المؤلفون: Miao Cai, Daoguo Yang, Jianlin Huang, Maofen Zhang, Xianping Chen, Caihang Liang, Sau Koh, Guoqi Zhang

المصدر: IEEE Photonics Journal, Vol 9, Iss 1, Pp 1-14 (2017)

مصطلحات موضوعية: Light-emitting diodes (LEDs), color shift (CS), reliability modeling, degradation mechanism, Applied optics. Photonics, TA1501-1820, Optics. Light, QC350-467

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/7765031/; https://doaj.org/toc/1943-0655

URL الوصول: https://doaj.org/article/abecd97448814a4a8292df8b1b7adf9b

المؤلفون: Sau Koh, Rao Tummala, Saxena, Ashok, Selvam, P.

المصدر: 2008 58th Electronic Components and Technology Conference Electronic Components and Technology Conference, 2008. ECTC 2008. 58th. :1625-1629 May, 2008

Relation: 2008 58th Electronic Components and Technology Conference (ECTC 2008)

المؤلفون: Poelma, R.H., Sadeghian, H., Sau Koh, Zhang, G.Q.

المصدر: 2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2011 12th International Conference on. :1/7-7/7 Apr, 2011

Relation: 2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)

المؤلفون: Sau Koh, Ranjan Rajoo, Rao Tummala, Ashok Saxena, Kuo Tsing Tsai

المصدر: Proceedings Electronic Components and Technology, 2005. ECTC '05. Electronic components and technology Electronic Components and Technology Conference, 2005. Proceedings. 55th. :1670-1676 Vol. 2 2005

Relation: 2005 Proceedings. 55th Electronic Components and Technology Conference

المؤلفون: Jianlin Huang, Zhang Maofen, Sau Koh, Daoguo Yang, Guoqi Zhang, Xianping Chen, Caihang Liang, Miao Cai

المصدر: IEEE Photonics Journal, 9(1)
IEEE Photonics Journal, Vol 9, Iss 1, Pp 1-14 (2017)

مصطلحات موضوعية: lcsh:Applied optics. Photonics, Materials science, color shift (CS), 02 engineering and technology, Stress testing (software), 01 natural sciences, law.invention, Stress (mechanics), Reliability (semiconductor), law, Consistency (statistics), 0103 physical sciences, lcsh:QC350-467, Light-emitting diodes (LEDs), Electrical and Electronic Engineering, Diode, 010302 applied physics, business.industry, lcsh:TA1501-1820, Statistical model, degradation mechanism, 021001 nanoscience & nanotechnology, Atomic and Molecular Physics, and Optics, LED lamp, reliability modeling, Optoelectronics, 0210 nano-technology, Biological system, business, lcsh:Optics. Light, Light-emitting diode

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::69030fdf09d5e83f504af99a917ebe37
https://doi.org/10.1109/jphot.2016.2634702

المؤلفون: Xuejun Fan, Guoqi Zhang, Xiupeng Li, Jianlin Huang, Sau Koh, Daoguo Yang, Dusan S. Golubovic

المصدر: Reliability Engineering & System Safety. 154:152-159

مصطلحات موضوعية: 010302 applied physics, Imagination, 021103 operations research, Computer science, Estimation theory, media_common.quotation_subject, 0211 other engineering and technologies, Estimator, 02 engineering and technology, 01 natural sciences, Industrial and Manufacturing Engineering, law.invention, Search engine, symbols.namesake, Wiener process, law, 0103 physical sciences, symbols, Degradation test, Safety, Risk, Reliability and Quality, Biological system, Simulation, Lumen (unit), media_common, Light-emitting diode

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0c60819efbe94ed3e006e33573c1cf4e
https://doi.org/10.1016/j.ress.2016.06.002

المؤلفون: Xiupeng Li, Sau Koh, Dusan S. Golubovic, Xuejun Fan, Daoguo Yang, Guoqi Zhang, Jianlin Huang

المصدر: IEEE Transactions on Electron Devices. 63:2807-2814

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, 020208 electrical & electronic engineering, Mechanism analysis, Phosphor, 02 engineering and technology, 01 natural sciences, Electronic, Optical and Magnetic Materials, law.invention, chemistry.chemical_compound, Lead frame, Silicone, chemistry, law, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, White light, Optoelectronics, Electrical and Electronic Engineering, business, Decoupling (electronics), Lumen (unit), Light-emitting diode

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::86c1c6cbcd220a5080267260bfe4ab3e
https://doi.org/10.1109/ted.2016.2565709

المؤلفون: Jianlin Huang, Xuejun Fan, Dusan S. Golubovic, Xiupeng Li, Guoqi Zhang, Daoguo Yang, Sau Koh

المصدر: Microelectronics Reliability. 55:2654-2662

مصطلحات موضوعية: Materials science, business.industry, Mineralogy, Condensed Matter Physics, Chip, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Lead frame, law, White light, Optoelectronics, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Light-emitting diode

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d8490906217953f93d7839e150f18e78
https://doi.org/10.1016/j.microrel.2015.09.008

المؤلفون: Xiupeng Li, Guoqi Zhang, Xuejun Fan, Sau Koh, Dusan S. Golubovic, Jianlin Huang, Daoguo Yang

المصدر: IEEE Transactions on Device and Materials Reliability. 15:478-485

مصطلحات موضوعية: inorganic chemicals, Materials science, Moisture, Carbonization, business.industry, technology, industry, and agriculture, Humidity, Phosphor, equipment and supplies, complex mixtures, Electronic, Optical and Magnetic Materials, law.invention, stomatognathic diseases, chemistry.chemical_compound, Silicone, chemistry, law, Optoelectronics, Junction temperature, Electrical and Electronic Engineering, Composite material, Safety, Risk, Reliability and Quality, Joule heating, business, Light-emitting diode

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5af6c983a7aa509d706d3394a19867df
https://doi.org/10.1109/tdmr.2015.2468587

المؤلفون: Guoqi Zhang, Xiupeng Li, Jianlin Huang, Dusan S. Golubovic, Sau Koh, Xuejun Fan, Daoguo Yang

المصدر: IEEE Transactions on Device and Materials Reliability. 15:220-228

مصطلحات موضوعية: Materials science, business.industry, Humidity, Color shift, Electronic, Optical and Magnetic Materials, law.invention, law, Lumen maintenance, White light, Optoelectronics, Statistical analysis, Cost benefit, Electrical and Electronic Engineering, Degradation test, Safety, Risk, Reliability and Quality, business, Light-emitting diode

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::782a9b4dce8dc52439ed12e4c17f9de5
https://doi.org/10.1109/tdmr.2015.2418345