يعرض 1 - 10 نتائج من 1,724 نتيجة بحث عن '"Secondary ion mass spectroscopy"', وقت الاستعلام: 0.87s تنقيح النتائج
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    دورية أكاديمية

    المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 12:399-406 2024

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    دورية أكاديمية

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(12):5587-5592 Dec, 2020

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    مؤتمر

    المصدر: 2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS) BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2018 IEEE. :255-258 Oct, 2018

    Relation: 2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)

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    مؤتمر

    المصدر: 2018 22nd International Conference on Ion Implantation Technology (IIT) Ion Implantation Technology (IIT), 2018 22nd International Conference on. :42-45 Sep, 2018

    Relation: 2018 22nd International Conference on Ion Implantation Technology (IIT)

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    كتاب إلكتروني

    المساهمون: Joshi, SanjayAff1, Martukanitz, Richard P.Aff2, Nassar, Abdalla R.Aff3, Michaleris, PanAff4

    المصدر: Additive Manufacturing with Metals : Design, Processes, Materials, Quality Assurance, and Applications. :383-426

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    مؤتمر

    المصدر: 2018 22nd International Conference on Ion Implantation Technology (IIT) Ion Implantation Technology (IIT), 2018 22nd International Conference on. :153-155 Sep, 2018

    Relation: 2018 22nd International Conference on Ion Implantation Technology (IIT)

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    دورية أكاديمية

    المصدر: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 54(11):1-5 Nov, 2018