المؤلفون: Kim, Soo Youn, Wing-Fai Loke, Sang Phill Park, Byunghoo Jung, Roy, Kaushik

المصدر: 2012 IEEE International Conference on IC Design & Technology IC Design & Technology (ICICDT), 2012 IEEE International Conference on. :1-4 May, 2012

Relation: 2012 IEEE International Conference on IC Design & Technology (ICICDT)

المؤلفون: Kunhyuk Kang, Sang Phill Park, Kaushik Roy, Alam, Muhammad A.

المصدر: 2007 IEEE/ACM International Conference on Computer-Aided Design Computer-Aided Design, 2007. ICCAD 2007. IEEE/ACM International Conference on. :730-734 Nov, 2007

Relation: 2007 IEEE/ACM International Conference on Computer-Aided Design

المؤلفون: Sang Phill Park, Ulya R. Karpuzcu, Nitin Borkar, Dinesh Somasekhar, Ayan Paul, Young Moon Kim, Chris H. Kim

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 24:3468-3476

مصطلحات موضوعية: Engineering, Multi-core processor, business.industry, 020208 electrical & electronic engineering, Total system power, 02 engineering and technology, Voltage regulator, 020202 computer hardware & architecture, Dynamic voltage scaling, Power (physics), Process variation, Power analysis, Hardware and Architecture, Embedded system, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, System on a chip, Electrical and Electronic Engineering, business, Software

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4a9263380f1c859d1f724e16723e5673
https://doi.org/10.1109/tvlsi.2016.2555954

المؤلفون: Niladri Narayan Mojumder, Kaushik Roy, Charles Augustine, Xuanyao Fong, Sang Phill Park, Sri Harsha Choday

المصدر: IEEE Sensors Journal. 12:756-766

مصطلحات موضوعية: Engineering, Hardware_MEMORYSTRUCTURES, business.industry, Spin-transfer torque, Electrical engineering, Circuit reliability, Computer Science::Hardware Architecture, Parametric process, Robustness (computer science), Low-power electronics, Computer data storage, Electronic engineering, Electrical and Electronic Engineering, Design methods, business, Instrumentation, Random access

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4180d7352a9c54fa70b3b73110c342cc
https://doi.org/10.1109/jsen.2011.2124453

المؤلفون: Kaushik Roy, Sang Phill Park, Dongsoo Lee

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 20:248-256

مصطلحات موضوعية: business.industry, Computer science, Reliability (computer networking), Soft error, Hardware and Architecture, Static random-access memory, Electrical and Electronic Engineering, Universal Product Code, Error detection and correction, Field-programmable gate array, business, Hamming code, Software, Auxiliary memory, Computer hardware

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2dd30b6118667f25bc507b3f11b47b11
https://doi.org/10.1109/tvlsi.2010.2095435

المؤلفون: Kaushik Roy, Sang Phill Park, Sumeet Kumar Gupta

المصدر: IEEE Transactions on Electron Devices. 58:3837-3846

مصطلحات موضوعية: Engineering, Hardware_MEMORYSTRUCTURES, business.industry, Transistor, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit design, Process corners, Electronic, Optical and Magnetic Materials, law.invention, law, Logic gate, MOSFET, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Static random-access memory, Electrical and Electronic Engineering, business, Low voltage, Access time

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::00a7ea4d28fc16d472f74fa28fb7bdd2
https://doi.org/10.1109/ted.2011.2166117

المؤلفون: Sang Phill Park, Yusung Kim, Xuanyao Fong, Kon-Woo Kwon, Sri Harsha Choday, Kaushik Roy

المصدر: IEEE Electron Device Letters. 35:488-490

مصطلحات موضوعية: Engineering, Power gating, business.industry, Electrical engineering, Spin-transfer torque, Driver circuit, Electronic, Optical and Magnetic Materials, law.invention, Tunnel magnetoresistance, Backup, law, Low-power electronics, Electronic engineering, Spin Hall effect, Hardware_ARITHMETICANDLOGICSTRUCTURES, Electrical and Electronic Engineering, business, Flip-flop, Hardware_LOGICDESIGN

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::42e7ce0cee57728379ab9f88e3bc3894
https://doi.org/10.1109/led.2014.2304683

المؤلفون: Keejong Kim, Kaushik Roy, Sang Phill Park, Kunhyuk Kang

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 18:270-280

مصطلحات موضوعية: Engineering, business.industry, Circuit design, Hardware_PERFORMANCEANDRELIABILITY, Phase detector, Process variation, Phase-locked loop, Voltage-controlled oscillator, Reliability (semiconductor), CMOS, Hardware and Architecture, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Electrical and Electronic Engineering, business, Software, Electronic circuit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5b4bbdbc72fc7466372dec5d674d0abf
https://doi.org/10.1109/tvlsi.2008.2010399

المؤلفون: Ik Joon Chang, Kaushik Roy, Sang Phill Park

المصدر: IEEE Journal of Solid-State Circuits. 45:401-410

مصطلحات موضوعية: Engineering, Asynchronous system, business.industry, Subthreshold conduction, Electrical engineering, Propagation delay, Clock skew, Handshaking, Low-power electronics, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Electrical and Electronic Engineering, business, Hardware_LOGICDESIGN, Asynchronous circuit, Efficient energy use

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5cbcb929d98caa10d0390b98d4c5b60c
https://doi.org/10.1109/jssc.2009.2036764

المؤلفون: Kunhyuk Kang, Sang Phill Park, Kaushik Roy

المصدر: IEEE Design & Test of Computers. 26:8-17

مصطلحات موضوعية: Stochastic process, Computer science, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit design, Reliability (semiconductor), CMOS, Hardware and Architecture, Temperature instability, Logic gate, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Electrical and Electronic Engineering, Random logic, Software, Hardware_LOGICDESIGN, Degradation (telecommunications)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b7a54598f587fb91f49c1d5aef3842c9
https://doi.org/10.1109/mdt.2009.154