المؤلفون: Campos, N.d.M.D., Sarnet, T., Kilter, J.

المصدر: IEEE Transactions on Power Systems IEEE Trans. Power Syst. Power Systems, IEEE Transactions on. 38(6):5381-5391 Nov, 2023

المؤلفون: Vangelista, S., Piagge, R., Ek, S., Sarnet, T., Ghidini, G., Martella, C., Lamperti, A.

مصطلحات موضوعية: Condensed Matter - Materials Science

URL الوصول: http://arxiv.org/abs/1705.04071

المؤلفون: Trummal, T., Sarnet, T., Kilter, J.

المصدر: In Electric Power Systems Research June 2021 195

المؤلفون: Bozicek, A., Kilter, J., Sarnet, T., Papic, I., Blazic, B.

المصدر: IEEE Transactions on Industry Applications IEEE Trans. on Ind. Applicat. Industry Applications, IEEE Transactions on. 54(5):5216-5226 Jan, 2018

المؤلفون: Venturini, J., Hernandez, M., Huet, K., Laviron, C., Akhouayri, H., Sarnet, T., Boulmer, J.

المصدر: 12th IEEE International Conference on Advanced Thermal Processing of Semiconductors, 2004. RTP 2004. Advanced thermal processing of semiconductors Advanced Thermal Processing of Semiconductors, 2004. RTP 2004. 12th IEEE International Conference on. :73-78 2004

Relation: 12th IEEE International Conference on Advanced Thermal Processing of Semiconductors

المؤلفون: Kakushima, K., Sarnet, T., Kerrien, G., Nagashio, M., Debarre, D., Boulmer, J., Noguchi, T., Bourouina, T., Kawakatsu, H., Fujita, H.

المصدر: TRANSDUCERS '03. 12th International Conference on Solid-State Sensors, Actuators and Microsystems. Digest of Technical Papers (Cat. No.03TH8664) Solid-state sensors, actuators and microsystems TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference on, 2003. 1:328-331 vol.1 2003

Relation: IEEE International Solid-State Sensors and Actuators Conference

المؤلفون: Sikora, A., Fares, L., Adrian, J., Goubier, V., Delobbe, A., Corbin, A., Sarnet, T., Sentis, M.

المصدر: 2017 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC) Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC, 2017 Conference on). :1-1 Jun, 2017

Relation: 2017 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)

المؤلفون: Etienne, H., Vervisch, V., Torregrosa, F., Sarnet, T., Delaporte, P., Cristiano, F., Fazzini, P. F., Roux, L., Sempere, G.

المصدر: Extended Abstracts - 2008 8th International Workshop on Junction Technology (IWJT '08) Junction Technology, 2008. IWJT '08. Extended Abstracts - 2008 8th International workshop on. :32-38 May, 2008

Relation: 2008 International Workshop on Junction Technology (IWJT)

المؤلفون: Kerrien, G., Kakushima, K., Sarnet, T., Boulmer, J., Debarre, D., Bouchier, D., Bosseboeuf, A., Bourouina, T.

المصدر: IEEE/LEOS International Conference on Optical MEMs Optical MEMS Optical MEMs, 2002. Conference Digest. 2002 IEEE/LEOS International Conference on. :129-130 2002

Relation: 2002 IEEE/LEOS International Conference on Optical MEMS

المؤلفون: Goudeau, P., Tamura, N., Lavelle, B., Rigo, S., Masri, T., Bosseboeuf, A., Sarnet, T., Petit, J.-A., Desmarres, J.-M.

مصطلحات موضوعية: Materials science, MEMS residual stresses failure X-ray diffraction micrometer scale

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/61n3680x