يعرض 1 - 10 نتائج من 211 نتيجة بحث عن '"Saputra, H"', وقت الاستعلام: 0.95s تنقيح النتائج
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    كتاب إلكتروني

    المؤلفون: Supani, A.Aff21, Aff22, Andriani, Y.Aff21, Aff22, IndartoAff21, Aff22, Saputra, H.Aff21, Aff22, Joni, A. BahriAff21, Aff22, Alfian, D.Aff21, Aff22, A.TaqwaAff21, Aff22, Silvia H., A.Aff21, Aff22

    المساهمون: Zheng, Zheng, Editor-in-ChiefAff1, Xi, Zhiyu, Associate EditorAff2, Gong, Siqian, Series EditorAff3, Hong, Wei-Chiang, Series EditorAff4, Mellal, Mohamed Arezki, Series EditorAff5, Narayanan, Ramadas, Series EditorAff6, Nguyen, Quang Ngoc, Series EditorAff7, Ong, Hwai Chyuan, Series EditorAff8, Sun, Zaicheng, Series EditorAff9, Ullah, Sharif, Series EditorAff10, Wu, Junwei, Series EditorAff11, Zhang, Baochang, Series EditorAff12, Zhang, Wei, Series EditorAff13, Zhu, Quanxin, Series EditorAff14, Zheng, Wei, Series EditorAff15, Husni, Nyayu Latifah, editorAff16, Caesarendra, Wahyu, editorAff17, Aznury, Martha, editorAff18, Novianti, Leni, editorAff19, Stiawan, Deris, editorAff20

    المصدر: Proceedings of the 6th FIRST 2022 International Conference (FIRST 2022). 14:449-457

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    مؤتمر

    المصدر: IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design (ISVLSI'05) VLSI VLSI, 2005. Proceedings. IEEE Computer Society Annual Symposium on. :104-109 2005

    Relation: Proceedings. IEEE Computer Society Annual Symposium on VLSI

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    مؤتمر

    المصدر: Design, Automation and Test in Europe Design, Automation and Test in Europe, 2005. Proceedings. :882-887 Vol. 2 2005

    Relation: Proceedings. Design, Automation and Test in Europe

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    مؤتمر

    المصدر: 2003 Design, Automation and Test in Europe Conference and Exhibition Design, automation and test in Europe Design, Automation and Test in Europe Conference and Exhibition, 2003. :84-89 2003

    Relation: 6th Design Automation and Test in Europe (DATE 03)

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    مؤتمر

    المصدر: 2003 IEEE Workshop on Signal Processing Systems (IEEE Cat. No.03TH8682) Signal processing systems Signal Processing Systems, 2003. SIPS 2003. IEEE Workshop on. :116-121 2003

    Relation: 2003 IEEE Workshop on Signal Processing Systems

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    تقرير

    المصدر: Dans Design, Automation and Test in Europe - DATE'05, Munich : Allemagne (2005)

    مصطلحات موضوعية: Computer Science - Other Computer Science

    URL الوصول: http://arxiv.org/abs/0710.4799

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    دورية أكاديمية

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