المؤلفون: Timon Evenblij, Kristof Croes, Tommaso Marinelli, Sarath Mohanachandran Nair, Houman Zahedmanesh, Gouri Sankar Kar, Kevin Garello, Francky Catthoor, M. Perumkunnil, Mehdi B. Tahoori, Mahta Mayahinia

المصدر: IEEE Transactions on Device and Materials Reliability. 21:258-266

مصطلحات موضوعية: 010302 applied physics, Hardware_MEMORYSTRUCTURES, Spintronics, Computer science, Spin-transfer torque, ComputerApplications_COMPUTERSINOTHERSYSTEMS, 01 natural sciences, Electromigration, Electronic, Optical and Magnetic Materials, Power (physics), Reliability (semiconductor), Electric power transmission, 0103 physical sciences, Electronic engineering, Static random-access memory, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Current density

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::75dfee884c04b6adfa3c560a5a50e9a3
https://doi.org/10.1109/tdmr.2021.3074251

المؤلفون: Mehdi B. Tahoori, Samir Ben Dodo, Sarath Mohanachandran Nair, Rajendra Bishnoi

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 27:2511-2522

مصطلحات موضوعية: Authentication, Hardware security module, Hardware_MEMORYSTRUCTURES, Computer science, business.industry, Physical unclonable function, Cryptography, 02 engineering and technology, 020202 computer hardware & architecture, ComputingMilieux_MANAGEMENTOFCOMPUTINGANDINFORMATIONSYSTEMS, Hardware and Architecture, Embedded system, Computer data storage, 0202 electrical engineering, electronic engineering, information engineering, Electrical and Electronic Engineering, business, Resilience (network), Software, Vulnerability (computing)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::10d2eb515f93f3117cb1e70f5b3641f3
https://doi.org/10.1109/tvlsi.2019.2931481

المؤلفون: Rajendra Bishnoi, Sarath Mohanachandran Nair, Mehdi B. Tahoori

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 27:1697-1710

مصطلحات موضوعية: Magnetoresistive random-access memory, Random access memory, Hardware_MEMORYSTRUCTURES, Computer science, Reliability (computer networking), 02 engineering and technology, Fault (power engineering), 020202 computer hardware & architecture, Reliability engineering, CMOS, Hardware and Architecture, 0202 electrical engineering, electronic engineering, information engineering, Sensitivity (control systems), Electrical and Electronic Engineering, Software, Parametric statistics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c0d139c13adb23a8f1c96c279ac755c8
https://doi.org/10.1109/tvlsi.2019.2904197

المؤلفون: Sarath Mohanachandran Nair, Christopher Munch, Mehdi B. Tahoori

المصدر: ETS

مصطلحات موضوعية: Test strategy, Magnetoresistive random-access memory, Resistive touchscreen, Hardware_MEMORYSTRUCTURES, Computer science, business.industry, Spin-transfer torque, ComputerApplications_COMPUTERSINOTHERSYSTEMS, 02 engineering and technology, 021001 nanoscience & nanotechnology, Fault (power engineering), 020202 computer hardware & architecture, In-Memory Processing, Embedded system, Scalability, 0202 electrical engineering, electronic engineering, information engineering, 0210 nano-technology, business, Conventional memory

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::340a1de99f194f66d3e879d3a749d114
https://doi.org/10.1109/ets48528.2020.9131582

المؤلفون: Ying Wang, Huawei Li, Rajendra Bishnoi, Christopher Munch, Lizhou Wu, Sarath Mohanachandran Nair, Said Hamdioui, Mehdi B. Tahoori, Moritz Fieback

المصدر: VTS

مصطلحات موضوعية: 010302 applied physics, Computer science, Reliability (computer networking), Code coverage, 02 engineering and technology, Test method, Memristor, 01 natural sciences, Bottleneck, 020202 computer hardware & architecture, Reliability engineering, law.invention, law, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Key (cryptography), Parametric statistics, Abstraction (linguistics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1109b852dcf3581f7183586a5ae1a4d2
https://doi.org/10.1109/vts48691.2020.9107595

