المؤلفون: Sagong, Hyun Chul, Choi, Kihyun, Jiang, Hai, Park, Junekyun, Rhee, Hwasung, Pae, Sangwoo

المصدر: 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2020 4th IEEE. :1-4 Apr, 2020

Relation: 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

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المؤلفون: Choi, Kihyun, Sagong, Hyun Chul, Jin, Minjung, Hai, Jiang, Lee, Miji, Jeong, Taeyoung, Yeo, Myung Soo, Shim, Hyewon, Ahn, Da, Kim, Wooyeon, Kim, Yongjeung, Park, JuneKyun, Rhee, Hwasung, Lee, Euncheol

المصدر: 2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :9.3.1-9.3.4 Dec, 2020

Relation: 2020 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Choi, Kihyun, Sagong, Hyun Chul, Kang, Wonchang, Kim, Hyunjin, Hai, Jiang, Lee, Miji, Kim, Bomi, Lee, Mi-ji, Lee, Soonyoung, Shim, Hyewon, Park, Junekyun, Cho, Youngwoo, Rhee, Hwasung, Pae, Sangwoo

المصدر: 2019 Symposium on VLSI Technology VLSI Technology, 2019 Symposium on. :T16-T17 Jun, 2019

Relation: 2019 Symposium on VLSI Technology

المؤلفون: Sagong, Hyun Chul, Kang, Chang Yong, Sohn, Chang-Woo, Jeong, Eui-Young, Choi, Do-Young, Lee, Sang-Hyun, Kim, Ye-Ram, Jang, Jun-Woo, Jeong, Yoon-Ha

المصدر: 2012 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report (IRW), 2012 IEEE International. :171-174 Oct, 2012

Relation: 2012 IEEE International Integrated Reliability Workshop (IIRW)

المؤلفون: Sohn, Chang-Woo, Jeong, Eui-Young, Sagong, Hyun Chul, Choi, Do-Young, Park, Min Sang, Kang, Chang Yong, Chung, Jinyong, Jeong, Yoon-Ha

المصدر: 2010 IEEE Nanotechnology Materials and Devices Conference Nanotechnology Materials and Devices Conference (NMDC), 2010 IEEE. :291-294 Oct, 2010

Relation: 2010 IEEE Nanotechnology Materials and Devices Conference (NMDC)

المؤلفون: Baek, Rock-Hyun, Choi, Hyun-Sik, Sagong, Hyun Chul, Lee, Sang-Hyun, Choi, Gil-Bok, Song, Seung Hyun, Park, Chan-Hoon, Lee, Jeong-Soo, Jeong, Yoon-Ha, Baek, Chang-Ki, Kim, Dae Mann, Yeoh, Yun Young, Yeo, Kyoung Hwan, Kim, Dong-Won, Kim, Kinam

المصدر: 2010 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2010 IEEE International. :94-98 May, 2010

Relation: 2010 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Sagong, Hyun Chul, Kim, Hyunjin, Choo, Seungjin, Yoon, Sungyoung, Shim, Hyewon, Ha, Sangsu, Jeong, Tae-Young, Choe, Minhyeok, Park, Junekyun, Shin, Sangchul, Pae, Sangwoo

المصدر: 2018 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2018 IEEE International. :6F.5-1-6F.5-4 Mar, 2018

Relation: 2018 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Uemura, Taiki, Lee, Soonyoung, Min, Dahye, Moon, Ihlhwa, Lim, Jungman, Lee, Seungbae, Sagong, Hyun Chul, Pae, Sangwoo

المصدر: 2018 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2018 IEEE International. :P-SE.1-1-P-SE.1-4 Mar, 2018

Relation: 2018 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Liu, Changze, Jin, Minjung, Uemura, Taiki, Kim, Jinju, Kim, Jungin, Jung, Ukjin, Sagong, Hyun Chul, Kim, Gunrae, Park, Junekyun, Shin, Sangchul, Pae, Sangwoo

المصدر: 2017 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS),2017 IEEE International. :XT-2.1-XT-2.4 Apr, 2017

Relation: 2017 IEEE International Reliability Physics Symposium (IRPS)