يعرض 1 - 10 نتائج من 49 نتيجة بحث عن '"Sang-pil Sim"', وقت الاستعلام: 1.08s تنقيح النتائج
  1. 1
    مؤتمر

    المصدر: Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Solid-State Device Research Conference Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European. :321-324 2005

    Relation: Proceedings of ESSDERC 2005. 31st European Solid-State Device Research Conference

  2. 2
    مؤتمر

    المصدر: Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. Solid-state and integrated circuits technology Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on. 2:1026-1031 vol.2 2004

    Relation: 2004 7th International Conference on Solid-State and Integrated Circuits Technology Proceedings

  3. 3
    مؤتمر

    المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :315-318 2002

    Relation: IEEE International Electron Devices Meeting

  4. 4
    مؤتمر

    المصدر: 2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443) Solid-state and integrated circuit technology Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on. 1:209-212 vol.1 2001

    Relation: Proceedings of 6th International Conference on Solid-State and IC Technology

  5. 5
    دورية أكاديمية

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 50(6):1501-1510 Jun, 2003

  6. 6
    مؤتمر

    المصدر: 2006 European Solid-State Device Research Conference Solid-State Device Research Conference, 2006. ESSDERC 2006. Proceeding of the 36th European. :218-221 Sep, 2006

    Relation: 2006 European Solid-State Device Research Conference

  7. 7
    مؤتمر

    المصدر: 2006 IEEE International Reliability Physics Symposium Proceedings Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International. :385-387 Mar, 2006

    Relation: 2006 IEEE International Reliability Physics Symposium Proceedings

  8. 8
    دورية أكاديمية

    المؤلفون: Sang-Pil Sim, Kwyro Lee, Yang, C.Y.

    المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 23(12):740-742 Dec, 2002

  9. 9
    دورية أكاديمية

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 38(8):1905-1912 Aug, 1991

  10. 10
    مؤتمر

    المصدر: IEEE VLSI-TSA International Symposium on VLSI Technology, 2005. (VLSI-TSA-Tech). VLSI Technology VLSI Technology, 2005. (VLSI-TSA-Tech). 2005 IEEE VLSI-TSA International Symposium on. :35-36 2005

    Relation: 2005 IEEE VLSI-TSA. International Symposium on VLSI Technology (VLSI-TSA-TECH)