-
1مؤتمر
المؤلفون: Elkholy, Marwa, Shalash, Omar, Hamad, Mostafa S., Saraya, M Sabry
المصدر: 2024 International Telecommunications Conference (ITC-Egypt) Telecommunications Conference (ITC-Egypt), 2024 International. :513-518 Jul, 2024
Relation: 2024 International Telecommunications Conference (ITC-Egypt)
-
2مؤتمر
المؤلفون: Kobayashi, Yusuke, Fukui, Munetoshi, Matsudai, Tomoko, Saraya, Takuya, Itou, Kazuo, Takakura, Toshihiko, Suzuki, Shinichi, Sakano, Tatsunori, Yamamoto, Takato, Inokuchi, Tomoaki, Gejo, Ryohei, Kobayashi, Kenya, Takao, Kazuto, Hiramoto, Toshiro
المصدر: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2024 36th International Symposium on. :33-36 Jun, 2024
Relation: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
-
3مؤتمر
المؤلفون: Saraya, T., Fukui, M., Kobayashi, Y., Itou, K., Takakura, T., Suzuki, S., Gejo, R., Sakano, T., Inokuchi, T., Matsudai, T., Takao, K., Hiramoto, T.
المصدر: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2024 36th International Symposium on. :546-549 Jun, 2024
Relation: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
-
4مؤتمر
المؤلفون: Mizutani, Tomoko, Takeuchi, Kiyoshi, Saraya, Takuya, Oka, Hiroshi, Mori, Takahiro, Kobayashi, Masaharu, Hiramoro, Toshiro
المصدر: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2024 IEEE 36th International Conference on. :1-5 Apr, 2024
Relation: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)
-
5دورية أكاديمية
المؤلفون: Hikake, K., Li, Z., Hao, J., Pandy, C., Saraya, T., Hiramoto, T., Takahashi, T., Uenuma, M., Uraoka, Y., Kobayashi, M.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(4):2373-2379 Apr, 2024
-
6دورية أكاديمية
المؤلفون: Zhou, X., Fukui, M., Takeuchi, K., Saraya, T., Hiramoto, T.
المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 12:433-439 2024
-
7دورية أكاديمية
المؤلفون: Yamada, H., Furue, S., Yokomori, T., Itoya, Y., Saraya, T., Hiramoto, T., Kobayashi, M.
المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 12:195-200 2024
-
8دورية أكاديمية
المؤلفون: Bakir, R.M.A., Soliman, M.S., Elksasy, M.S.M., Saraya, M.S., Abdelsalam, M.M.
المصدر: IEEE Sensors Letters IEEE Sens. Lett. Sensors Letters, IEEE. 7(11):1-4 Nov, 2023
-
9دورية أكاديمية
المؤلفون: Goto, M., Honda, Y., Nanba, M., Iguchi, Y., Saraya, T., Kobayashi, M., Higurashi, E., Toshiyoshi, H., Hiramoto, T.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(9):4705-4711 Sep, 2023
-
10مؤتمر
المؤلفون: Kobayashi, Masaharu, Hikake, Kaito, Li, Zhuo, Hao, Junxiang, Pandy, Chitra, Saraya, Takuya, Hiramoto, Toshiro, Takahashi, Takanori, Uenuma, Mutsunori, Uraoka, Yukiharu
المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :9A.1-1-9A.1-6 Apr, 2024
Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)