المؤلفون: Paolucci, V., De Santis, J., Lozzi, L., Giorgi, G., Cantalini, C.

المصدر: In Sensors and Actuators: B. Chemical 1 January 2022 350

المؤلفون: Choi, L. J., Poulter, M., de Santis, J., Cestra, G., Moberly, L., Gadepally, K., McCulloh, H., Beera, R., Garg, V., Green, K., Prater, J.

المصدر: 2012 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures (ICMTS), 2012 IEEE International Conference on. :233-238 Mar, 2012

Relation: 2012 IEEE International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Paolucci, V., De Santis, J., Lozzi, L., Rigon, M., Martucci, A., Cantalini, C.

المصدر: In Ceramics International 1 September 2021 47(17):25017-25028

المؤلفون: Yindeepol, W., Foote, R., De Santis, J., Krakowski, T., Bulucea, C.

المصدر: Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting Bipolar/BiCMOS circuits and technology Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting. :40-43 2004

Relation: Proceedings of the 2004 Bipolar/BiCMOS Circuits and Technology Meeting

المؤلفون: O'Connell, B., Yang, R., Yindeepol, W., De Santis, J., Strachan, A., Coppock, W., Foote, R., Dark, C., Sethna, P., Chaparala, P.

المصدر: IEEE International Integrated Reliability Workshop Final Report, 2004 Integrated reliability workshop Integrated Reliability Workshop Final Report, 2004 IEEE International. :23-27 2004

Relation: 2004 IEEE International Integrated Reliability Workshop Final Report

المؤلفون: Bashir, R., De Santis, J., Chen, D., Hebert, F., Ramde, A., Maghsoudnia, P., You, H., Meng, P., Moraveji, F., Razouk, R.

المصدر: Proceedings of IEEE Bipolar/BiCMOS Circuits and Technology Meeting Bipolar/BiCMOS circuits and technology Bipolar/BiCMOS Circuits and Technology Meeting,1994., Proceedings of the 1994. :225-228 1994

Relation: Proceedings of IEEE Bipolar/BiCMOS Circuits and Technology Meeting

المؤلفون: Vilchis, H.^Aff1, Conde, J., Santis, J. A.^{Aff1, Aff4}, Pola-Albores, F., Arias-Cerón, J. S., Pantoja, J., Sánchez-R, V. M.

المصدر: Journal of Materials Science: Materials in Electronics. 31(5):4170-4177

المؤلفون: Bashir, R., Wang, F., Greig, W., McGregor, J.M., Yindeepol, W., De Santis, J.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 19(8):282-284 Aug, 1998

المؤلفون: Yindepol, W., Bashir, R., McGregor, J.M., Brown, K.C., De Wolf, I., De Santis, J., Ahmed, A.

المصدر: 1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) SOI conference SOI Conference, 1998. Proceedings., 1998 IEEE International. :151-152 1998

Relation: 1998 IEEE International SOI Conference Proceedings

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