المؤلفون: Sassine, Gilbert, Alfaro Robayo, Diego, Nail, Cecile, Nodin, Jean-Francois, Coignus, Jean, Molas, Gabriel, Nowak, Etienne

المصدر: 2018 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2018 IEEE International. :1-4 May, 2018

Relation: 2018 IEEE International Memory Workshop (IMW)

المؤلفون: Suri, Manan, Parmar, Vivek, Sassine, Gilbert, Alibart, Fabien

المصدر: 2015 International Joint Conference on Neural Networks (IJCNN) Neural Networks (IJCNN), 2015 International Joint Conference on. :1-8 Jul, 2015

Relation: 2015 International Joint Conference on Neural Networks (IJCNN)

المؤلفون: Houdouin, Alexandre, Durand, Stephane, Yaakoubi, Nourdin, Sassine, Gilbert, Shahosseini, Iman, Martincic, Emile, Woytasik, Marion, Moulin, Johan, Lefeuvre, Elie

المصدر: IEEE SENSORS 2014 Proceedings SENSORS, 2014 IEEE. :94-97 Nov, 2014

Relation: 2014 IEEE Sensors

المؤلفون: Sassine, Gilbert, Shahosseini, Iman, Woytasik, Marion, Martincic, Emile, Moulin, Johan, Lefeuvre, Elie, Houdouin, Alexandre, Durand, Stephane, Yaakoubi, Nourdin

المصدر: 2014 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP) Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2014 Symposium on. :1-4 Apr, 2014

Relation: 2014 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP)

المؤلفون: Charlot, Benoit, Sassine, Gilbert, Garraud, Alexandra, Giani, Alain, Combette, Philippe

المصدر: 2012 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2012 Symposium on. :196-199 Apr, 2012

Relation: 2012 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP)

المؤلفون: Sassine, Gilbert, Nail, Cecile, Tillie, Luc, Robayo, Diego Alfaro, Levisse, Alexandre, Cagli, Carlo, Hajjam, Khalil El., Nodin, Jean-Francois, Vianello, Elisa, Bernard, Mathieu, Molas, Gabriel, Nowak, Etienne

المصدر: 2018 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2018 IEEE International. :P-MY.2-1-P-MY.2-5 Mar, 2018

Relation: 2018 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Sassine, Gilbert, Martinez, Frederic, Pascal, Fabien, Hoffmann, Alain

المصدر: 2012 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2012 Symposium on. :174-175 Apr, 2012

Relation: 2012 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP)

المؤلفون: Charlot, Benoît, Sassine, Gilbert, Garraud, Alexandra, Sorli, Brice, Giani, Alain, Combette, Philippe

المصدر: Microsystem Technologies: Micro- and NanosystemsInformation Storage and Processing Systems. June 2013 19(6):895-903

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