يعرض 1 - 10 نتائج من 526 نتيجة بحث عن '"Schaffner, M."', وقت الاستعلام: 0.94s تنقيح النتائج
  1. 1
    دورية أكاديمية

    المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 28(2):530-543 Feb, 2020

  2. 2
    مؤتمر

    المصدر: 2018 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2018 IEEE International Symposium on. :1-5 May, 2018

    Relation: 2018 IEEE International Symposium on Circuits and Systems (ISCAS)

  3. 3
    مؤتمر

    المصدر: 2018 IEEE Sensors Applications Symposium (SAS) Sensors Applications Symposium (SAS), 2018 IEEE. :1-6 Mar, 2018

    Relation: 2018 IEEE Sensors Applications Symposium (SAS)

  4. 4
    دورية أكاديمية

    المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 68(7):2374-2386 Jul, 2019

  5. 5
    دورية أكاديمية

    المصدر: IEEE Transactions on Computers IEEE Trans. Comput. Computers, IEEE Transactions on. 68(4):484-497 Apr, 2019

  6. 6
    مؤتمر

    المصدر: 2017 25th European Signal Processing Conference (EUSIPCO) Signal Processing Conference (EUSIPCO), 2017 25th European. :996-1000 Aug, 2017

    Relation: 2017 25th European Signal Processing Conference (EUSIPCO)

  7. 7
    مؤتمر

    المصدر: 2017 IEEE Sensors Applications Symposium (SAS) Sensors Applications Symposium (SAS), 2017 IEEE. :1-6 2017

    Relation: 2017 IEEE Sensors Applications Symposium (SAS)

  8. 8
    مؤتمر

    المؤلفون: Schuiki, F., Schaffner, M., Benini, L.

    المصدر: 2019 International SoC Design Conference (ISOCC) SoC Design Conference (ISOCC), 2019 International. :117-118 Oct, 2019

    Relation: 2019 International SoC Design Conference (ISOCC)

  9. 9
    دورية أكاديمية

    المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 67(4):767-779 Apr, 2018

  10. 10
    دورية أكاديمية

    المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 52(1):98-112 Jan, 2017