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1دورية أكاديمية
المؤلفون: Mehul Vora, Mitalie Shah, Silvana Ostafi, Brian Onken, Jian Xue, Julie Zhouli Ni, Sam Gu, Monica Driscoll
المصدر: PLoS Genetics, Vol 9, Iss 8, p e1003737 (2013)
وصف الملف: electronic resource
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2كتاب
المؤلفون: Kan, Sam Gu.
جغرافية الموضوع: Caucasus, South -- Ethnic relations., Asia, Central -- Ethnic relations., Caucasus, South -- Relations -- Russia (Federation), Russia (Federation) -- Relations -- Caucasus, South., Asia, Central -- Relations -- Russia (Federation), Russia (Federation) -- Relations -- Asia, Central.
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3
المؤلفون: Zoran Gajic, Diljeet Kaur, Julie Ni, Zhaorong Zhu, Anna Zhebrun, Maria Gajic, Matthew Kim, Julia Hong, Monika Priyadarshini, Christian Frøkjær-Jensen, Sam Gu
المصدر: Development (Cambridge, England). 149(16)
مصطلحات موضوعية: Germ Cells, Animals, Humans, RNA Interference, RNA, Small Interfering, Caenorhabditis elegans, Caenorhabditis elegans Proteins, Molecular Biology, Developmental Biology, RNA, Double-Stranded
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5bd89e9f2bae63ec2fc0d2f99c6b973a
https://pubmed.ncbi.nlm.nih.gov/35876680 -
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المؤلفون: Zoran Gajic, Diljeet Kaur, Julie Ni, Zhaorong Zhu, Anna Zhebrun, Maria Gajic, Matthew Kim, Julia Hong, Monika Priyadarshini, Christian Frøkjær-Jensen, Sam Gu
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::86b49cc528b061007228caec89f9d970
https://doi.org/10.1101/2022.01.25.477739 -
5دورية أكاديمية
المؤلفون: Yingxia Liu, Menglu Li, Dong Wook Kim, Sam Gu, Tu, K. N.
المصدر: Journal of Applied Physics; 10/7/2015, Vol. 118 Issue 13, p135304-1-135304-5, 5p, 2 Black and White Photographs, 3 Diagrams, 1 Chart, 3 Graphs
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6دورية أكاديمية
المؤلفون: Amy Gerrish, Chipo Mashayamombe-Wolfgarten, Edward Stone, Claudia Román-Montañana, Joseph Abbott, Helen Jenkinson, Gerard Millen, Sam Gurney, Maureen McCalla, Sarah-Jane Staveley, Anu Kainth, Maria Kirk, Claire Bowen, Susan Cavanagh, Sancha Bunstone, Megan Carney, Ajay Mohite, Samuel Clokie, M. Ashwin Reddy, Alison Foster, Stephanie Allen, Manoj Parulekar, Trevor Cole
المصدر: Cancers, Vol 16, Iss 8, p 1565 (2024)
مصطلحات موضوعية: retinoblastoma, aqueous humour, RB1 gene, cell-free DNA, diagnosis, liquid biopsy, Neoplasms. Tumors. Oncology. Including cancer and carcinogens, RC254-282
وصف الملف: electronic resource
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7
المؤلفون: King-Ning Tu, Yi Ting Chen, Sam Gu, Dong Wook Kim, Yingxia Liu
المصدر: Scripta Materialia. 119:9-12
مصطلحات موضوعية: 010302 applied physics, Materials science, Kirkendall effect, Mechanical Engineering, Metallurgy, Metals and Alloys, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Mechanics of Materials, Soldering, Phase (matter), 0103 physical sciences, Fracture (geology), General Materials Science, 0210 nano-technology, Electroplating, Layer (electronics), Surface finishing, Shrinkage
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8دورية أكاديمية
المؤلفون: Sam Gutmann, Mark Mixer, Steven Morrow
المصدر: Transactions on Combinatorics, Vol 12, Iss 1, Pp 11-26 (2023)
مصطلحات موضوعية: derangement, fixed point, probability, Mathematics, QA1-939
وصف الملف: electronic resource
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9
المؤلفون: Dong Wook Kim, Sam Gu, King-Ning Tu, Yingxia Liu, Nobumichi Tamura
المصدر: Scripta Materialia. 102:39-42
مصطلحات موضوعية: Diffraction, Materials science, Mechanical Engineering, Metals and Alloys, Nucleation, chemistry.chemical_element, Microbeam, Condensed Matter Physics, Crystallography, Lattice constant, chemistry, Electron diffraction, Materials Science(all), Mechanics of Materials, Metastability, General Materials Science, Orthorhombic crystal system, Tin
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10
المؤلفون: Aurel Gunterus, M. F. Chen, Urmi Ray, Matt Nowak, Sam Gu, Amer Cassier, Sharon Chen, Ron Lindley, Brian Matthew Henderson, S. P. Jeng, Dong Wook Kim, C. H. Yu, Vidhya Ramachandran, C. H. Wu, Riko Radojcic
المصدر: International Symposium on Microelectronics. 2013:000442-000446
مصطلحات موضوعية: Digital electronics, Engineering, business.industry, Interface (computing), Automotive Engineering, Stacking, Process (computing), Electronic engineering, Memory bandwidth, Test method, Chip, business, Die (integrated circuit)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::650f19b9266df7cd7ba70317e3a4e73b
https://doi.org/10.4071/isom-2013-wa13