المؤلفون: de Jong, Maurits J., Salm, Cora, Schmitz, Jurriaan

المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-6 Apr, 2020

Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Ozturk, Emre, Dikkers, Mike J., Batenburg, Kevin M., Salm, Cora, Schmitz, Jurriaan

المصدر: 2019 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2019 IEEE International. :1-4 Oct, 2019

Relation: 2019 IEEE International Integrated Reliability Workshop (IIRW)

المؤلفون: Wang, Jiahui, Bielen, Jeroen, Salm, Cora, Schmitz, Jurriaan

المصدر: 2016 International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2016 International Conference on. :10-14 Mar, 2016

Relation: 2016 International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Wang, Jiahui, Salm, Cora, Houwman, Evert, Nguyen, Minh, Schmitz, Jurriaan

المصدر: 2016 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2016 IEEE International. :65-68 2016

Relation: 2016 IEEE International Integrated Reliability Workshop (IIRW)

المؤلفون: Jiahui Wang, Salm, Cora, Schmitz, Jurriaan

المصدر: 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2013 IEEE International Conference on. :53-58 Mar, 2013

Relation: 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Kazmi, Syed Naveed Riaz, Aarnink, Tom, Salm, Cora, Schmitz, Jurriaan

المصدر: 2012 IEEE International Frequency Control Symposium Proceedings Frequency Control Symposium (FCS), 2012 IEEE International. :1-4 May, 2012

Relation: 2012 IEEE International Frequency Control Symposium (FCS)

المؤلفون: de Jong, Maurits J., Salm, Cora, Schmitz, Jurriaan

المصدر: In Microelectronics Reliability September 2019 100-101

المؤلفون: Melai, Joost, Breskin, Amos, Cortesi, Marco, Bilevych, Yevgen, Fransen, Martin, van der Graaf, Harry, Visschers, Jan, Carballo, Victor Blanco, Salm, Cora, Schmitz, Jurriaan

مصطلحات موضوعية: Physics - Instrumentation and Detectors

URL الوصول: http://arxiv.org/abs/1003.2083

المؤلفون: Melai, Joost, Lyashenko, Alexey, Breskin, Amos, van der Graaf, Harry, Timmermans, Jan, Visschers, Jan, Salm, Cora, Schmitz, Jurriaan

مصطلحات موضوعية: Physics - Instrumentation and Detectors

URL الوصول: http://arxiv.org/abs/1003.1971

المؤلفون: de Jong, Maurits J., Salm, Cora, Schmitz, Jurriaan

المصدر: In Microelectronics Reliability September 2018 88-90:147-151