المؤلفون: Jeung-Woo Kim, Won-Sang Song, Sam-Young Kim, Hyan-Soo Kim, Hyun-Goo Jeon, Chae-Bog Lim

المصدر: Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2001. IPFA 2001. Proceedings of the 2001 8th International Symposium on the. :174-177 2001

Relation: Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001

المؤلفون: Chul-Hee Jeon, Sam-Young Kim, Hyun-Soo Kim, Chae-Bog Rim

المصدر: IEEE International Integrated Reliability Workshop Final Report, 2002. Integrated reliability Integrated Reliability Workshop Final Report, 2002. IEEE International. :130-132 2002

Relation: IEEE International Integrated Reliability Workshop

المؤلفون: Sung-Joon Park, S. Shin, Minjung Jin, Y. Kim, J. Jo, M. Choi, Jinseok Kim, Hyunchul Sagong, Sam-Young Kim, C. Liu, Jae-Eun Park, W. Kim, Sangwoo Pae, J.K. Park, Jaewoo Shim

المصدر: 2015 IEEE International Integrated Reliability Workshop (IIRW).

مصطلحات موضوعية: Engineering, business.industry, law, Transistor, Hardware_INTEGRATEDCIRCUITS, Node (circuits), Limiting, Product (category theory), business, Reliability (statistics), High volume manufacturing, Reliability engineering, law.invention

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2cf6ad433a49c3fe178cc818a0c80072
https://doi.org/10.1109/iirw.2015.7437069

المؤلفون: Sam-Young Kim, Wootaik Lee, Kyeongjin Lee, Chinchul Choi

المصدر: IEEE Transactions on Industrial Electronics. 58:4078-4086

مصطلحات موضوعية: Engineering, Observer (quantum physics), Rotor (electric), Stator, business.industry, Detector, Control engineering, law.invention, Control and Systems Engineering, Control theory, law, Position (vector), Hall effect sensor, Electrical and Electronic Engineering, Synchronous motor, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7b555f3e36cf7754d6eabd005b13d2b1
https://doi.org/10.1109/tie.2010.2098367

المؤلفون: Wootaik Lee, Seung-Yub Park, Min-Sik Rho, Sam-Young Kim

المصدر: IEEE Transactions on Industrial Electronics. 57:1609-1614

مصطلحات موضوعية: Disturbance (geology), Control and Systems Engineering, Control theory, Computer science, Control system, Estimator, Electrical and Electronic Engineering, Counter-electromotive force, Synchronous motor, Flux linkage, Machine control, Compensation (engineering)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d57834f3e045ba989838d0b023c00659
https://doi.org/10.1109/tie.2009.2033098

المؤلفون: Sam-Young Kim, Min-Sik Rho

المصدر: IEEE Transactions on Industrial Electronics. 57:1063-1073

مصطلحات موضوعية: Engineering, Temperature control, Vector control, business.industry, Control and Systems Engineering, Control theory, Robustness (computer science), Inverter, Torque, Electric power, Electrical and Electronic Engineering, Robust control, Synchronous motor, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9e98d62cdf27b99e37ef0722fc4fe1bd
https://doi.org/10.1109/tie.2009.2028356

المؤلفون: Junekyun Park, Hyun-Goo Jeon, Sam-Young Kim, Man-Young Shin, Kyung-Il Ouh, Sang-Cheol Shin, Back-Sung Kim, Hyun-Joon Cha, Jongwoo Park, Yong-Bum Jo

المصدر: IEEE Transactions on Components and Packaging Technologies. 30:731-744

مصطلحات موضوعية: Wire bonding, Auger electron spectroscopy, Materials science, Cost effectiveness, Alloy, Metallurgy, Intermetallic, Epoxy, Molding (process), engineering.material, Electronic, Optical and Magnetic Materials, visual_art, visual_art.visual_art_medium, engineering, Surface roughness, Electrical and Electronic Engineering, Composite material

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0c8ff73e995162b26ee4139f58469a18
https://doi.org/10.1109/tcapt.2007.906318

المؤلفون: Sam-Young Kim, Chae-Bog Rim, Hyun-Chul Kim, Chul-Hee Jeon

المصدر: IEEE International Integrated Reliability Workshop Final Report, 2002..

مصطلحات موضوعية: Reliability (semiconductor), Materials science, Negative-bias temperature instability, CMOS, business.industry, MOSFET, Gate dielectric, Electrical engineering, Dual gate, business, Engineering physics, Threshold voltage, Hot-carrier injection

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b20ef633036502e414830cf916a20e10
https://doi.org/10.1109/irws.2002.1194249

المؤلفون: Seung-Chan Moon, Sang-Jung Kim, Sung Kwon Lee, Cheol Kyu Bok, Ki Soo Shin, Sung-Koo Lee, Young-Sun Hwang, Sam Young Kim, Jae Chang Jung, Min Suk Lee

المصدر: Advances in Resist Technology and Processing XX.

مصطلحات موضوعية: Materials science, business.industry, Extreme ultraviolet lithography, engineering.material, law.invention, Optics, Coating, Resist, Etching (microfabrication), law, engineering, Optoelectronics, Photolithography, Contact area, business, Lithography, Layer (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bb9b24ae6c15d4271690ad559bffb01f
https://doi.org/10.1117/12.485052

المؤلفون: Won-sang Song, Hyun-Goo Jeon, Sam-Young Kim, Chae-Bog Lim, Jeung-Woo Kim, Hyan-Soo Kim

المصدر: Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548).

مصطلحات موضوعية: Stress (mechanics), Materials science, Electrical resistivity and conductivity, Electronic engineering, Copper interconnect, Extrusion, Dielectric, Composite material, Electromigration, Failure mode and effects analysis, Thermal expansion

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::77a800aca5d8a5e8fbfb5dead3bb6d71
https://doi.org/10.1109/ipfa.2001.941480