest., International. :653-656 1994

Relation: Proceedings of 1994 IEEE International Electron Devices Meeting

المؤلفون: Sadana, D.K., Acovic, A., Shahidi, G., Hanafi, H., Warren, A.C., Grutzmacher, D., Cardone, F., Sun, J., Davari, B.

المصدر: 1992 International Technical Digest on Electron Devices Meeting Electron Devices Meeting, 1992. IEDM '92. Technical Digest., International. :849-852 1992

Relation: Proceedings of IEEE International Electron Devices Meeting

المؤلفون: Hamaguchi, M., Yin, H., Saenger, K. L., Sung, C. Y., Hasumi, R., Iijima, R., Ohuchi, K., Takasu, Y., Ott, J. A., Kang, H., Biscardi, M., Li, J., Domenicucci, A. G., Zhu, Z., Ronsheim, P., Zhang, R., Rovedo, N., Utomo, H., Fogel, K., de Souza, J.P., Sadana, D.K., Takayanagi, M., Park, D., Shahidi, G., Ishimaru, K.

المصدر: 2008 Symposium on VLSI Technology VLSI Technology, 2008 Symposium on. :178-179 Jun, 2008

Relation: 2008 Symposium on VLSI Technology

المؤلفون: Yin, Haizhou, Hamaguchi, M., Saenger, K.L., Sung, C.Y., Hasumi, R., Ohuchi, K., Zhang, R., Cai, J., Ott, J.A., Chen, X., Luo, Z.J., Rovedo, N., Fogel, K., Pfeiffer, G., Kleinhenz, R., Sadana, D.K., Takayanagi, M., Ishimaru, K., Ning, T.H., Park, D.-G., Shahidi, G.

المصدر: 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) VLSI Technology, Systems and Applications, 2008. VLSI-TSA 2008. International Symposium on. :34-35 Apr, 2008

Relation: 2008 International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA)

المؤلفون: Yin, H., Sung, C.Y., Saenger, K.L., Hamaguchi, M., Hasumi, R., Ohuchi, K., Ng, H., Zhang, R., Stein, K.J., Wallner, T.A., Li, J., Ott, J.A., Chen, X., Luo, Z.J., Rovedo, N., Fogel, K., Pfeiffer, G., Kleinhenz, R., Bendernagel, R., Sadana, D.K., Takayanagi, M., Ishimaru, K., Crowder, S.W., Park, D., Khare, M., Shahidi, G.

المصدر: 2007 IEEE Symposium on VLSI Technology VLSI Technology, 2007 IEEE Symposium on. :222-223 Jun, 2007

Relation: 2007 IEEE Symposium on VLSI Technology

المؤلفون: Yin, Haizhou, Sung, C. Y., Ng, H., Saenger, K.L., Chan, V., Crowder, S., Zhang, R., Li, J., Ott, J. A., Pfeiffer, G., Bendernagel, R., Ko, S.B., Ren, Z., Chen, X., Wang, G., Liu, J., Cheng, K., Mesfin, A., Kelly, R., Ku, V., Luo, Z.J., Rovedo, N., Fogel, K., Sadana, D.K., Khare, M., Shahidi, G.

المصدر: 2006 International Electron Devices Meeting Electron Devices Meeting, 2006. IEDM '06. International. :1-4 Dec, 2006

Relation: 2006 International Electron Devices Meeting

المؤلفون: Koester, S.J., Kiewra, E.W., Yanning Sun, Neumayer, D.A., Ott, J.A., Sadana, D.K., Webb, D.J., Fompeyrine, J., Locquet, J.-P., Sousa, M., Germann, R.

المصدر: 2006 64th Device Research Conference Device Research Conference, 2006 64th. :43-44 Jun, 2006

Relation: 2006 64th Device Research Conference

المؤلفون: Yanning Sun, Koester, S.J., Kiewra, E.W., Fogel, K.E., Sadana, D.K., Webb, D.J., Fompeyrine, J., Locquet, J.-P., Sousa, M., Germann, R.

المصدر: 2006 64th Device Research Conference Device Research Conference, 2006 64th. :49-50 Jun, 2006

Relation: 2006 64th Device Research Conference

المؤلفون: Chen, B.A., Yapsir, A.S., Wu, S., Schulz, R., Yee, D.S., Sadana, D.K., Hovel, H.J., Ning, T.H., Shahidi, G., Davari, B.

المصدر: Proceedings of 4th International Conference on Solid-State and IC Technology Solid-state and integrated circuit technology Solid-State and Integrated Circuit Technology, 1995 4th International Conference on. :260-262 1995

Relation: Proceedings of 4th International Conference on Solid-State and IC Technology