يعرض 1 - 10 نتائج من 28 نتيجة بحث عن '"Sato, Keno"', وقت الاستعلام: 0.85s تنقيح النتائج
  1. 1
    مؤتمر
    A Physically Unclonable Function Using Time-to-Digital Converter with Linearity Self-Calibration and its FPGA Implementation

    المؤلفون: Katoh, Kentaroh, Yamamoto, Shuhei, Zhao, Zheming, Zhao, Yujie, Katayama, Shogo, Kuwana, Anna, Nakatani, Takayuki, Hatayama, Kazumi, Kobayashi, Haruo, Sato, Keno, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu

    المصدر: 2023 IEEE International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2023 IEEE International. :1-6 Sep, 2023

    Relation: 2023 IEEE International Test Conference in Asia (ITC-Asia)

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  2. 2
    مؤتمر
    Innovative Practices Session at VLSI Test Symposium 2024: Analog Testing Technologies for Digital Exploding Society

    المؤلفون: Kobayashi, Haruo, Tsukahara, Naoki, Sato, Keno, Oshima, Takashi

    المصدر: 2024 IEEE 42nd VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2024 IEEE 42nd. :1-1 Apr, 2024

    Relation: 2024 IEEE 42nd VLSI Test Symposium (VTS)

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  3. 3
    مؤتمر
    High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST

    المؤلفون: Sato, Keno, Nakatani, Takayuki, Katayama, Shogo, Iimori, Daisuke, Ogihara, Gaku, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu, Zhao, Yujie, Katoh, Kentaroh, Kuwana, Anna, Hatayama, Kazumi, Kobayashi, Haruo

    المصدر: 2022 IEEE 31st Asian Test Symposium (ATS) ATS Test Symposium (ATS), 2022 IEEE 31st Asian. :37-42 Nov, 2022

    Relation: 2022 IEEE 31st Asian Test Symposium (ATS)

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  4. 4
    مؤتمر
    Evaluation of Code Selective Histogram Algorithm For ADC Linearity Test

    المؤلفون: Zhao, Yujie, Katoh, Kentaroh, Kuwana, Anna, Katayama, Shogo, Iimori, Daisuke, Ozawa, Yuki, Nakatani, Takayuki, Hatayama, Kazumi, Kobayashi, Haruo, Sato, Keno, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu

    المصدر: 2022 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia) Consumer Electronics-Asia (ICCE-Asia), 2022 IEEE International Conference on. :1-4 Oct, 2022

    Relation: 2022 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia)

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  5. 5
    كتاب إلكتروني
    Design Consideration for LC Analog Filters: Inductor ESR Compensation, Mutual Inductance Effect and Variable Center Frequency

    المؤلفون: Takagi, MisakiAff13, Nakatani, TakayukiAff13, Katayama, ShogoAff13, Iimori, DaisukeAff13, Ogihara, GakuAff13, Zhao, YujieAff13, Kuwana, AnnaAff13, Sato, KenoAff14, Ishida, TakashiAff14, Okamoto, ToshiyukiAff14, Ichikawa, TamotsuAff14, Katoh, KentarohAff13, Hatayama, KazumiAff13, Kobayashi, HaruoAff13

    المساهمون: Kacprzyk, Janusz, Series EditorAff1, Gomide, Fernando, Advisory EditorAff2, Kaynak, Okyay, Advisory EditorAff3, Liu, Derong, Advisory EditorAff4, Pedrycz, Witold, Advisory EditorAff5, Polycarpou, Marios M., Advisory EditorAff6, Rudas, Imre J., Advisory EditorAff7, Wang, Jun, Advisory EditorAff8, Yang, Xin-She, editorAff9, Sherratt, R. Simon, editorAff10, Dey, Nilanjan, editorAff11, Joshi, Amit, editorAff12

    المصدر: Proceedings of Eighth International Congress on Information and Communication Technology : ICICT 2023, London, Volume 4. 696:155-166

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  6. 6
    مؤتمر
    Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production

    المؤلفون: Ogihara, Gaku, Nakatani, Takayuki, Iimori, Daisuke, Katayama, Shogo, Kuwana, Anna, Sato, Keno, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu, Zhao, Yujie, Wei, Jianglin, Hatayama, Kazumi, Kobayashi, Haruo

    المصدر: 2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS) Electronics, Circuits, and Systems (ICECS), 2021 28th IEEE International Conference on. :1-6 Nov, 2021

    Relation: 2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS)

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  7. 7
    مؤتمر
    Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies

    المؤلفون: Sato, Keno, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu, Wei, Jianglin, Nakatani, Takayuki, Zhao, Yujie, Katayama, Shogo, Yamamoto, Shuhei, Kuwana, Anna, Hatayama, Kazumi, Kobayashi, Haruo

    المصدر: 2021 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2021 IEEE International. :284-288 Oct, 2021

    Relation: 2021 IEEE International Test Conference (ITC)

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  8. 8
    مؤتمر
    Summing Node and False Summing Node Methods: Accurate Operational Amplifier AC Characteristics Testing without Audio Analyzer

    المؤلفون: Iimori, Daisuke, Nakatani, Takayuki, Katayama, Shogo, Ogihara, Gaku, Hatta, Akemi, Kuwana, Anna, Sato, Keno, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu, Wei, Jianglin, Zhao, Yujie, Tran, Tri Minh, Hatayama, Kazumi, Kobayashi, Haruo

    المصدر: 2021 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2021 IEEE International. :364-373 Oct, 2021

    Relation: 2021 IEEE International Test Conference (ITC)

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  9. 9
    مؤتمر
    Metallic Ratio Equivalent-Time Sampling: A Highly Efficient Waveform Acquisition Method

    المؤلفون: Yamamoto, Shuhei, Sasaki, Yuto, Zhao, Yujie, Wei, Jianglin, Kuwana, Anna, Sato, Keno, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu, Nakatani, Takayuki, Tran, Tri Minh, Katayama, Shogo, Hatayama, Kazumi, Kobayashi, Haruo

    المصدر: 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2021 IEEE 27th International Symposium on. :1-6 Jun, 2021

    Relation: 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)

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  10. 10
    مؤتمر
    Input Signal and Sampling Frequencies Requirements for Efficient ADC Testing with Histogram Method

    المؤلفون: Zhao, Yujie, Kuwana, Anna, Yamamoto, Shuhei, Sasaki, Yuto, Kobayashi, Haruo, Tran, Tri Minh, Katayama, Shogo, Wei, Jianglin, Nakatani, Takayuki, Hatayama, Kazumi, Sato, Keno, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu

    المصدر: 2021 36th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) Circuits/Systems, Computers and Communications (ITC-CSCC), 2021 36th International Technical Conference on. :1-4 Jun, 2021

    Relation: 2021 36th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC)

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