المؤلفون: Li, Tianzhe^{Aff1, Aff2, Aff3}, Murley, Grace A.^{Aff1, Aff2}, Liang, Xiaofei, Chin, Renee L.^{Aff1, Aff2}, de la Cerda, Jorge, Schuler, F. William, Pagel, Mark D.^{Aff1, Aff4, IDs1130702401925x_cor7}

المصدر: Molecular Imaging and Biology. 26(3):448-458

المؤلفون: Pollard, Alyssa C.^{Aff1, Aff2}, de la Cerda, Jorge, Schuler, F. William, Kingsley, Charles V., Gammon, Seth T., Pagel, Mark D.^{Aff2, IDs4065802200483x_cor6}

المصدر: EJNMMI Physics. 9(1)

المؤلفون: Rubbert, L., Schuler, F., Gayral, T., de Wild, M., Renaud, P.

المصدر: In Precision Engineering November 2021 72:304-314

المؤلفون: Schuler, F., Degraeve, R., Hendrickx, P., Wellekens, D.

المصدر: 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) Reliability physics symposium Reliability Physics Symposium Proceedings, 2002. 40th Annual. :26-33 2002

Relation: 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual

المؤلفون: Gondro, E., Kuhn, C., Schuler, F., Kowarik, O.

المصدر: ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics (IEEE Cat. No.00CH37076) Applications of ferroelectrics Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on. 2:615-618 vol. 2 2000

Relation: ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics

المؤلفون: Gondro, E., Klein, P., Schuler, F.

المصدر: 1999 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and systems Circuits and Systems (ISCAS), 1999 IEEE International Symposium on. 6:206-209 vol.6 1999

Relation: 1999 IEEE International Symposium on Circuits and Systems (ISCAS)

المؤلفون: Schuler, F., Hoffmann, K., Klein, P.

المصدر: 28th European Solid-State Device Research Conference Solid-State Device Research Conference, 1998. Proceeding of the 28th European. :108-111 1998

Relation: 28th European Solid-State Device Research Conference

المؤلفون: Schuler, F., Kowarik, O., Hoffmann, K.

المصدر: ICSE'98. 1998 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.98EX187) Semiconductor electronics Semiconductor Electronics, 1998. Proceedings. ICSE '98. 1998 IEEE International Conference on. :100-104 1998

Relation: Proceedings ICSE'98. 1998 IEEE International Conference on Semiconductor Electronics. Proceedings

المؤلفون: Schuler, F., Kowarik, O., Keitel-Schulz, D.

المصدر: Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on. :1675-1678 1996

Relation: Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis

المؤلفون: Degraeve, R., Schuler, F., Kaczer, B., Lorenzini, M., Wellekens, D., Hendrickx, P., van Duuren, M., Dormans, G.J.M., Van Houdt, J., Haspeslagh, L., Groeseneken, G., Tempel, G.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 51(9):1392-1400 Sep, 2004