المؤلفون: Rajendra Bishnoi, Mehdi B. Tahoori, Sarath Mohanachandran Nair

المصدر: VTS

مصطلحات موضوعية: 010302 applied physics, Magnetoresistive random-access memory, Random access memory, Hardware_MEMORYSTRUCTURES, Cmos compatibility, Computer science, Spin-transfer torque, High density, 02 engineering and technology, 01 natural sciences, 020202 computer hardware & architecture, Reliability engineering, Reliability (semiconductor), Hardware_GENERAL, 0103 physical sciences, Scalability, 0202 electrical engineering, electronic engineering, information engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a7343573e798e57911d26ae9ec28f4e5
https://doi.org/10.1109/vts48691.2020.9107605

المؤلفون: Francky Catthoor, Mehdi B. Tahoori, Houman Zahedmanesh, Rajendra Bishnoi, Kevin Garello, Kristof Croes, Sarath Mohanachandran Nair, Gouri Sankar Kar

المصدر: IRPS

مصطلحات موضوعية: 010302 applied physics, Very-large-scale integration, Computer science, 02 engineering and technology, Variation (game tree), Physics based, 021001 nanoscience & nanotechnology, 01 natural sciences, Electromigration, Finite element method, Reliability engineering, Reliability (semiconductor), Dimension (vector space), 0103 physical sciences, Line (geometry), 0210 nano-technology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c9f98fa495d953c9bb11d95f2f6f442a
https://doi.org/10.1109/irps45951.2020.9128313

المؤلفون: Mehdi B. Tahoori, Guillaume Patrigeon, Guillaume Prenat, Lionel Torres, Rajendra Bishnoi, G. Di Pendina, Sophiane Senni, Pascal Benoit, Sarath Mohanachandran Nair

المساهمون: Karlsruher Institut für Technologie (KIT), ADAptive Computing (ADAC), Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), SPINtronique et TEchnologie des Composants (SPINTEC), Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes (UGA), European Project: 687973,H2020,H2020-ICT-2015,GREAT(2016)

المصدر: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)
DATE 2020-23rd Design, Automation and Test in Europe Conference and Exhibition
DATE 2020-23rd Design, Automation and Test in Europe Conference and Exhibition, Mar 2020, Grenoble, France. pp.394-399, ⟨10.23919/DATE48585.2020.9116321⟩
DATE

مصطلحات موضوعية: 010302 applied physics, Magnetoresistive random-access memory, Electronic system-level design and verification, Hardware_MEMORYSTRUCTURES, Computer science, Process (computing), Process design, Fault tolerance, 02 engineering and technology, 01 natural sciences, 020202 computer hardware & architecture, CMOS, Computer architecture, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic design automation, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, AND gate

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1e2d69e280c4eeb67ddc3a8e3ff3f170
https://hal.science/hal-03753403

المؤلفون: Arunkumar Vijayan, Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi B. Tahoori

المصدر: DATE

مصطلحات موضوعية: Magnetoresistive random-access memory, Hardware_MEMORYSTRUCTURES, CMOS, Hardware Trojan, business.industry, Computer science, Payload, Embedded system, Scalability, Process (computing), Data Corruption, Fault (power engineering), business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0ff230345e328b4fed8346a76a46d194
https://doi.org/10.23919/date48585.2020.9116471

المؤلفون: Mohammad Saber Golanbari, Fazal Hameed, Fabian Oboril, Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi B. Tahoori

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 37:1396-1407

مصطلحات موضوعية: 010302 applied physics, Magnetoresistive random-access memory, Random access memory, Hardware_MEMORYSTRUCTURES, Computer science, Design space exploration, Spin-transfer torque, Process (computing), 02 engineering and technology, 01 natural sciences, Computer Graphics and Computer-Aided Design, 020202 computer hardware & architecture, Reliability (semiconductor), 0103 physical sciences, Scalability, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Sensitivity (control systems), Electrical and Electronic Engineering, Software

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::09035db73fd772674ccf9ddcacf556f4
https://doi.org/10.1109/tcad.2017.2760861