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1دورية أكاديمية
المؤلفون: VijetaAff1, Aff2, Manchalwar, Naval, Saha, Shibu, Jaiswal, V. K., Sharma, ParagAff1, Aff2, IDs12596023012993_cor5
المصدر: Journal of Optics. 53(2):968-979
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2كتاب إلكتروني
المؤلفون: VijetaAff16, Aff17, Saha, ShibuAff16, Jaiswal, V. K.Aff16, Sharma, ParagAff16, Aff17
المساهمون: Chaari, Fakher, Series EditorAff1, Gherardini, Francesco, Series EditorAff2, Ivanov, Vitalii, Series EditorAff3, Haddar, Mohamed, Series EditorAff4, Cavas-Martínez, Francisco, Editorial Board MemberAff5, di Mare, Francesca, Editorial Board MemberAff6, Kwon, Young W., Editorial Board MemberAff7, Trojanowska, Justyna, Editorial Board MemberAff8, Xu, Jinyang, Editorial Board MemberAff9, Yadav, Sanjay, editorAff10, Garg, Naveen, editorAff11, Aggarwal, Shankar G., editorAff12, Jaiswal, Shiv Kumar, editorAff13, Kumar, Harish, editorAff14, Achanta, Venu Gopal, editorAff15
المصدر: Recent Advances in Metrology : Select Proceedings of AdMet 2022. :191-197
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3كتاب إلكتروني
المؤلفون: VijetaAff16, Aff17, Dwivedi, RajeevAff16, Aff18, Saha, ShibuAff16, Jaiswal, V. K.Aff16, Sharma, ParagAff16, Aff17
المساهمون: Chaari, Fakher, Series EditorAff1, Gherardini, Francesco, Series EditorAff2, Ivanov, Vitalii, Series EditorAff3, Haddar, Mohamed, Series EditorAff4, Cavas-Martínez, Francisco, Editorial Board MemberAff5, di Mare, Francesca, Editorial Board MemberAff6, Kwon, Young W., Editorial Board MemberAff7, Trojanowska, Justyna, Editorial Board MemberAff8, Xu, Jinyang, Editorial Board MemberAff9, Yadav, Sanjay, editorAff10, Garg, Naveen, editorAff11, Aggarwal, Shankar G., editorAff12, Jaiswal, Shiv Kumar, editorAff13, Kumar, Harish, editorAff14, Achanta, Venu Gopal, editorAff15
المصدر: Recent Advances in Metrology : Select Proceedings of AdMet 2022. :179-190
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4دورية أكاديمية
المؤلفون: VijetaAff1, Aff2, Manchalwar, Naval, Saha, Shibu, Jaiswal, V. K., Sharma, ParagAff1, Aff2, IDs12596023014242_cor5
المصدر: Journal of Optics. 53(2):980-980
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5كتاب إلكتروني
المؤلفون: Saha, ShibuAff6, Aff7, Jangra, VijetaAff8, Aff7, Jaiswal, V. K.Aff6, Aff7, Sharma, ParagAff6, Aff7, Zafer, Afaqul, Section editorAff9, Rab, Shanay, Section editorAff10, Wan, Meher, Section editorAff11, Yadav, Sanjay, Section editorAff12, Aff13
المساهمون: Aswal, Dinesh K., editorAff1, Yadav, Sanjay, editorAff2, Takatsuji, Toshiyuki, editorAff3, Rachakonda, Prem, editorAff4, Kumar, Harish, editorAff5
المصدر: Handbook of Metrology and Applications. :269-298
Degree: M.Tech
PhD -
6كتاب إلكتروني
المؤلفون: Gangwar, SwatiAff43, Aff44, Dwivedi, RajeevAff43, Aff45, Saha, ShibuAff43, Aff44, Mehrotra, RanjanaAff44, Jaiswal, V. K.Aff44, Sharma, ParagAff44
المساهمون: Angrisani, Leopoldo, Series EditorAff1, Arteaga, Marco, Series EditorAff2, Panigrahi, Bijaya Ketan, Series EditorAff3, Chakraborty, Samarjit, Series EditorAff4, Chen, Jiming, Series EditorAff5, Chen, Shanben, Series EditorAff6, Chen, Tan Kay, Series EditorAff7, Dillmann, Rüdiger, Series EditorAff8, Duan, Haibin, Series EditorAff9, Ferrari, Gianluigi, Series EditorAff10, Ferre, Manuel, Series EditorAff11, Hirche, Sandra, Series EditorAff12, Jabbari, Faryar, Series EditorAff13, Jia, Limin, Series EditorAff14, Kacprzyk, Janusz, Series EditorAff15, Khamis, Alaa, Series EditorAff16, Kroeger, Torsten, Series EditorAff17, Li, Yong, Series EditorAff18, Liang, Qilian, Series EditorAff19, Martín, Ferran, Series EditorAff20, Ming, Tan Cher, Series EditorAff21, Minker, Wolfgang, Series EditorAff22, Misra, Pradeep, Series EditorAff23, Möller, Sebastian, Series EditorAff24, Mukhopadhyay, Subhas, Series EditorAff25, Ning, Cun-Zheng, Series EditorAff26, Nishida, Toyoaki, Series EditorAff27, Oneto, Luca, Series EditorAff28, Pascucci, Federica, Series EditorAff29, Qin, Yong, Series EditorAff30, Seng, Gan Woon, Series EditorAff31, Speidel, Joachim, Series EditorAff32, Veiga, Germano, Series EditorAff33, Wu, Haitao, Series EditorAff34, Zamboni, Walter, Series EditorAff35, Zhang, Junjie James, Series EditorAff36, Yadav, Sanjay, editorAff37, Chaudhary, K.P., editorAff38, Gahlot, Ajay, editorAff39, Arya, Yogendra, editorAff40, Dahiya, Aman, editorAff41, Garg, Naveen, editorAff42
المصدر: Recent Advances in Metrology : Select Proceedings of AdMet 2021. 906:167-175
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7دورية أكاديمية
المؤلفون: VijetaAff1, Aff2, Manchalwar, Naval, Saha, Shibu, Jaiswal, V. K., Sharma, ParagAff1, Aff2, IDs1264702300661x_cor5
المصدر: MAPAN: Journal of Metrology Society of India. :1-12
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8دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
9دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
10دورية أكاديمية
المؤلفون: Sharma, ParagAff1, Aff2, IDs12647021005270_cor1, Jaiswal, V. K.Aff1, Aff2, Saha, ShibuAff1, Aff2, Aswal, D. K.Aff1, Aff2
المصدر: MAPAN: Journal of Metrology Society of India. 37(2):237-249