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المؤلفون: Steven Consiglio, Qingyun Yang, K. Tapily, Saraf Iqbal Rashid, Muthumanickam Sankarapandian, Paul C. Jamison, Tsunomura Takaaki, C. Catano, Robert D. Clark, T. Ando, R. Pujari, Vijay Narayanan, Hisashi Higuchi, Gerrit J. Leusink, Malte J. Rasch, R. Soave, Hongwen Yan, Ernest Y. Wu, Dexin Kong, Aelan Mosden, Peter Biolsi, Youngseok Kim, Robert R. Robison, O. van der Straten, D. Koty, S. McDermott, Soon-Cheon Seo, Hiroyuki Miyazoe, Son Nguyen, A. Gasasira, Nicole Saulnier, Wilfried Haensch, Sebastian Engelmann, C. S. Wajda, Ramachandran Muralidhar, S. DeVries
المصدر: IEEE Electron Device Letters. 42:759-762
مصطلحات موضوعية: 010302 applied physics, Physics, business.industry, Deep learning, Process (computing), Topology, 01 natural sciences, Omega, Electronic, Optical and Magnetic Materials, Resistive random-access memory, Stack (abstract data type), 0103 physical sciences, Scalability, Process optimization, Artificial intelligence, Electrical and Electronic Engineering, business, Voltage
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المؤلفون: N. Arnold, M. Iwatake, I. Ok, James Chingwei Li, L. Tierney, Saraf Iqbal Rashid, Nicole Saulnier, T. Gordon, G. Lian, Victor Chan, A. Cote, S. McDermott, Kevin W. Brew, James J. Demarest, A. Varghese
المصدر: International Symposium for Testing and Failure Analysis.
مصطلحات موضوعية: Phase-change memory, Computer science, Reliability engineering, Test (assessment)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ce06fed307adcc6280c3f14efc8fd180
https://doi.org/10.31399/asm.cp.istfa2021p0034 -
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المؤلفون: Kamal K. Sikka, Hiroyuki Mori, Hongqing Zhang, Ravi K. Bonam, Risa Miyazawa, Keiji Matsumoto, Marc A. Bergendahl, Takashi Hisada, Aakrati Jain, Dario L. Goldfarb, Dishit P. Parekh, Ed Cropp, Saraf Iqbal Rashid
المصدر: 2021 20th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm).
مصطلحات موضوعية: Pressure drop, Materials science, Silicon, business.industry, Thermal resistance, Mechanical engineering, chemistry.chemical_element, Computational fluid dynamics, Finite element method, Thermal expansion, chemistry, Thermal, Fluid dynamics, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::69c443acf3198537049b6a613d530acf
https://doi.org/10.1109/itherm51669.2021.9503180 -
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المؤلفون: Robert L. Bruce, Jin-Ping Han, I. Ok, Abu Sebastian, Geoffrey W. Burr, John M. Papalia, Hsinyu Tsai, Vijay Narayanan, Lynne Gignac, Katie Spoon, Tenko Yamashita, Nicole Saulnier, S. R. Nandakumar, Cheng-Wei Cheng, Andrew H. Simon, Benedikt Kersting, Charles Mackin, Irem Boybat, Stefano Ambrogio, Kevin W. Brew, Matthew J. BrightSky, Ning Li, M. Le Gallo, Praneet Adusumilli, Saraf Iqbal Rashid, Timothy M. Philip, Wanki Kim, Zuoguang Liu, Thomas Bohnstingl, S. Ghazi Sarwat, Nanbo Gong
المصدر: IRPS
مصطلحات موضوعية: Physics, Phase-change memory, chemistry.chemical_compound, chemistry, Artificial neural network, Phase (waves), Electronic engineering, Noise control, GeSbTe, Projection (set theory), Noise (electronics), Reset (computing)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::89a3aa0be0be14099a1292533593cbc5
https://doi.org/10.1109/irps46558.2021.9405191 -
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المؤلفون: Vijay Narayanan, Dexin Kong, Saraf Iqbal Rashid, Youngseok Kim, Takashi Ando, Soon-Cheon Seo, Sergey Voronin, Nicole Saulnier, Shyam Sridhar, Catano Christopher
المصدر: Advanced Etch Technology for Nanopatterning IX.
مصطلحات موضوعية: business.industry, Computer science, Analog computer, Electrical engineering, Resistive random-access memory, law.invention, Etching (microfabrication), law, Resistive switching, Scalability, Metal electrodes, business, Efficient energy use, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::08722711744b9c00c32fb3cde3f757dc
https://doi.org/10.1117/12.2552035 -
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المؤلفون: Vimal Kamineni, Junli Wang, Susan Su Chen Fan, Andre Labonte, Ruilong Xie, Dinesh Gupta, Raja Muthinti, Juntao Li, Dechao Guo, Ryan Kevin J, B. Peethala, Richard Conte, Christopher Prindle, Veeraraghavan S. Basker, Shanti Pancharatnam, Kangguo Cheng, Albert M. Young, Stan D. Tsai, Huiming Bu, H. P. Amanapu, Chanro Park, Balasubramanian S. Haran, Robert R. Robison, Nicolas Loubet, Y. Liang, Huimei Zhou, Kisik Choi, Richard A. Conti, Andreas Knorr, Cave Nigel, Adra Carr, Saraf Iqbal Rashid, Andrew M. Greene, Michael P. Belyansky, Hao Tang, Mark Raymond
المصدر: 2019 Symposium on VLSI Technology.
