المؤلفون: Nirschl, T., Schaper, U., Einfeld, J., Henzler, S., Sterkel, M., Singer, J., Fulde, M., Hansch, W., Georgakos, G., Schmitt-Landsiedell, D.

المصدر: Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. Microelectronic Test Structures Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on. :43-46 2005

Relation: ICMTS 2005. Proceedings of the 2005 International Conference on Microelectronic Test Structures