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1
المؤلفون: Ki-Sang Kang, Jindo Byun, Se-Jang Oh, Dong-Yeop Kim, Hai-Young Lee, Sang-Hoon Lee
المصدر: IEEE Transactions on Instrumentation and Measurement. 60:872-879
مصطلحات موضوعية: Surface-mount technology, Engineering, Frequency response, business.industry, Bandwidth (signal processing), Electrical engineering, Printed circuit board, Electronic engineering, Insertion loss, Signal integrity, Electrical and Electronic Engineering, business, Instrumentation, Probe card, Jitter
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2
المؤلفون: Eonjo Byun, Sung-dong Suh, Se-Jang Oh, Sanghoon Lee, Kyoung-ho Ha, SungHo Joo, Ki-Jae Song, Wui-soo Lee, Soohaeng Cho
المصدر: Journal of Lightwave Technology. 28:104-110
مصطلحات موضوعية: Engineering, Dynamic random-access memory, business.industry, Optical link, SerDes, System testing, Test compression, Atomic and Molecular Physics, and Optics, law.invention, Automatic test equipment, law, Electronic engineering, Signal integrity, business, Field-programmable gate array
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3
المؤلفون: Jacob A. Abraham, Kihyuk Han, Jaeyong Chung, Joonsung Park, Eonjo Byun, Cheol-Jong Woo, Se-Jang Oh, Jaewook Lee
المصدر: Asian Test Symposium
مصطلحات موضوعية: Engineering, business.industry, Design for testing, Interface (computing), Code coverage, Skew, Hardware_PERFORMANCEANDRELIABILITY, Automatic test equipment, Hardware_INTEGRATEDCIRCUITS, Device under test, business, Field-programmable gate array, Computer hardware, Electronic circuit
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::126c7527cab457fcd2c1308d2a910b16
https://doi.org/10.1109/ats.2010.54 -
4
المؤلفون: Jaewook Lee, Se-Jang Oh, Kihyuk Han, Joonsung Park, Cheol-Jong Woo, Eonjo Byun, Jacob A. Abraham
المصدر: European Test Symposium
مصطلحات موضوعية: Computer science, business.industry, Skew, Hardware_PERFORMANCEANDRELIABILITY, Chip, Compensation (engineering), Automatic test equipment, Built-in self-test, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Time domain, Circuit complexity, business, Computer hardware, Electronic circuit
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9d58d5b2b136911fd8944dc6e85ac16d
https://doi.org/10.1109/ets.2009.20 -
5
المؤلفون: Se-Jang Oh, Hai-Young Lee, DongYeop Kim, Sung-Ho Joo, Sang-Hoon Lee, Ki-Sang Kang
المصدر: 2007 Korea-Japan Microwave Conference.
مصطلحات موضوعية: Resistive touchscreen, Semiconductor, Materials science, Test board, business.industry, Electrical engineering, Signal integrity, Time domain, Data rate, business, Jitter, Stub (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2b59fbc52d59400a0e9fcdd6a5227589
https://doi.org/10.1109/kjmw.2007.4402255 -
6مؤتمر
المؤلفون: Sung-Ho Joo, Dong-Yeop Kim, Sang-Hoon Lee, Se-Jang Oh, Ki-Sang Kang, Hai-Young Lee
المصدر: 2007 Korea-Japan Microwave Conference; 2007, p121-124, 4p
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7دورية أكاديمية
المؤلفون: Sang-Hoon Lee, Soohaeng Cho, Ki-Jae Song, Eon-Jo Byun, SungHo Joo, Sung-Dong Suh, Kyoungho Ha, Se-Jang Oh, Wuisoo Lee
المصدر: Journal of Lightwave Technology; 1/1/2010, Vol. 28 Issue 1, p104-110, 7p