مصطلحات موضوعية: Interconnection, Materials science, business.industry, Oxide, chemistry.chemical_element, Nitride, Tungsten, chemistry.chemical_compound, chemistry, Process integration, Optoelectronics, Static random-access memory, Routing (electronic design automation), business, Scaling
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ddd686fefd2d3d87577b75e554a2b83f
https://doi.org/10.23919/vlsit.2019.8776492 -
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المؤلفون: Christian Lavoie, Curtis Durfee, Edward J. Nowak, Stan D. Tsai, Dechao Guo, W. Wang, Vimal Kamineni, Adra Carr, Gen Tsutsui, H. P. Amanapu, Jie Yang, Walter Kleemeier, Kisik Choi, Oleg Gluschenkov, Samuel S. Choi, Saraf Iqbal Rashid, Dinesh Gupta, F. Lie, Huiming Bu, Lan Yu, Andreas Knorr, Tenko Yamashita, Heng Wu, Zuoguang Liu, Christopher Prindle, Cave Nigel, Ryan Kevin J, Jay W. Strane, Kevin W. Brew, Chengyu Niu, Y. Liang, Balasubramanian S. Pranatharthi Haran, Mukesh Khare, Shogo Mochizuki, James J. Demarest
المصدر: 2018 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Contact resistance, Transistor, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, law.invention, Reduction (complexity), CMOS, law, Electrical resistivity and conductivity, 0103 physical sciences, Parasitic element, Optoelectronics, 0210 nano-technology, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::629135a0e9c0b7d3b8d1d85180cd8977
https://doi.org/10.1109/iedm.2018.8614661 -
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المؤلفون: E. Engbrecht, Edward P. Maciejewski, Christopher D. Sheraw, R. Divakaruni, Zhengwen Li, Allen H. Gabor, L. Economikos, Fernando Guarin, N. Zhan, H-K Lee, MaryJane Brodsky, Kenneth J. Stein, Siyuranga O. Koswatta, Y. Yang, Byeong Y. Kim, J. Hong, A. Bryant, Herbert L. Ho, Ruqiang Bao, Nicolas Breil, Babar A. Khan, E. Woodard, W-H. Lee, C-H. Lin, A. Levesque, Kevin McStay, V. Basker, Viraj Y. Sardesai, C. Tran, A. Ogino, Reinaldo A. Vega, C. DeWan, Shreesh Narasimha, J-J. An, Amit Kumar, A. Aiyar, Ravikumar Ramachandran, W. Wang, X. Wang, W. Nicoll, D. Hoyos, A. Friedman, Barry Linder, Yongan Xu, E. Alptekin, Cathryn Christiansen, S. Polvino, Han Wang, Scott R. Stiffler, G. Northrop, S. Saudari, J. Rice, Saraf Iqbal Rashid, Sunfei Fang, Michael V. Aquilino, Z. Ren, B. Kannan, Geng Wang, Noah Zamdmer, T. Kwon, Paul D. Agnello, Hasan M. Nayfeh, S. Jain, Robert R. Robison, M. Hasanuzzaman, J. Cai, L. Lanzerotti, D. Wehelle-Gamage, Basanth Jagannathan, J. Johnson, E. Kaste, Kai Zhao, Huiling Shang, Carl J. Radens, Shariq Siddiqui, Y. Ke, D. Ferrer, Ximeng Guan, D. Conklin, K. Boyd, K. Henson, Siddarth A. Krishnan, Bernard A. Engel, H. Dong, S. Mahajan, Unoh Kwon, Dominic J. Schepis, William Y. Chang, Liyang Song, Brian J. Greene, Chengwen Pei, S.-J. Jeng, Clevenger Leigh Anne H, Vijay Narayanan, C. Zhu, Wai-kin Li, Henry K. Utomo, Wei Liu, Dureseti Chidambarrao
المصدر: 2014 IEEE International Electron Devices Meeting.
مصطلحات موضوعية: Engineering, Subthreshold conduction, business.industry, Processor design, Copper interconnect, Soi finfet, Hardware_PERFORMANCEANDRELIABILITY, Thread (computing), Planar, CMOS, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, business, Dram
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6233530b0b3fd6ddc14276a018716523
https://doi.org/10.1109/iedm.2014.7046977