المؤلفون: Hukerikar, Saurabh, Saxena, Nirmal

المصدر: 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :524-528 Sep, 2022

Relation: 2022 IEEE International Test Conference (ITC)

المؤلفون: Saxena, Nirmal, Lotfi, Atieh

المصدر: 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :324-333 Sep, 2022

Relation: 2022 IEEE International Test Conference (ITC)

المؤلفون: Bramley, Richard, Huang, Yanxiang, Duan, Guangshan, Saxena, Nirmal, Racunas, Paul

المصدر: 2020 IEEE International Test Conference (ITC) Test Conference (ITC), 2020 IEEE International. :1-10 Nov, 2020

Relation: 2020 IEEE International Test Conference (ITC)

المؤلفون: Lotfi, Atieh, Hukerikar, Saurabh, Balasubramanian, Keshav, Racunas, Paul, Saxena, Nirmal, Bramley, Richard, Huang, Yanxiang

المصدر: 2019 IEEE International Test Conference (ITC) Test Conference (ITC), 2019 IEEE International. :1-9 Nov, 2019

Relation: 2019 IEEE International Test Conference (ITC)

المؤلفون: Lotfi, Atieh, Saxena, Nirmal, Bramley, Richard, Racunas, Paul, Shirvani, Philip

المصدر: 2018 48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) DSN Dependable Systems and Networks (DSN), 2018 48th Annual IEEE/IFIP International Conference on. :314-321 Jun, 2018

Relation: 2018 48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)

المؤلفون: Saxena, Nirmal, Mathew, Sanu, Saraswat, Krishna

المصدر: 2018 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2018 IEEE International. :1-3 Mar, 2018

Relation: 2018 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Saxena, Nirmal R.

المصدر: 2009 International Test Conference Test Conference, 2009. ITC 2009. International. :1-1 Nov, 2009

Relation: 2009 IEEE International Test Conference (ITC)

المؤلفون: Ferhani, François-Fabien, Saxena, Nirmal R., McCluskey, Edward J., Nigh, Phil

المصدر: 26th IEEE VLSI Test Symposium (vts 2008) VLSI Test Symposium, 2008. VTS 2008. 26th IEEE. :23-28 Apr, 2008

Relation: 26th IEEE VLSI Test Symposium

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المؤلفون: Robinson, John P., Saxena, Nirmal R.

المصدر: IEEE Transactions on Computers IEEE Trans. Comput. Computers, IEEE Transactions on. C-36(1):94-99 Jan, 1987