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1دورية أكاديمية
المؤلفون: Dai, GaoliangAff1, IDs4187102200124y_cor1, Hahm, Kai, Sebastian, Lipfert, Heidelmann, Markus
المصدر: Nanomanufacturing and Metrology. 5(2):91-100
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2دورية أكاديمية
المؤلفون: Dai, GaoliangAff1, IDs41871022001653_cor1, Hahm, Kai, Sebastian, Lipfert, Heidelmann, Markus
المصدر: Nanomanufacturing and Metrology. 5(4):440-440
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3
المؤلفون: Dai, Gaoliang, Hahm, Kai, Sebastian, Lipfert, Heidelmann, Markus
مصطلحات موضوعية: Technik
URL الوصول: https://explore.openaire.eu/search/publication?articleId=unidue___bib::9314143476637274e9218ca2b9f752d6
https://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&origin=inward&scp=85142639681 -
4
المؤلفون: Matthias Nestler, Stefan Braun, Andreas Leson, Sebastian Lipfert, Peter Gawlitza
المصدر: Vakuum in Forschung und Praxis. 19:37-43
مصطلحات موضوعية: Condensed Matter Physics, Surfaces, Coatings and Films
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5
المؤلفون: Andreas Leson, Sebastian Lipfert, Stefan Braun, Peter Gawlitza
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Materials science, Optics, Ion beam deposition, Ion beam, business.industry, Extreme ultraviolet lithography, Surface finish, Sputter deposition, business, Reflectometry, Deposition (law), Ion
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5f97f8556b6ac4ae933fdc92972ef123
https://doi.org/10.1117/12.680618 -
6
المؤلفون: Juergen Schreiber, Sebastian Lipfert, P. T. Murray, Eunsung Shin, Bernd Koehler
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Scanning probe microscopy, Materials science, Scanning ion-conductance microscopy, Scanning confocal electron microscopy, Energy filtered transmission electron microscopy, Nanotechnology, Scanning capacitance microscopy, High-resolution transmission electron microscopy, Dark field microscopy, Vibrational analysis with scanning probe microscopy
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8e28f8149eef2055077d41f90a83cae3
https://doi.org/10.1117/12.660463 -
7
المؤلفون: Juergen Schreiber, Sebastian Lipfert, P. T. Murray, J. Kaspar, Bernd Koehler
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Laser ablation, Materials science, Passivation, Particle, Nanoparticle, Nanotechnology, Nitride, Laser ablation synthesis in solution, Layer (electronics), Nanomaterials
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9c221bc52b7696153b280228fe4e8e9a
https://doi.org/10.1117/12.660728