المؤلفون: Ryder, Landen D., Carstens, Thomas A., Phan, Anthony M., Seidlick, Christina M., Campola, Michael J.

المصدر: 2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Nuclear and Space Radiation Effects Conference (NSREC), 2021 IEEE. :1-4 Jul, 2021

Relation: 2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)

المؤلفون: Berg, Melanie D., Kim, Hak S., Phan, Anthony D., Seidlick, Christina M., LaBel, Kenneth A., Pellish, Jonathan A.

المصدر: IEEE Transactions on Nuclear Science; Dec2013 Part 1, Vol. 60 Issue 6, p4192-4199, 8p

مصطلحات موضوعية: SINGLE event effects, BIT error rate measurement, HEAVY ions, FIELD programmable gate arrays, PROGRAMMABLE logic devices