المؤلفون: Yilmaz, Mahmut, Jagannadha, Pavan Kumar Datla, Narayanun, Kaushik, Sarangi, Shantanu, Da Silva, Francisco, Sarmiento, Joe, Tonoyan, Smbat, Chintaluri, Ashwin, Khare, Animesh, Sonawane, Milind, Kumar, Ashish, Kalva, Anitha, Hsu, Alex, Pandey, Jayesh

المصدر: 2022 IEEE 40th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2022 IEEE 40th. :1-7 Apr, 2022

Relation: 2022 IEEE 40th VLSI Test Symposium (VTS)

المؤلفون: Mozaffari, Seyed Nima, Bhaskaran, Bonita, Sarangi, Shantanu, Satheesh, Suhas, Fu, Kuo Lin, Valentine, Nithin, Manikandan, P, Yilmaz, Mahmut

المصدر: 2022 IEEE 40th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2022 IEEE 40th. :1-6 Apr, 2022

Relation: 2022 IEEE 40th VLSI Test Symposium (VTS)

المؤلفون: Mozaffari, Seyed Nima, Bhaskaran, Bonita, Narayanun, Kaushik, Abdollahian, Ayub, Pagalone, Vinod, Sarangi, Shantanu, Colburn, Jonathon E.

المصدر: 2019 IEEE International Test Conference (ITC) Test Conference (ITC), 2019 IEEE International. :1-10 Nov, 2019

Relation: 2019 IEEE International Test Conference (ITC)

المؤلفون: Datla Jagannadha, Pavan Kumar, Yilmaz, Mahmut, Sonawane, Milind, Chadalavada, Sailendra, Sarangi, Shantanu, Bhaskaran, Bonita, Bajpai, Shashank, Reddy, Venkat Abilash, Pandey, Jayesh, Jiang, Sam

المصدر: 2019 IEEE 37th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2019 IEEE 37th. :1-8 Apr, 2019

Relation: 2019 IEEE 37th VLSI Test Symposium (VTS)

المؤلفون: Sonawane, Milind, Reddy Nerallapally, Venkat Abilash, Hsu, Alex, Sarangi, Shantanu

المصدر: 2019 IEEE 37th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2019 IEEE 37th. :1-6 Apr, 2019

Relation: 2019 IEEE 37th VLSI Test Symposium (VTS)

المؤلفون: Gupta, Saurabh, Bhaskaran, Bonita, Sarangi, Shantanu, Abdollahian, Ayub, Dworak, Jennifer

المصدر: 2019 IEEE 37th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2019 IEEE 37th. :1-6 Apr, 2019

Relation: 2019 IEEE 37th VLSI Test Symposium (VTS)

المؤلفون: Bhaskaran, Bonita, Chadalavada, Sailendra, Sarangi, Shantanu, Valentine, Nithin, Nerallapally, Venkat Abilash Reddy, Abdollahian, Ayub

المصدر: 2017 IEEE 35th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2017 IEEE 35th. :1-6 Apr, 2017

Relation: 2017 IEEE 35th VLSI Test Symposium (VTS)

المؤلفون: Kumar Datla Jagannadha, Pavan, Yilmaz, Mahmut, Sonawane, Milind, Chadalavada, Sailendra, Sarangi, Shantanu, Bhaskaran, Bonita, Abdollahian, Ayub

المصدر: 2016 IEEE International Test Conference (ITC) Test Conference (ITC), 2016 IEEE International. :1-10 Nov, 2016

Relation: 2016 IEEE International Test Conference (ITC)

المؤلفون: Sonawane, Milind, Kumar Datla Jagannadha, Pavan, Chadalavada, Sailendra, Sarangi, Shantanu, Yilmaz, Mahmut, Sanghani, Amit, Natarajan, Kathikeyan, Colburn, Jonathon E., Sinha, Anubhav

المصدر: 2016 IEEE 34th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2016 IEEE 34th. :1-6 Apr, 2016

Relation: 2016 IEEE 34th VLSI Test Symposium (VTS)

المؤلفون: Sonawane, Milind, Chadalavada, Sailendra, Sarangi, Shantanu, Sanghani, Amit, Yilmaz, Mahmut, Kumar Datla Jagannadha, Pavan, Colburn, Jonathon E.

المصدر: 2016 IEEE 34th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2016 IEEE 34th. :1-6 Apr, 2016

Relation: 2016 IEEE 34th VLSI Test Symposium (VTS)