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1دورية أكاديمية
المؤلفون: Fabia Farlin Athena, Omobayode Fagbohungbe, Nanbo Gong, Malte J. Rasch, Jimmy Penaloza, SoonCheon Seo, Arthur Gasasira, Paul Solomon, Valeria Bragaglia, Steven Consiglio, Hisashi Higuchi, Chanro Park, Kevin Brew, Paul Jamison, Christopher Catano, Iqbal Saraf, Claire Silvestre, Xuefeng Liu, Babar Khan, Nikhil Jain, Steven McDermott, Rick Johnson, I. Estrada-Raygoza, Juntao Li, Tayfun Gokmen, Ning Li, Ruturaj Pujari, Fabio Carta, Hiroyuki Miyazoe, Martin M. Frank, Antonio La Porta, Devi Koty, Qingyun Yang, Robert D. Clark, Kandabara Tapily, Cory Wajda, Aelan Mosden, Jeff Shearer, Andrew Metz, Sean Teehan, Nicole Saulnier, Bert Offrein, Takaaki Tsunomura, Gert Leusink, Vijay Narayanan, Takashi Ando
المصدر: Frontiers in Electronics, Vol 4 (2024)
مصطلحات موضوعية: resistive random access memory, HfOx, deep learning, analog hardware, transfer learning, open loop training, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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2
المؤلفون: A. Gaul, Andrew M. Greene, T. Levin, Dallas Lea, Victor Chan, Samuel S. Choi, Carol Boye, S. Mattam, J. S. Strane, Sean Teehan, Dechao Guo, Gauri Karve, Marc A. Bergendahl, Brad Austin, Kangguo Cheng
المصدر: IEEE Transactions on Semiconductor Manufacturing. 32:393-399
مصطلحات موضوعية: 0209 industrial biotechnology, Yield (engineering), Computer science, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Ring oscillator, Condensed Matter Physics, Fault (power engineering), Industrial and Manufacturing Engineering, Electronic, Optical and Magnetic Materials, 020901 industrial engineering & automation, CMOS, Logic gate, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Field-effect transistor, Isolation (database systems), Electrical and Electronic Engineering, Hardware_LOGICDESIGN, Electronic circuit
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المؤلفون: Ishtiaq Ahsan, Arthur Gasasira, Vijay Narayanan, Soon-Cheon Seo, Xuefeng Liu, Veenadhar Katragadda, Takashi Ando, Nicole Saulnier, Youngseok Kim, Ruturaj Pujari, Dexin Kong, Sean Teehan
المصدر: 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
مصطلحات موضوعية: Development environment, Resistive touchscreen, Learning cycle, Computer science, business.industry, Deep learning, 02 engineering and technology, Test method, 010402 general chemistry, 021001 nanoscience & nanotechnology, 01 natural sciences, 0104 chemical sciences, Resistive random-access memory, Scalability, Electronic engineering, Artificial intelligence, 0210 nano-technology, business, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8d6b6e5e454cc3929b87f5dd640f81c5
https://doi.org/10.1109/asmc51741.2021.9435708 -
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المؤلفون: Samuel S. Choi, Jay W. Strane, Victor Chan, Sean Teehan, James Chingwei Li, C. Le, James J. Demarest, Marc A. Bergendahl, A. Gaul, Dechao Guo, Andrew M. Greene
المصدر: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
مصطلحات موضوعية: Materials science, Yield (engineering), Etching, Logic gate, Mole, Phase (waves), Ring oscillator, Ring (chemistry), Molecular physics, Line (formation)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::93e8a90f167b681b32d0a241ede4550e
https://doi.org/10.1109/asmc49169.2020.9185254 -
5Transmission Electron Microscopy Sample Preparation By Design Based Recipe Writing in a DBFIB Part 2
المؤلفون: Marc A. Bergendahl, M. Biedrzycki, J. Hager, K. Nguyen, M. Persala, J. Arjavac, Brad Austin, Carol Boye, S. Shaar, Mary Breton, Michael Rizzolo, John G. Gaudiello, Sean Teehan, Shravan Matham, B. Cilingiroglu, James J. Demarest
المصدر: International Symposium for Testing and Failure Analysis.
مصطلحات موضوعية: Materials science, business.industry, Transmission electron microscopy, Recipe, Optoelectronics, Sample preparation, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4ca71e6c1294b3cd26decf2043970581
https://doi.org/10.31399/asm.cp.istfa2019p0470 -
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المؤلفون: Devendra K. Sadana, Brock Mendoza, John G. Gaudiello, Ankit Jain, Shravan Matham, Heungsoo Choi, Sean Teehan, Curtis Durfee, Martin Plihal, Stephen W. Bedell
المصدر: 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
مصطلحات موضوعية: Materials science, Silicon, business.industry, chemistry.chemical_element, Blanket, Epitaxy, Machine learning, computer.software_genre, Metrology, Background noise, chemistry, Broadband, Wafer, Artificial intelligence, business, Throughput (business), computer
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::71db54515d5ca099eecae45f66f9eda1
https://doi.org/10.1109/asmc.2019.8791801 -
7
المؤلفون: Marc A. Bergendahl, Carol Boye, Jay W. Strane, Gauri Karve, Dechao Guo, T. Levin, S. Mattam, Dallas Lea, Kangguo Cheng, S. Choi, A. Gaul, Sean Teehan, Andrew M. Greene, Brad Austin, Victor S. Chan
المصدر: 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
مصطلحات موضوعية: 0209 industrial biotechnology, 020901 industrial engineering & automation, Yield (engineering), CMOS, Computer science, Phase (waves), Electronic engineering, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Ring oscillator, Isolation (database systems), Fault (power engineering)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2e81b5a0ec8f716f3126929b2bad3fd7
https://doi.org/10.1109/asmc.2019.8791793 -
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المؤلفون: Balasubramanian S. Haran, Kisup Chung, Spyridon Skordas, Stan D. Tsai, Mark L. Lenhardt, Su Chen Fan, Sean Teehan, Alex Joseph Varghese, Ruilong Xie, Pietro Montanini
المصدر: 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
مصطلحات موضوعية: Materials science, Yield (engineering), Gas cluster ion beam, business.industry, Logic gate, Chemical-mechanical planarization, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Node (circuits), Wafer, Nitride, business, Metrology
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8fbd27d6ee98fb8fd9dfb24709c5f9b4
https://doi.org/10.1109/asmc.2018.8373209 -
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المؤلفون: Sean Teehan, Pradeep Haldar, Harry Efstathiadis
المصدر: Journal of Electronic Materials. 41:1831-1837
مصطلحات موضوعية: Materials science, Band gap, business.industry, Doping, chemistry.chemical_element, Condensed Matter Physics, Thermoelectric materials, Electronic, Optical and Magnetic Materials, chemistry, Electrical resistivity and conductivity, Thermoelectric effect, Materials Chemistry, Optoelectronics, Charge carrier, Electrical and Electronic Engineering, business, Quantum well, Indium
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المؤلفون: Sean Teehan, Pradeep Haldar, Harry Efstathiadis
المصدر: Journal of Alloys and Compounds. 509:1094-1098
مصطلحات موضوعية: Auger electron spectroscopy, Materials science, business.industry, Mechanical Engineering, Metals and Alloys, Mineralogy, chemistry.chemical_element, Sputter deposition, Thermoelectric materials, chemistry, Mechanics of Materials, Sputtering, Seebeck coefficient, Thermoelectric effect, Materials Chemistry, Optoelectronics, Thin film, business, Indium