المؤلفون: Luthra, Sunidhi^{Aff1, IDs12647024007354_cor1}, Kumari, Swati, Sahu, Archana, Khatkar, Avni, Pal, Bijendra, Ahmad, Saood

المصدر: MAPAN: Journal of Metrology Society of India. 39(3):731-737

المؤلفون: Sahu, Archana, Jambhale, Ravi, Adiga, Deepa Tavargeri, Powar, Nilesh, Mckinley, Thomas

المصدر: 2023 IEEE Aerospace Conference Aerospace Conference, 2023 IEEE. :1-11 Mar, 2023

Relation: 2023 IEEE Aerospace Conference

المؤلفون: Khatkar, Avni^{Aff1, IDs12647023006853_cor1}, Sahu, Archana, Kumari, Swati, Luthra, Sunidhi, Ahmad, Saood

المصدر: MAPAN: Journal of Metrology Society of India. 39(2):463-473

المؤلفون: Kumari, Swati^Aff43, Luthra, Sunidhi^Aff43, Sahu, Archana^Aff43, Ahmad, Saood^Aff43, Gupta, Anurag^Aff43

المساهمون: Angrisani, Leopoldo, Series Editor^Aff1, Arteaga, Marco, Series Editor^Aff2, Panigrahi, Bijaya Ketan, Series Editor^Aff3, Chakraborty, Samarjit, Series Editor^Aff4, Chen, Jiming, Series Editor^Aff5, Chen, Shanben, Series Editor^Aff6, Chen, Tan Kay, Series Editor^Aff7, Dillmann, Rüdiger, Series Editor^Aff8, Duan, Haibin, Series Editor^Aff9, Ferrari, Gianluigi, Series Editor^Aff10, Ferre, Manuel, Series Editor^Aff11, Hirche, Sandra, Series Editor^Aff12, Jabbari, Faryar, Series Editor^Aff13, Jia, Limin, Series Editor^Aff14, Kacprzyk, Janusz, Series Editor^Aff15, Khamis, Alaa, Series Editor^Aff16, Kroeger, Torsten, Series Editor^Aff17, Li, Yong, Series Editor^Aff18, Liang, Qilian, Series Editor^Aff19, Martín, Ferran, Series Editor^Aff20, Ming, Tan Cher, Series Editor^Aff21, Minker, Wolfgang, Series Editor^Aff22, Misra, Pradeep, Series Editor^Aff23, Möller, Sebastian, Series Editor^Aff24, Mukhopadhyay, Subhas, Series Editor^Aff25, Ning, Cun-Zheng, Series Editor^Aff26, Nishida, Toyoaki, Series Editor^Aff27, Oneto, Luca, Series Editor^Aff28, Pascucci, Federica, Series Editor^Aff29, Qin, Yong, Series Editor^Aff30, Seng, Gan Woon, Series Editor^Aff31, Speidel, Joachim, Series Editor^Aff32, Veiga, Germano, Series Editor^Aff33, Wu, Haitao, Series Editor^Aff34, Zamboni, Walter, Series Editor^Aff35, Zhang, Junjie James, Series Editor^Aff36, Yadav, Sanjay, editor^Aff37, Chaudhary, K.P., editor^Aff38, Gahlot, Ajay, editor^Aff39, Arya, Yogendra, editor^Aff40, Dahiya, Aman, editor^Aff41, Garg, Naveen, editor^Aff42

المصدر: Recent Advances in Metrology : Select Proceedings of AdMet 2021. 906:65-70

المؤلفون: Sahu, Archana^{Aff1, IDs1264702300662w_cor1}, Khatkar, Avni, Ahmad, Saood

المصدر: MAPAN: Journal of Metrology Society of India. :1-5

المؤلفون: Khatkar, Avni^{Aff1, IDs12647022005803_cor1}, Kumari, Swati, Sahu, Archana, Luthra, Sunidhi, Ahmad, Saood

المصدر: MAPAN: Journal of Metrology Society of India. 38(1):281-293

المؤلفون: Kodali, Ravi Kishore, Sahu, Archana

المصدر: 2016 2nd International Conference on Contemporary Computing and Informatics (IC3I) Contemporary Computing and Informatics (IC3I), 2016 2nd International Conference on. :612-616 Dec, 2016

Relation: 2016 2nd International Conference on Contemporary Computing and Informatics (IC3I)

المؤلفون: Kodali, Ravi Kishore, Sahu, Archana

المصدر: 2016 2nd International Conference on Contemporary Computing and Informatics (IC3I) Contemporary Computing and Informatics (IC3I), 2016 2nd International Conference on. :764-768 Dec, 2016

Relation: 2016 2nd International Conference on Contemporary Computing and Informatics (IC3I)

المؤلفون: Sahu, Archana, Jena, Puspanjali

المصدر: Collection and Curation, 2021, Vol. 41, Issue 2, pp. 62-73.

URL الوصول: http://www.emeraldinsight.com/doi/10.1108/CC-04-2021-0012

المؤلفون: Sahu, Archana (ORCID 0000-0001-8724-6158), Bhowmick, Plaban Kumar

المصدر: IEEE Transactions on Learning Technologies. Jan-Mar 2020 13(1):77-90.

Peer Reviewed: Y

Page Count: 14

Descriptors: Automation, Grading, Test Format, Artificial Intelligence, Models, Technology Uses in Education, Classification