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1مؤتمر
المؤلفون: de Jong, Maurits J., Salm, Cora, Schmitz, Jurriaan
المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-6 Apr, 2020
Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)
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2مؤتمر
المصدر: 2019 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2019 IEEE International. :1-4 Oct, 2019
Relation: 2019 IEEE International Integrated Reliability Workshop (IIRW)
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3مؤتمر
المؤلفون: Wang, Jiahui, Bielen, Jeroen, Salm, Cora, Schmitz, Jurriaan
المصدر: 2016 International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2016 International Conference on. :10-14 Mar, 2016
Relation: 2016 International Conference on Microelectronic Test Structures (ICMTS)
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4مؤتمر
المؤلفون: Wang, Jiahui, Salm, Cora, Houwman, Evert, Nguyen, Minh, Schmitz, Jurriaan
المصدر: 2016 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2016 IEEE International. :65-68 2016
Relation: 2016 IEEE International Integrated Reliability Workshop (IIRW)
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5مؤتمر
المؤلفون: Jiahui Wang, Salm, Cora, Schmitz, Jurriaan
المصدر: 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2013 IEEE International Conference on. :53-58 Mar, 2013
Relation: 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS)
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6مؤتمر
المؤلفون: Kazmi, Syed Naveed Riaz, Aarnink, Tom, Salm, Cora, Schmitz, Jurriaan
المصدر: 2012 IEEE International Frequency Control Symposium Proceedings Frequency Control Symposium (FCS), 2012 IEEE International. :1-4 May, 2012
Relation: 2012 IEEE International Frequency Control Symposium (FCS)
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7دورية أكاديمية
المؤلفون: de Jong, Maurits J., Salm, Cora, Schmitz, Jurriaan
المصدر: In Microelectronics Reliability September 2019 100-101
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8تقرير
المؤلفون: Melai, Joost, Breskin, Amos, Cortesi, Marco, Bilevych, Yevgen, Fransen, Martin, van der Graaf, Harry, Visschers, Jan, Carballo, Victor Blanco, Salm, Cora, Schmitz, Jurriaan
مصطلحات موضوعية: Physics - Instrumentation and Detectors
URL الوصول: http://arxiv.org/abs/1003.2083
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9تقرير
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10دورية أكاديمية
المؤلفون: de Jong, Maurits J., Salm, Cora, Schmitz, Jurriaan
المصدر: In Microelectronics Reliability September 2018 88-90:147-151