المؤلفون: Washio, H., Kashimoto, K., Sakashita, N., Ohira, S., Tanaka, J., Maeda, N., Shimada, M., Kawamata, M., Yoneda, A., Nakanishi, K.

المصدر: In Clinical Radiology March 2024 79(3):213-220

المؤلفون: Sakashita, N., Okuda, F., Shimomura, K., Shimano, H., Hamada, M., Tada, T., Komori, S., Kyuma, K., Yasuoka, A., Abe, H.

المصدر: Proceedings International Test Conference 1996. Test and Design Validity International test conference Test Conference, 1996. Proceedings., International. :319-324 1996

Relation: Proceedings International Test Conference 1996. Test and Design Validity

المؤلفون: Oashi, T., Eimori, T., Morishita, F., Iwamatsu, T., Yamaguchi, Y., Okuda, F., Shimomura, K., Shimano, H., Sakashita, N., Arimoto, K., Inoue, Y., Komori, S., Inuishi, M., Nishimura, T., Miyoshi, H.

المصدر: International Electron Devices Meeting. Technical Digest Electron devices Electron Devices Meeting, 1996. IEDM '96., International. :609-612 1996

Relation: International Electron Devices Meeting. Technical Digest

المؤلفون: Nitta, Y., Shimomura, K., Sakashita, N., Komori, S., Kyuma, K.

المصدر: Proceedings of 1995 IEEE International Conference on Fuzzy Systems. Fuzzy systems Fuzzy Systems, 1995. International Joint Conference of the Fourth IEEE International Conference on Fuzzy Systems and The Second International Fuzzy Engineering Symposium., Proceedings of 1995 IEEE Int. 3:1613-1620 vol.3 1995

Relation: Proceedings of 1995 IEEE International Conference on Fuzzy Systems. The International Joint Conference of the Fourth IEEE International Conference on Fuzzy Systems and The Second International Fuzzy Engineering Symposium

المؤلفون: Teraoka, E., Kengaku, T., Yasui, I., Ishikawa, K., Matsuo, T., Wakada, H., Sakashita, N., Shimazu, Y., Tokuda, T.

المصدر: Proceedings of IEEE International Test Conference - (ITC) International test conference Test Conference, 1993. Proceedings., International. :791-796 1993

Relation: Proceedings of IEEE International Test Conference - (ITC)

المؤلفون: Sakashita, N., Sawai, H., Teraoka, E., Fujiyama, T., Kengaku, T., Shimazu, Y., Tokuda, T.

المصدر: Proceedings. International Test Conference 1990 Test Conference, 1990. Proceedings., International. :880-885 1990

Relation: 1990 International Test Conference

المؤلفون: Tanaka, H., Aoki, M., Sakata, T., Kimura, S., Sakashita, N., Hidaka, H., Tachibana, T., Kimura, K.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 34(8):1084-1090 Aug, 1999

المؤلفون: Shimomura, K., Shimano, H., Okuda, F., Sakashita, N., Oashi, T., Yamaguchi, Y., Eimori, T., Inuishi, M., Arimoto, K., Maegawa, S., Inoue, Y., Nishimura, T., Komori, S., Kyuma, K., Yasuoka, A., Abe, H.

المصدر: 1997 IEEE International Solids-State Circuits Conference. Digest of Technical Papers Solid-state circuits Solid-State Circuits Conference, 1997. Digest of Technical Papers. 43rd ISSCC., 1997 IEEE International. :68-69 1997

Relation: 1997 IEEE International Solids-State Circuits Conference. Digest of Technical Papers

المؤلفون: Eimori, T., Oashi, T., Morishita, F., Iwamatsu, T., Yamaguchi, Y., Okuda, F., Shimomura, K., Shimano, H., Sakashita, N., Arimoto, K., Inoue, Y., Komori, S., Inuishi, M., Nishimura, T., Miyoshi, H.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 45(5):1000-1009 May, 1998

المؤلفون: Nitta, Y., Sakashita, N., Shimomura, K., Okuda, F., Shimano, H., Yamakawa, S., Furukawa, A., Kise, K., Watanabe, H., Toyoda, Y., Fukada, T., Hasegawa, M., Tsukude, M., Arimoto, K., Baba, S., Tomita, Y., Komori, S., Kyuma, K., Abe, H.

المصدر: 1996 IEEE International Solid-State Circuits Conference. Digest of TEchnical Papers, ISSCC Solid-state circuits Solid-State Circuits Conference, 1996. Digest of Technical Papers. 42nd ISSCC., 1996 IEEE International. :376-377 1996

Relation: 1996 IEEE International Solid-State Circuits Conference. Digest of TEchnical Papers, ISSCC