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1مؤتمر
المؤلفون: Jeung-Woo Kim, Won-Sang Song, Sam-Young Kim, Hyan-Soo Kim, Hyun-Goo Jeon, Chae-Bog Lim
المصدر: Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2001. IPFA 2001. Proceedings of the 2001 8th International Symposium on the. :174-177 2001
Relation: Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001
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2مؤتمر
المؤلفون: Chul-Hee Jeon, Sam-Young Kim, Hyun-Soo Kim, Chae-Bog Rim
المصدر: IEEE International Integrated Reliability Workshop Final Report, 2002. Integrated reliability Integrated Reliability Workshop Final Report, 2002. IEEE International. :130-132 2002
Relation: IEEE International Integrated Reliability Workshop
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3
المؤلفون: Sung-Joon Park, S. Shin, Minjung Jin, Y. Kim, J. Jo, M. Choi, Jinseok Kim, Hyunchul Sagong, Sam-Young Kim, C. Liu, Jae-Eun Park, W. Kim, Sangwoo Pae, J.K. Park, Jaewoo Shim
المصدر: 2015 IEEE International Integrated Reliability Workshop (IIRW).
مصطلحات موضوعية: Engineering, business.industry, law, Transistor, Hardware_INTEGRATEDCIRCUITS, Node (circuits), Limiting, Product (category theory), business, Reliability (statistics), High volume manufacturing, Reliability engineering, law.invention
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2cf6ad433a49c3fe178cc818a0c80072
https://doi.org/10.1109/iirw.2015.7437069 -
4
المؤلفون: Sam-Young Kim, Wootaik Lee, Kyeongjin Lee, Chinchul Choi
المصدر: IEEE Transactions on Industrial Electronics. 58:4078-4086
مصطلحات موضوعية: Engineering, Observer (quantum physics), Rotor (electric), Stator, business.industry, Detector, Control engineering, law.invention, Control and Systems Engineering, Control theory, law, Position (vector), Hall effect sensor, Electrical and Electronic Engineering, Synchronous motor, business
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5
المؤلفون: Wootaik Lee, Seung-Yub Park, Min-Sik Rho, Sam-Young Kim
المصدر: IEEE Transactions on Industrial Electronics. 57:1609-1614
مصطلحات موضوعية: Disturbance (geology), Control and Systems Engineering, Control theory, Computer science, Control system, Estimator, Electrical and Electronic Engineering, Counter-electromotive force, Synchronous motor, Flux linkage, Machine control, Compensation (engineering)
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6
المؤلفون: Sam-Young Kim, Min-Sik Rho
المصدر: IEEE Transactions on Industrial Electronics. 57:1063-1073
مصطلحات موضوعية: Engineering, Temperature control, Vector control, business.industry, Control and Systems Engineering, Control theory, Robustness (computer science), Inverter, Torque, Electric power, Electrical and Electronic Engineering, Robust control, Synchronous motor, business
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7
المؤلفون: Junekyun Park, Hyun-Goo Jeon, Sam-Young Kim, Man-Young Shin, Kyung-Il Ouh, Sang-Cheol Shin, Back-Sung Kim, Hyun-Joon Cha, Jongwoo Park, Yong-Bum Jo
المصدر: IEEE Transactions on Components and Packaging Technologies. 30:731-744
مصطلحات موضوعية: Wire bonding, Auger electron spectroscopy, Materials science, Cost effectiveness, Alloy, Metallurgy, Intermetallic, Epoxy, Molding (process), engineering.material, Electronic, Optical and Magnetic Materials, visual_art, visual_art.visual_art_medium, engineering, Surface roughness, Electrical and Electronic Engineering, Composite material
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8
المؤلفون: Sam-Young Kim, Chae-Bog Rim, Hyun-Chul Kim, Chul-Hee Jeon
المصدر: IEEE International Integrated Reliability Workshop Final Report, 2002..
مصطلحات موضوعية: Reliability (semiconductor), Materials science, Negative-bias temperature instability, CMOS, business.industry, MOSFET, Gate dielectric, Electrical engineering, Dual gate, business, Engineering physics, Threshold voltage, Hot-carrier injection
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b20ef633036502e414830cf916a20e10
https://doi.org/10.1109/irws.2002.1194249 -
9
المؤلفون: Seung-Chan Moon, Sang-Jung Kim, Sung Kwon Lee, Cheol Kyu Bok, Ki Soo Shin, Sung-Koo Lee, Young-Sun Hwang, Sam Young Kim, Jae Chang Jung, Min Suk Lee
المصدر: Advances in Resist Technology and Processing XX.
مصطلحات موضوعية: Materials science, business.industry, Extreme ultraviolet lithography, engineering.material, law.invention, Optics, Coating, Resist, Etching (microfabrication), law, engineering, Optoelectronics, Photolithography, Contact area, business, Lithography, Layer (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bb9b24ae6c15d4271690ad559bffb01f
https://doi.org/10.1117/12.485052 -
10
المؤلفون: Won-sang Song, Hyun-Goo Jeon, Sam-Young Kim, Chae-Bog Lim, Jeung-Woo Kim, Hyan-Soo Kim
المصدر: Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548).
مصطلحات موضوعية: Stress (mechanics), Materials science, Electrical resistivity and conductivity, Electronic engineering, Copper interconnect, Extrusion, Dielectric, Composite material, Electromigration, Failure mode and effects analysis, Thermal expansion
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::77a800aca5d8a5e8fbfb5dead3bb6d71
https://doi.org/10.1109/ipfa.2001.941480